Characterization of nanostructured HfOsub(2) films using RBS and PAC
| Autor(a) principal: | |
|---|---|
| Data de Publicação: | 2012 |
| Outros Autores: | , , , , , , , , , , |
| Tipo de documento: | Artigo |
| Texto Completo: | http://repositorio.ipen.br:8080/xmlui/handle/123456789/4301 |
| id |
IPEN_0f9ed7ddc04591a14b77b8ea1eeb6757 |
|---|---|
| oai_identifier_str |
oai:repositorio.ipen.br:123456789/4301 |
| network_name_str |
Repositório Institucional do IPEN |
| title |
Characterization of nanostructured HfOsub(2) films using RBS and PAC |
| author |
CAVALCANTE, F.H.M. |
| author2 |
GOMES, M.R. CARBONARI, A.W. PEREIRA, L.F.D. ROSSETTO, D.A. COSTA, M.S. ALVES, E. BARRADAS, N.P. FRANCO, N. REDONDO, L.M. LOPES, A.M.L. SOARES, J.C. |
| topic |
hyperfine structure tantalum nanostructure hafnium oxides thin films doped materials iron rutherford backscattering spectroscopy perturbed angular correlation |
| publishDate |
2012 |
| format |
article |
| url |
http://repositorio.ipen.br:8080/xmlui/handle/123456789/4301 |
| instname_str |
Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
| instacron_str |
IPEN |