Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis

Detalhes bibliográficos
Autor(a) principal: ICHIKAWA, R.U.
Data de Publicação: 2015
Outros Autores: MARTINEZ, L.G., IMAKUMA, K., LINHARES, H.M.S.M.D., RANIERI, I.M., TURRILLAS, X., WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4th
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/23729
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spelling 2015-06-11T10:52:30Z2015-06-11T10:52:30ZMay 23-25, 2014http://repositorio.ipen.br/handle/123456789/23729Submitted by Claudinei Pracidelli (cpracide@ipen.br) on 2015-06-11T10:52:30Z No. of bitstreams: 1 20764.pdf: 776218 bytes, checksum: 34da233ce3f8ad1d9424d2349f24e844 (MD5)Made available in DSpace on 2015-06-11T10:52:30Z (GMT). No. of bitstreams: 1 20764.pdf: 776218 bytes, checksum: 34da233ce3f8ad1d9424d2349f24e844 (MD5)nanostructuresrare earthsdoped materialsytterbium fluoridesstrainsx-ray diffractionSize-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysisinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectIVitoria, ESICHIKAWA, R.U.MARTINEZ, L.G.IMAKUMA, K.LINHARES, H.M.S.M.D.RANIERI, I.M.TURRILLAS, X.WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4thinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN207642014ICHIKAWA, R.U.MARTINEZ, L.G.IMAKUMA, K.LINHARES, H.M.S.M.D.RANIERI, I.M.15-06Anais101183975415946144512142ICHIKAWA, R.U.:10118:-1:SMARTINEZ, L.G.:397:-1:NIMAKUMA, K.:541:-1:NLINHARES, H.M.S.M.D.:5946:-1:NRANIERI, I.M.:1445:-1:NTURRILLAS, X.:12142:-1:NORIGINAL20764.pdf20764.pdfapplication/pdf776218http://repositorio.ipen.br/bitstream/123456789/23729/1/20764.pdf34da233ce3f8ad1d9424d2349f24e844MD51LICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.ipen.br/bitstream/123456789/23729/2/license.txt8a4605be74aa9ea9d79846c1fba20a33MD52123456789/237292016-05-20 12:07:14.426oai:repositorio.ipen.br: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Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-05-20T12:07:14Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
title Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
spellingShingle Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
ICHIKAWA, R.U.
nanostructures
rare earths
doped materials
ytterbium fluorides
strains
x-ray diffraction
title_short Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
title_full Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
title_fullStr Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
title_full_unstemmed Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
title_sort Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis
author ICHIKAWA, R.U.
author_facet ICHIKAWA, R.U.
MARTINEZ, L.G.
IMAKUMA, K.
LINHARES, H.M.S.M.D.
RANIERI, I.M.
TURRILLAS, X.
WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4th
author_role author
author2 MARTINEZ, L.G.
IMAKUMA, K.
LINHARES, H.M.S.M.D.
RANIERI, I.M.
TURRILLAS, X.
WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4th
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv ICHIKAWA, R.U.
MARTINEZ, L.G.
IMAKUMA, K.
LINHARES, H.M.S.M.D.
RANIERI, I.M.
TURRILLAS, X.
WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4th
dc.subject.por.fl_str_mv nanostructures
rare earths
doped materials
ytterbium fluorides
strains
x-ray diffraction
topic nanostructures
rare earths
doped materials
ytterbium fluorides
strains
x-ray diffraction
publishDate 2015
dc.date.evento.pt_BR.fl_str_mv May 23-25, 2014
dc.date.accessioned.fl_str_mv 2015-06-11T10:52:30Z
dc.date.available.fl_str_mv 2015-06-11T10:52:30Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
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status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/23729
url http://repositorio.ipen.br/handle/123456789/23729
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
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dc.coverage.pt_BR.fl_str_mv I
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