Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy

Detalhes bibliográficos
Autor(a) principal: CORDEIRO, M.R.
Data de Publicação: 2014
Outros Autores: CARBONARI, A.W., SAXENA, R.N., INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/17587
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spelling 2014-11-17T18:34:32Z2014-11-18T18:49:57Z2015-04-01T20:46:18Z2014-11-17T18:34:32Z2014-11-18T18:49:57Z2015-04-01T20:46:18Zago. 28 - set. 2, 2005http://repositorio.ipen.br/handle/123456789/17587Made available in DSpace on 2014-11-17T18:34:32Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:49:57Z (GMT). No. of bitstreams: 1 10565.pdf: 254997 bytes, checksum: 0f84b2b920694e632a66c3f122f10d49 (MD5)Made available in DSpace on 2015-04-01T20:46:18Z (GMT). No. of bitstreams: 1 10565.pdf: 254997 bytes, checksum: 0f84b2b920694e632a66c3f122f10d49 (MD5)Sao Paulo: ABEN, 2005annealingcadmium 111crystal defectsgamma cascadesindium 111kev range 100-1000monocrystalsperturbed angular correlationsilicontemperature dependenceStudy of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopyinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINAC,2005; ENAN,7ISantos, SPCORDEIRO, M.R.CARBONARI, A.W.SAXENA, R.N.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7thinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN105652005CARBONARI, A.W.SAXENA, R.N.05-10Anais353114371329CORDEIRO, M.R.:3531:6:SCARBONARI, A.W.:1437:6:NSAXENA, R.N.:1329:6:NORIGINAL10565.pdfapplication/pdf254997http://repositorio.ipen.br/bitstream/123456789/17587/1/10565.pdf0f84b2b920694e632a66c3f122f10d49MD51123456789/175872015-04-01 20:46:18.828oai:repositorio.ipen.br:123456789/17587Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102015-04-01T20:46:18Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
title Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
spellingShingle Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
CORDEIRO, M.R.
annealing
cadmium 111
crystal defects
gamma cascades
indium 111
kev range 100-1000
monocrystals
perturbed angular correlation
silicon
temperature dependence
title_short Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
title_full Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
title_fullStr Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
title_full_unstemmed Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
title_sort Study of defects in silicon by means of perturbed angular gamma-gamma correlation spectroscopy
author CORDEIRO, M.R.
author_facet CORDEIRO, M.R.
CARBONARI, A.W.
SAXENA, R.N.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th
author_role author
author2 CARBONARI, A.W.
SAXENA, R.N.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th
author2_role author
author
author
dc.contributor.author.fl_str_mv CORDEIRO, M.R.
CARBONARI, A.W.
SAXENA, R.N.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th
dc.subject.por.fl_str_mv annealing
cadmium 111
crystal defects
gamma cascades
indium 111
kev range 100-1000
monocrystals
perturbed angular correlation
silicon
temperature dependence
topic annealing
cadmium 111
crystal defects
gamma cascades
indium 111
kev range 100-1000
monocrystals
perturbed angular correlation
silicon
temperature dependence
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv ago. 28 - set. 2, 2005
dc.date.accessioned.fl_str_mv 2014-11-17T18:34:32Z
2014-11-18T18:49:57Z
2015-04-01T20:46:18Z
dc.date.available.fl_str_mv 2014-11-17T18:34:32Z
2014-11-18T18:49:57Z
2015-04-01T20:46:18Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/17587
url http://repositorio.ipen.br/handle/123456789/17587
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Sao Paulo: ABEN, 2005
publisher.none.fl_str_mv Sao Paulo: ABEN, 2005
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron:IPEN
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN
institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
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