Characterization of nanostructured HfOsub(2) films using perturbed angular correlation (PAC) technique
| Autor(a) principal: | |
|---|---|
| Data de Publicação: | 2010 |
| Outros Autores: | , , , , , , , , |
| Tipo de documento: | Artigo |
| Texto Completo: | http://repositorio.ipen.br:8080/xmlui/handle/123456789/4563 |
| id |
IPEN_ff84709ddc2a48eecfb89aed7f0e7030 |
|---|---|
| oai_identifier_str |
oai:repositorio.ipen.br:123456789/4563 |
| network_name_str |
Repositório Institucional do IPEN |
| title |
Characterization of nanostructured HfOsub(2) films using perturbed angular correlation (PAC) technique |
| author |
CAVALCANTE, F.H.M. |
| author2 |
GOMES, M.R. CARBONARI, A.W. PEREIRA, L.F.D. ROSSETTO, D.A. COSTA, M.S. REDONDO, L.M. MESTNIK FILHO, J. SAXENA, R.N. SOARES, J.C. |
| topic |
hafnium oxides perturbed angular correlation spectroscopy electric fields thin films |
| publishDate |
2010 |
| format |
article |
| url |
http://repositorio.ipen.br:8080/xmlui/handle/123456789/4563 |
| instname_str |
Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
| instacron_str |
IPEN |