Characterization and modelling of long-term memory effects in GaN HEMTs

Mestrado em Engenharia Eletrónica e de Telecomunicações

Access type:openAccess
Publication Date:2016
Main Author: Gomes, José Miguel Alves Faria
Advisor: Pedro, José Carlos Esteves Duarte, Cabral, Pedro Miguel da Silva
Document type: Master thesis
Language:eng
Published: Universidade de Aveiro
Portuguese subjects:
Online Access:http://hdl.handle.net/10773/18456
Description not available.