Non-resonant Permittivity Measurement Methods

Detalhes bibliográficos
Autor(a) principal: Severo,Sergio L. S.
Data de Publicação: 2017
Outros Autores: Salles,Álvaro A. A. de, Nervis,Bruno, Zanini,Braian K.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of Microwaves. Optoelectronics and Electromagnetic Applications
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297
Resumo: Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.
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spelling Non-resonant Permittivity Measurement MethodsMicrowave measurementspermittivityshort-circuit transmission line methodtransmission/reflection methodAbstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo2017-03-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.16 n.1 2017reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applicationsinstname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)instacron:SBMO10.1590/2179-10742017v16i1890info:eu-repo/semantics/openAccessSevero,Sergio L. S.Salles,Álvaro A. A. deNervis,BrunoZanini,Braian K.eng2017-03-31T00:00:00Zoai:scielo:S2179-10742017000100297Revistahttp://www.jmoe.org/index.php/jmoe/indexONGhttps://old.scielo.br/oai/scielo-oai.php||editor_jmoe@sbmo.org.br2179-10742179-1074opendoar:2017-03-31T00:00Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)false
dc.title.none.fl_str_mv Non-resonant Permittivity Measurement Methods
title Non-resonant Permittivity Measurement Methods
spellingShingle Non-resonant Permittivity Measurement Methods
Severo,Sergio L. S.
Microwave measurements
permittivity
short-circuit transmission line method
transmission/reflection method
title_short Non-resonant Permittivity Measurement Methods
title_full Non-resonant Permittivity Measurement Methods
title_fullStr Non-resonant Permittivity Measurement Methods
title_full_unstemmed Non-resonant Permittivity Measurement Methods
title_sort Non-resonant Permittivity Measurement Methods
author Severo,Sergio L. S.
author_facet Severo,Sergio L. S.
Salles,Álvaro A. A. de
Nervis,Bruno
Zanini,Braian K.
author_role author
author2 Salles,Álvaro A. A. de
Nervis,Bruno
Zanini,Braian K.
author2_role author
author
author
dc.contributor.author.fl_str_mv Severo,Sergio L. S.
Salles,Álvaro A. A. de
Nervis,Bruno
Zanini,Braian K.
dc.subject.por.fl_str_mv Microwave measurements
permittivity
short-circuit transmission line method
transmission/reflection method
topic Microwave measurements
permittivity
short-circuit transmission line method
transmission/reflection method
description Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.
publishDate 2017
dc.date.none.fl_str_mv 2017-03-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/2179-10742017v16i1890
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
dc.source.none.fl_str_mv Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.16 n.1 2017
reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applications
instname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
instacron:SBMO
instname_str Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
instacron_str SBMO
institution SBMO
reponame_str Journal of Microwaves. Optoelectronics and Electromagnetic Applications
collection Journal of Microwaves. Optoelectronics and Electromagnetic Applications
repository.name.fl_str_mv Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
repository.mail.fl_str_mv ||editor_jmoe@sbmo.org.br
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