Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy

Bibliographic Details
Main Author: Capeli, R. A. [UNESP]
Publication Date: 2017
Other Authors: Pontes, F. M. [UNESP], Pontes, D. S.L., Chiquito, A. J., Bastos, W. B. [UNESP], Pereira-da-Silva, Marcelo A., Longo, E. [UNESP]
Format: Article
Language: eng
Source: Repositório Institucional da UNESP
Download full: http://dx.doi.org/10.1016/j.matlet.2017.03.029
http://hdl.handle.net/11449/178707
Summary: Single phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films.
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spelling Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopyBuffer layerEpitaxial growthPFMThin filmsSingle phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Department of Chemistry Universidade Estadual Paulista – Unesp, P.O. Box 473LIEC – Department of Chemistry Universidade Federal de São Carlos, Via Washington Luiz, Km 235, P.O. Box 676NanO LaB – Department of Physics Universidade Federal de São Carlos, Via Washington Luiz, Km 235, P.O. Box 676Institute of Physics of São Carlos USPUNICEPInstitute of Chemistry Universidade Estadual Paulista – UnespDepartment of Chemistry Universidade Estadual Paulista – Unesp, P.O. Box 473Institute of Chemistry Universidade Estadual Paulista – UnespFAPESP: 11/20536-7FAPESP: 12/14106-2FAPESP: 13/07296-2CNPq: 470147/2012-1Universidade Estadual Paulista (Unesp)Universidade Federal de São Carlos (UFSCar)Universidade de São Paulo (USP)UNICEPCapeli, R. A. [UNESP]Pontes, F. M. [UNESP]Pontes, D. S.L.Chiquito, A. J.Bastos, W. B. [UNESP]Pereira-da-Silva, Marcelo A.Longo, E. [UNESP]2018-12-11T17:31:46Z2018-12-11T17:31:46Z2017-06-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article64-68application/pdfhttp://dx.doi.org/10.1016/j.matlet.2017.03.029Materials Letters, v. 196, p. 64-68.1873-49790167-577Xhttp://hdl.handle.net/11449/17870710.1016/j.matlet.2017.03.0292-s2.0-850149143482-s2.0-85014914348.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMaterials Lettersinfo:eu-repo/semantics/openAccess2023-10-20T06:06:34Zoai:repositorio.unesp.br:11449/178707Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T15:25:27.446221Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
title Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
spellingShingle Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
Capeli, R. A. [UNESP]
Buffer layer
Epitaxial growth
PFM
Thin films
title_short Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
title_full Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
title_fullStr Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
title_full_unstemmed Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
title_sort Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
author Capeli, R. A. [UNESP]
author_facet Capeli, R. A. [UNESP]
Pontes, F. M. [UNESP]
Pontes, D. S.L.
Chiquito, A. J.
Bastos, W. B. [UNESP]
Pereira-da-Silva, Marcelo A.
Longo, E. [UNESP]
author_role author
author2 Pontes, F. M. [UNESP]
Pontes, D. S.L.
Chiquito, A. J.
Bastos, W. B. [UNESP]
Pereira-da-Silva, Marcelo A.
Longo, E. [UNESP]
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
Universidade Federal de São Carlos (UFSCar)
Universidade de São Paulo (USP)
UNICEP
dc.contributor.author.fl_str_mv Capeli, R. A. [UNESP]
Pontes, F. M. [UNESP]
Pontes, D. S.L.
Chiquito, A. J.
Bastos, W. B. [UNESP]
Pereira-da-Silva, Marcelo A.
Longo, E. [UNESP]
dc.subject.por.fl_str_mv Buffer layer
Epitaxial growth
PFM
Thin films
topic Buffer layer
Epitaxial growth
PFM
Thin films
description Single phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films.
publishDate 2017
dc.date.none.fl_str_mv 2017-06-01
2018-12-11T17:31:46Z
2018-12-11T17:31:46Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/j.matlet.2017.03.029
Materials Letters, v. 196, p. 64-68.
1873-4979
0167-577X
http://hdl.handle.net/11449/178707
10.1016/j.matlet.2017.03.029
2-s2.0-85014914348
2-s2.0-85014914348.pdf
url http://dx.doi.org/10.1016/j.matlet.2017.03.029
http://hdl.handle.net/11449/178707
identifier_str_mv Materials Letters, v. 196, p. 64-68.
1873-4979
0167-577X
10.1016/j.matlet.2017.03.029
2-s2.0-85014914348
2-s2.0-85014914348.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Materials Letters
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 64-68
application/pdf
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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