Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy
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Publication Date: | 2017 |
Other Authors: | , , , , , |
Format: | Article |
Language: | eng |
Source: | Repositório Institucional da UNESP |
Download full: | http://dx.doi.org/10.1016/j.matlet.2017.03.029 http://hdl.handle.net/11449/178707 |
Summary: | Single phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films. |
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Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopyBuffer layerEpitaxial growthPFMThin filmsSingle phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Department of Chemistry Universidade Estadual Paulista – Unesp, P.O. Box 473LIEC – Department of Chemistry Universidade Federal de São Carlos, Via Washington Luiz, Km 235, P.O. Box 676NanO LaB – Department of Physics Universidade Federal de São Carlos, Via Washington Luiz, Km 235, P.O. Box 676Institute of Physics of São Carlos USPUNICEPInstitute of Chemistry Universidade Estadual Paulista – UnespDepartment of Chemistry Universidade Estadual Paulista – Unesp, P.O. Box 473Institute of Chemistry Universidade Estadual Paulista – UnespFAPESP: 11/20536-7FAPESP: 12/14106-2FAPESP: 13/07296-2CNPq: 470147/2012-1Universidade Estadual Paulista (Unesp)Universidade Federal de São Carlos (UFSCar)Universidade de São Paulo (USP)UNICEPCapeli, R. A. [UNESP]Pontes, F. M. [UNESP]Pontes, D. S.L.Chiquito, A. J.Bastos, W. B. [UNESP]Pereira-da-Silva, Marcelo A.Longo, E. [UNESP]2018-12-11T17:31:46Z2018-12-11T17:31:46Z2017-06-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article64-68application/pdfhttp://dx.doi.org/10.1016/j.matlet.2017.03.029Materials Letters, v. 196, p. 64-68.1873-49790167-577Xhttp://hdl.handle.net/11449/17870710.1016/j.matlet.2017.03.0292-s2.0-850149143482-s2.0-85014914348.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMaterials Lettersinfo:eu-repo/semantics/openAccess2023-10-20T06:06:34Zoai:repositorio.unesp.br:11449/178707Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T15:25:27.446221Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
title |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
spellingShingle |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy Capeli, R. A. [UNESP] Buffer layer Epitaxial growth PFM Thin films |
title_short |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
title_full |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
title_fullStr |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
title_full_unstemmed |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
title_sort |
Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy |
author |
Capeli, R. A. [UNESP] |
author_facet |
Capeli, R. A. [UNESP] Pontes, F. M. [UNESP] Pontes, D. S.L. Chiquito, A. J. Bastos, W. B. [UNESP] Pereira-da-Silva, Marcelo A. Longo, E. [UNESP] |
author_role |
author |
author2 |
Pontes, F. M. [UNESP] Pontes, D. S.L. Chiquito, A. J. Bastos, W. B. [UNESP] Pereira-da-Silva, Marcelo A. Longo, E. [UNESP] |
author2_role |
author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) Universidade Federal de São Carlos (UFSCar) Universidade de São Paulo (USP) UNICEP |
dc.contributor.author.fl_str_mv |
Capeli, R. A. [UNESP] Pontes, F. M. [UNESP] Pontes, D. S.L. Chiquito, A. J. Bastos, W. B. [UNESP] Pereira-da-Silva, Marcelo A. Longo, E. [UNESP] |
dc.subject.por.fl_str_mv |
Buffer layer Epitaxial growth PFM Thin films |
topic |
Buffer layer Epitaxial growth PFM Thin films |
description |
Single phase polycrystalline and strong textured Pb0.76Ca0.24TiO3 (PCT24) thin films have been grown on platinum coated silicon and LaAlO3(1 0 0) (LAO) substrates using LaNiO3 (LNO) as a buffer layer by chemical solution deposition. X-ray diffraction measurements showed that the PCT24 thin films crystallize in a highly a-oriented single phase on LNO/LAO(1 0 0). The effects of the LNO buffer layer, nature of the substrate, and film orientation on the ferroelectric and piezoelectric properties were investigated in the nanoscale range using piezoresponse force microscopy (PFM). Local piezoelectric hysteresis loops for PCT24/LNO/LAO(1 0 0) oriented films and PCT24/Pt/Si polycrystalline films were measured on selected grains. From these piezoloops, PCT24/LNO/LAO(1 0 0) oriented films show a higher response (maximum relative d33 value) than PCT24/Pt/Si polycrystalline films. Furthermore, the comparison of simultaneously acquired surface morphology and piezoresponse images of the PCT24/Pt/Si films revealed the presence of inactive grain regions. In contrast, highly a-oriented films showed a higher presence of active grains. Our observations suggest that the improvement of ferro/piezoelectric properties is greatly associated with the use of LNO buffer layers and the growth of highly a-oriented films. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-06-01 2018-12-11T17:31:46Z 2018-12-11T17:31:46Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/j.matlet.2017.03.029 Materials Letters, v. 196, p. 64-68. 1873-4979 0167-577X http://hdl.handle.net/11449/178707 10.1016/j.matlet.2017.03.029 2-s2.0-85014914348 2-s2.0-85014914348.pdf |
url |
http://dx.doi.org/10.1016/j.matlet.2017.03.029 http://hdl.handle.net/11449/178707 |
identifier_str_mv |
Materials Letters, v. 196, p. 64-68. 1873-4979 0167-577X 10.1016/j.matlet.2017.03.029 2-s2.0-85014914348 2-s2.0-85014914348.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Materials Letters |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
64-68 application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
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1808128511848742912 |