Evaluating the impact of charge traps on MOSFETs and Circuits

Detalhes bibliográficos
Autor(a) principal: VINICIUS VALDUGA DE ALMEIDA CAMARGO
Data de Publicação: 2016
Tipo de documento: Tese
Título da fonte: Portal de Dados Abertos da CAPES
Texto Completo: https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=3782315
id BRCRIS_3941a31e94cee18c7000005ed6dcd848
network_acronym_str CAPES
network_name_str Portal de Dados Abertos da CAPES
dc.title.pt-BR.fl_str_mv Evaluating the impact of charge traps on MOSFETs and Circuits
title Evaluating the impact of charge traps on MOSFETs and Circuits
spellingShingle Evaluating the impact of charge traps on MOSFETs and Circuits
RTS. BTI. Ensemble Monte Carlo. TCAD. Circuit simulations.
BTI. Ensemble Monte Carlo. Simulação de circuitos. TCAD.
VINICIUS VALDUGA DE ALMEIDA CAMARGO
title_short Evaluating the impact of charge traps on MOSFETs and Circuits
title_full Evaluating the impact of charge traps on MOSFETs and Circuits
title_fullStr Evaluating the impact of charge traps on MOSFETs and Circuits
Evaluating the impact of charge traps on MOSFETs and Circuits
title_full_unstemmed Evaluating the impact of charge traps on MOSFETs and Circuits
Evaluating the impact of charge traps on MOSFETs and Circuits
title_sort Evaluating the impact of charge traps on MOSFETs and Circuits
topic RTS. BTI. Ensemble Monte Carlo. TCAD. Circuit simulations.
BTI. Ensemble Monte Carlo. Simulação de circuitos. TCAD.
publishDate 2016
format doctoralThesis
url https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=3782315
author_role author
author VINICIUS VALDUGA DE ALMEIDA CAMARGO
author_facet VINICIUS VALDUGA DE ALMEIDA CAMARGO
dc.contributor.authorLattes.fl_str_mv http://lattes.cnpq.br/4395507792390980
dc.identifier.orcid.none.fl_str_mv https://orcid.org/0000-0003-2006-3642
dc.contributor.advisor1.fl_str_mv GILSON INACIO WIRTH
Gilson Inácio Wirth
dc.contributor.advisor1Lattes.fl_str_mv http://lattes.cnpq.br/1745194055679908
dc.contributor.advisor1orcid.por.fl_str_mv https://orcid.org/0000-0002-4990-5113
dc.publisher.none.fl_str_mv UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL
publisher.none.fl_str_mv UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL
instname_str UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL
dc.publisher.program.fl_str_mv MICROELETRÔNICA
dc.description.course.none.fl_txt_mv MICROELETRÔNICA
reponame_str Portal de Dados Abertos da CAPES
collection Portal de Dados Abertos da CAPES
spelling CAPESPortal de Dados Abertos da CAPESEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsEvaluating the impact of charge traps on MOSFETs and CircuitsRTS. BTI. Ensemble Monte Carlo. TCAD. Circuit simulations.2016doctoralThesishttps://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=3782315authorVINICIUS VALDUGA DE ALMEIDA CAMARGOhttp://lattes.cnpq.br/4395507792390980https://orcid.org/0000-0003-2006-3642GILSON INACIO WIRTHhttp://lattes.cnpq.br/1745194055679908https://orcid.org/0000-0002-4990-5113UNIVERSIDADE FEDERAL DO RIO GRANDE DO SULUNIVERSIDADE FEDERAL DO RIO GRANDE DO SULUNIVERSIDADE FEDERAL DO RIO GRANDE DO SULMICROELETRÔNICAMICROELETRÔNICAPortal de Dados Abertos da CAPESPortal de Dados Abertos da CAPES
identifier_str_mv CAMARGO, VINICIUS VALDUGA DE ALMEIDA. Evaluating the impact of charge traps on MOSFETs and Circuits. 2016. Tese.
dc.identifier.citation.fl_str_mv CAMARGO, VINICIUS VALDUGA DE ALMEIDA. Evaluating the impact of charge traps on MOSFETs and Circuits. 2016. Tese.
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