Study of a fringing field biosensor tunnel-FET
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1149/2162-8777/abdd85 http://hdl.handle.net/11449/205873 |
Resumo: | In this paper, we present a comprehensive study of the Fringing Field Biosensor Tunnel-FET (Bio-TFET) device based on 2Ddevice simulation. The presence of a biomaterial with a distinct dielectric constant (k, where ∈ = k∗∈0) on the underlap region (LUD) between gate and drain affects the ambipolar drain current (ID). The Bio-TFET can be observed in the ambipolar region (i.e., for negative gate voltage in an n type Bio-nTFET device) due to the variation of the k, biomaterial thicknesses (tBio), the LUD, and/ or the presence of charges (QBio) into the biomaterial/silicon interface. The results show that the maximum sensitivity is observed when LUD= 30 nm (3 orders of magnitude higher compared with LUDof 25 nm lower or higher than 30 nm). When tBioincreases from 10 nm to 30 nm (for k = 10), the sensitivity increases up to 1 orders of magnitude. The presence of QBiointo the biomaterial also increases the sensitivity of 60 times for a fixed value of tBio= 30 nm and k = 10 and QBiochanging from 1 × 1010cm-2to 1 × 1012cm-2. The results show that the sensitivity of the fringing field Bio-nTFET is strongly dependent on the tunneling length modulation. c 2021 The Author(s). |
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Repositório Institucional da UNESP |
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spelling |
Study of a fringing field biosensor tunnel-FETIn this paper, we present a comprehensive study of the Fringing Field Biosensor Tunnel-FET (Bio-TFET) device based on 2Ddevice simulation. The presence of a biomaterial with a distinct dielectric constant (k, where ∈ = k∗∈0) on the underlap region (LUD) between gate and drain affects the ambipolar drain current (ID). The Bio-TFET can be observed in the ambipolar region (i.e., for negative gate voltage in an n type Bio-nTFET device) due to the variation of the k, biomaterial thicknesses (tBio), the LUD, and/ or the presence of charges (QBio) into the biomaterial/silicon interface. The results show that the maximum sensitivity is observed when LUD= 30 nm (3 orders of magnitude higher compared with LUDof 25 nm lower or higher than 30 nm). When tBioincreases from 10 nm to 30 nm (for k = 10), the sensitivity increases up to 1 orders of magnitude. The presence of QBiointo the biomaterial also increases the sensitivity of 60 times for a fixed value of tBio= 30 nm and k = 10 and QBiochanging from 1 × 1010cm-2to 1 × 1012cm-2. The results show that the sensitivity of the fringing field Bio-nTFET is strongly dependent on the tunneling length modulation. c 2021 The Author(s).LSI/PSI/USP University of Sao PauloUNESP Sao Paulo State UniversityUNESP Sao Paulo State UniversityUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Macambira, C. N.Agopian, P. G.D. [UNESP]Martino, J. A.2021-06-25T10:22:39Z2021-06-25T10:22:39Z2021-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://dx.doi.org/10.1149/2162-8777/abdd85ECS Journal of Solid State Science and Technology, v. 10, n. 1, 2021.2162-87772162-8769http://hdl.handle.net/11449/20587310.1149/2162-8777/abdd852-s2.0-85100808012Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengECS Journal of Solid State Science and Technologyinfo:eu-repo/semantics/openAccess2021-10-22T19:32:40Zoai:repositorio.unesp.br:11449/205873Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T23:58:15.658090Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Study of a fringing field biosensor tunnel-FET |
title |
Study of a fringing field biosensor tunnel-FET |
spellingShingle |
Study of a fringing field biosensor tunnel-FET Macambira, C. N. |
title_short |
Study of a fringing field biosensor tunnel-FET |
title_full |
Study of a fringing field biosensor tunnel-FET |
title_fullStr |
Study of a fringing field biosensor tunnel-FET |
title_full_unstemmed |
Study of a fringing field biosensor tunnel-FET |
title_sort |
Study of a fringing field biosensor tunnel-FET |
author |
Macambira, C. N. |
author_facet |
Macambira, C. N. Agopian, P. G.D. [UNESP] Martino, J. A. |
author_role |
author |
author2 |
Agopian, P. G.D. [UNESP] Martino, J. A. |
author2_role |
author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Macambira, C. N. Agopian, P. G.D. [UNESP] Martino, J. A. |
description |
In this paper, we present a comprehensive study of the Fringing Field Biosensor Tunnel-FET (Bio-TFET) device based on 2Ddevice simulation. The presence of a biomaterial with a distinct dielectric constant (k, where ∈ = k∗∈0) on the underlap region (LUD) between gate and drain affects the ambipolar drain current (ID). The Bio-TFET can be observed in the ambipolar region (i.e., for negative gate voltage in an n type Bio-nTFET device) due to the variation of the k, biomaterial thicknesses (tBio), the LUD, and/ or the presence of charges (QBio) into the biomaterial/silicon interface. The results show that the maximum sensitivity is observed when LUD= 30 nm (3 orders of magnitude higher compared with LUDof 25 nm lower or higher than 30 nm). When tBioincreases from 10 nm to 30 nm (for k = 10), the sensitivity increases up to 1 orders of magnitude. The presence of QBiointo the biomaterial also increases the sensitivity of 60 times for a fixed value of tBio= 30 nm and k = 10 and QBiochanging from 1 × 1010cm-2to 1 × 1012cm-2. The results show that the sensitivity of the fringing field Bio-nTFET is strongly dependent on the tunneling length modulation. c 2021 The Author(s). |
publishDate |
2021 |
dc.date.none.fl_str_mv |
2021-06-25T10:22:39Z 2021-06-25T10:22:39Z 2021-01-01 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1149/2162-8777/abdd85 ECS Journal of Solid State Science and Technology, v. 10, n. 1, 2021. 2162-8777 2162-8769 http://hdl.handle.net/11449/205873 10.1149/2162-8777/abdd85 2-s2.0-85100808012 |
url |
http://dx.doi.org/10.1149/2162-8777/abdd85 http://hdl.handle.net/11449/205873 |
identifier_str_mv |
ECS Journal of Solid State Science and Technology, v. 10, n. 1, 2021. 2162-8777 2162-8769 10.1149/2162-8777/abdd85 2-s2.0-85100808012 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
ECS Journal of Solid State Science and Technology |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129568529186816 |