Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method
Autor(a) principal: | |
---|---|
Data de Publicação: | 2002 |
Outros Autores: | , , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1080/00150190211496 http://hdl.handle.net/11449/66762 |
Resumo: | Strontium bismuth tantalate thin films were prepared on several substrates (platinized silicon (Pt/Ti/SiO 2 /Si), n -type (100)-oriented and p -type (111)-oriented silicon wafers, and fused silica) by the solution deposition method. The resin was obtained by the polymeric precursor method, based on the Pechini process, using strontium carbonate, bismuth oxide, and tantalum ethoxide as starting reagents. Characterizations by XRD and SEM were performed for structural and microstructural evaluations. The electrical measurements, carried on the MFM configuration, showed P r values of 6.24 μC/cm 2 and 31.5 kV/cm for the film annealed at 800 C. The film deposited onto fused silica and treated at 700 C presented around 80% of transmittance. © 2002 Taylor & Francis. |
id |
UNSP_d9ce5787a45dc7c8adb234d5b52bf7a7 |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/66762 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor methodChemical methodFerroelectricMicrostructureSrBi2Ta2O9Thin filmsCrystallographyDielectric propertiesOptical propertiesScanning electron microscopySubstratesX ray diffraction analysisMicrostructural evaluationsStrontium bismuth tantalate thin filmsStrontium compoundsStrontium bismuth tantalate thin films were prepared on several substrates (platinized silicon (Pt/Ti/SiO 2 /Si), n -type (100)-oriented and p -type (111)-oriented silicon wafers, and fused silica) by the solution deposition method. The resin was obtained by the polymeric precursor method, based on the Pechini process, using strontium carbonate, bismuth oxide, and tantalum ethoxide as starting reagents. Characterizations by XRD and SEM were performed for structural and microstructural evaluations. The electrical measurements, carried on the MFM configuration, showed P r values of 6.24 μC/cm 2 and 31.5 kV/cm for the film annealed at 800 C. The film deposited onto fused silica and treated at 700 C presented around 80% of transmittance. © 2002 Taylor & Francis.Universidade Estadual Paulista, C.P. 355, 14801-970, AraraquaraUniversidade Federal de São Carlos, C.P. 676, 13505-905, S. CarlosUniversidade Estadual Paulista, C.P. 355, 14801-970, AraraquaraUniversidade Estadual Paulista (Unesp)Universidade Federal de São Carlos (UFSCar)Zanetti, Sônia Maria [UNESP]Sotilo, Vanessa C. M.Leite, Edson R.Longo, Elson [UNESP]Varela, José Arana [UNESP]2014-05-27T11:20:23Z2014-05-27T11:20:23Z2002-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject259-264http://dx.doi.org/10.1080/00150190211496Ferroelectrics, v. 271, p. 259-264.0015-01931563-5112http://hdl.handle.net/11449/6676210.1080/001501902114962-s2.0-33746276433Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengFerroelectrics0.7280,260info:eu-repo/semantics/openAccess2021-10-23T21:41:41Zoai:repositorio.unesp.br:11449/66762Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T21:23:29.994346Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
title |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
spellingShingle |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method Zanetti, Sônia Maria [UNESP] Chemical method Ferroelectric Microstructure SrBi2Ta2O9 Thin films Crystallography Dielectric properties Optical properties Scanning electron microscopy Substrates X ray diffraction analysis Microstructural evaluations Strontium bismuth tantalate thin films Strontium compounds |
title_short |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
title_full |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
title_fullStr |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
title_full_unstemmed |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
title_sort |
Crystallographic, dielectric and optical properties of SrBi 2Ta2O9 thin films prepared by the polymeric precursor method |
author |
Zanetti, Sônia Maria [UNESP] |
author_facet |
Zanetti, Sônia Maria [UNESP] Sotilo, Vanessa C. M. Leite, Edson R. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author_role |
author |
author2 |
Sotilo, Vanessa C. M. Leite, Edson R. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author2_role |
author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) Universidade Federal de São Carlos (UFSCar) |
dc.contributor.author.fl_str_mv |
Zanetti, Sônia Maria [UNESP] Sotilo, Vanessa C. M. Leite, Edson R. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
dc.subject.por.fl_str_mv |
Chemical method Ferroelectric Microstructure SrBi2Ta2O9 Thin films Crystallography Dielectric properties Optical properties Scanning electron microscopy Substrates X ray diffraction analysis Microstructural evaluations Strontium bismuth tantalate thin films Strontium compounds |
topic |
Chemical method Ferroelectric Microstructure SrBi2Ta2O9 Thin films Crystallography Dielectric properties Optical properties Scanning electron microscopy Substrates X ray diffraction analysis Microstructural evaluations Strontium bismuth tantalate thin films Strontium compounds |
description |
Strontium bismuth tantalate thin films were prepared on several substrates (platinized silicon (Pt/Ti/SiO 2 /Si), n -type (100)-oriented and p -type (111)-oriented silicon wafers, and fused silica) by the solution deposition method. The resin was obtained by the polymeric precursor method, based on the Pechini process, using strontium carbonate, bismuth oxide, and tantalum ethoxide as starting reagents. Characterizations by XRD and SEM were performed for structural and microstructural evaluations. The electrical measurements, carried on the MFM configuration, showed P r values of 6.24 μC/cm 2 and 31.5 kV/cm for the film annealed at 800 C. The film deposited onto fused silica and treated at 700 C presented around 80% of transmittance. © 2002 Taylor & Francis. |
publishDate |
2002 |
dc.date.none.fl_str_mv |
2002-01-01 2014-05-27T11:20:23Z 2014-05-27T11:20:23Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1080/00150190211496 Ferroelectrics, v. 271, p. 259-264. 0015-0193 1563-5112 http://hdl.handle.net/11449/66762 10.1080/00150190211496 2-s2.0-33746276433 |
url |
http://dx.doi.org/10.1080/00150190211496 http://hdl.handle.net/11449/66762 |
identifier_str_mv |
Ferroelectrics, v. 271, p. 259-264. 0015-0193 1563-5112 10.1080/00150190211496 2-s2.0-33746276433 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Ferroelectrics 0.728 0,260 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
259-264 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129315934568448 |