Combining disease resistance and postharvest quality traits by early marker-assisted backcrossing in carioca beans

• Autor(a) principal: Paulino,Jean Fausto de Carvalho
• Data de Publicação: 2022
• Outros Autores: Almeida,Caléo Panhoca de, Santos,Isabella Laporte, Gonçalves,João Guilherme Ribeiro, Carbonell,Sérgio Augusto Morais, Chiorato,Alisson Fernando, Benchimol-Reis,Luciana Lasry
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Scientia Agrícola (Online)
• Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-90162022000201101
• topic: Phaseolus vulgaris; SSRs; marker-assisted selection; genetic resistance; grain darkening

ABSTRACT: Common bean is a worldwide important crop. The development of varieties with durable resistance to diseases is a major challenge in common bean breeding. The present study aimed at evaluating the phenotypic and molecular selection of anthracnose resistance in a population obtained by assisted backcrossing from IAC Formoso (resistant, donor parent) × BRS Pérola (susceptible, recurrent parent). Nine microsatellites (SSRs) and one Sequence Tagged Sites (STS) markers previously linked to ANT resistance were used to genotype this progeny, and the results showed that the selection of the genotypes closest to the donor parent in the BC1F1 population decreased the number of backcrossing cycles necessary to obtain advanced isogenic lines, potentiating the use of this tool for early selection of resistant cultivars. A total of 31 % of the BC1F1 progeny was selected and backcrossed again. The progeny derived from the second backcross (BC2F3) was selected for the Carioca grain ideotype, and 42 % of the genotypes showed high resistance to anthracnose under controlled conditions of infection for races 65 and 81. Superior resistant plants were selected and evaluated under natural conditions of infection to fusarium wilt and angular leaf spot, allowing the selection of two inbred lines with higher resistance to anthracnose, fusarium wilt, angular leaf spot and postharvest quality traits such as yield, 100 seed weight, L value at seed harvest grain darkening and cooking time. The approach outlined in this paper proved to be effective to simultaneously select for disease resistance without losing technological quality aspects of the bean.