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Rotondaro, Antonio L.P.
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Rotondaro, Antonio L.P.
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Rotondaro, Antonio L.P.
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Stability of zirconium silicate films on Si under vacuum and O/sub 2/ annealing
by
Morais, Jonder
Published 2001
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Rotondaro
,
Antonio
L.P
....
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Environment of hafnium and silicon in Hf-based dielectric films : an atomistic study by x-ray absorption spectroscopy and x-ray diffraction
by
Morais, Jonder
Published 2005
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Rotondaro
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Antonio
L.P
....
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3
Integrity of hafnium silicate/silicon dioxide ultrathin films on Si
by
Morais, Jonder
Published 2002
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Rotondaro
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Antonio
L.P
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4
Hydrogen and deuterium incorporation and transport in hafnium-based dielectric films on silicon
by
Pezzi, Rafael Peretti
Published 2004
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Rotondaro
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Antonio
L.P
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5
Exchange-diffusion reactions in HfSiON during annealing studied by Rutherford backscattering spectrometry, nuclear reaction analysis and narrow resonant nuclear reaction profiling
by
Miotti, Leonardo
Published 2004
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Rotondaro
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Antonio
L.P
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