Correlation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latter

Detalhes bibliográficos
Autor(a) principal: LALIC, M.V.
Data de Publicação: 2005
Outros Autores: MESTNIK FILHO, J.
Tipo de documento: Artigo
Texto Completo: http://repositorio.ipen.br:8080/xmlui/handle/123456789/5529
id IPEN_940cc4df3a9ad0f12e7ae26b3b4149da
oai_identifier_str oai:repositorio.ipen.br:123456789/5529
network_name_str Repositório Institucional do IPEN
title Correlation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latter
author LALIC, M.V.
author2 MESTNIK FILHO, J.
topic cadmium
impurities
copper oxides
boron oxides
semiconductor materials
electric fields
density functional method
publishDate 2005
format article
url http://repositorio.ipen.br:8080/xmlui/handle/123456789/5529
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN