Correlation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latter
Autor(a) principal: | |
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Data de Publicação: | 2005 |
Outros Autores: | |
Tipo de documento: | Artigo |
Texto Completo: | http://repositorio.ipen.br:8080/xmlui/handle/123456789/5529 |
id |
IPEN_940cc4df3a9ad0f12e7ae26b3b4149da |
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oai_identifier_str |
oai:repositorio.ipen.br:123456789/5529 |
network_name_str |
Repositório Institucional do IPEN |
title |
Correlation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latter |
author |
LALIC, M.V. |
author2 |
MESTNIK FILHO, J. |
topic |
cadmium impurities copper oxides boron oxides semiconductor materials electric fields density functional method |
publishDate |
2005 |
format |
article |
url |
http://repositorio.ipen.br:8080/xmlui/handle/123456789/5529 |
instname_str |
Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
instacron_str |
IPEN |