In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10400.9/3684 |
Resumo: | ABSTRACT: When considering materials to be used as active layers in solar cells, an important required parameter is the proper knowledge of their elemental composition. It should be heavily controlled during growth in order to obtain the desired band gap and to decrease the recombination defects and then increase the solar cell electrical performance. Ion beam analytical (IBA) techniques and, in particular, particle-induced X-ray emission (PIXE) and elastic backscattering spectrometry (EBS) are quite suitable to determine the thickness and composition of such active layers. Furthermore, if these techniques are performed using a nuclear microprobe, lateral and in-depth inhomogeneities can be clearly observed from 2D maps. In many cases, composition variations can be detected from the classical 2D maps obtained from the PIXE spectra. In this work, it is shown how the in-depth variations can also be studied when considering 2D maps reconstructed from the EBS spectra. Such variations are derived from processing conditions and can be related to (i) composition, (ii) thickness, (iii) roughness, and (iv) other nontrivial issues. Examples obtained on Cu(In,Ga)Se-2-based cells are presented and discussed. Furthermore, the combination of IBA techniques such as PIXE and EBS is shown to be a competitive and alternative method to the more used and established techniques such as X-ray fluorescence for checking the average composition of the solar cell active layers or secondary ion mass spectroscopy for determination of the elemental depth profile. |
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In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBSMaterialsSolar cellsX-ray diffractionNanoparticlesABSTRACT: When considering materials to be used as active layers in solar cells, an important required parameter is the proper knowledge of their elemental composition. It should be heavily controlled during growth in order to obtain the desired band gap and to decrease the recombination defects and then increase the solar cell electrical performance. Ion beam analytical (IBA) techniques and, in particular, particle-induced X-ray emission (PIXE) and elastic backscattering spectrometry (EBS) are quite suitable to determine the thickness and composition of such active layers. Furthermore, if these techniques are performed using a nuclear microprobe, lateral and in-depth inhomogeneities can be clearly observed from 2D maps. In many cases, composition variations can be detected from the classical 2D maps obtained from the PIXE spectra. In this work, it is shown how the in-depth variations can also be studied when considering 2D maps reconstructed from the EBS spectra. Such variations are derived from processing conditions and can be related to (i) composition, (ii) thickness, (iii) roughness, and (iv) other nontrivial issues. Examples obtained on Cu(In,Ga)Se-2-based cells are presented and discussed. Furthermore, the combination of IBA techniques such as PIXE and EBS is shown to be a competitive and alternative method to the more used and established techniques such as X-ray fluorescence for checking the average composition of the solar cell active layers or secondary ion mass spectroscopy for determination of the elemental depth profile.American Chemical SocietyRepositório do LNEGCorregidor, V.Barreiros, M. AlexandraSalomé, P.M.P.Alves, L. C.2021-07-01T00:00:00Z2026-12-01T00:00:00Z2021-07-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.9/3684engCorregidor, Victoria... [et.al.] - In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS. In: Journal of Physical Chemistry C, 2021, Vol. 125, pp.16155-161651932-744710.1021/acs.jpcc.1c027311932-7455info:eu-repo/semantics/embargoedAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2022-09-06T12:29:24Zoai:repositorio.lneg.pt:10400.9/3684Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T15:36:53.893400Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
title |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
spellingShingle |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS Corregidor, V. Materials Solar cells X-ray diffraction Nanoparticles |
title_short |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
title_full |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
title_fullStr |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
title_full_unstemmed |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
title_sort |
In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS |
author |
Corregidor, V. |
author_facet |
Corregidor, V. Barreiros, M. Alexandra Salomé, P.M.P. Alves, L. C. |
author_role |
author |
author2 |
Barreiros, M. Alexandra Salomé, P.M.P. Alves, L. C. |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Repositório do LNEG |
dc.contributor.author.fl_str_mv |
Corregidor, V. Barreiros, M. Alexandra Salomé, P.M.P. Alves, L. C. |
dc.subject.por.fl_str_mv |
Materials Solar cells X-ray diffraction Nanoparticles |
topic |
Materials Solar cells X-ray diffraction Nanoparticles |
description |
ABSTRACT: When considering materials to be used as active layers in solar cells, an important required parameter is the proper knowledge of their elemental composition. It should be heavily controlled during growth in order to obtain the desired band gap and to decrease the recombination defects and then increase the solar cell electrical performance. Ion beam analytical (IBA) techniques and, in particular, particle-induced X-ray emission (PIXE) and elastic backscattering spectrometry (EBS) are quite suitable to determine the thickness and composition of such active layers. Furthermore, if these techniques are performed using a nuclear microprobe, lateral and in-depth inhomogeneities can be clearly observed from 2D maps. In many cases, composition variations can be detected from the classical 2D maps obtained from the PIXE spectra. In this work, it is shown how the in-depth variations can also be studied when considering 2D maps reconstructed from the EBS spectra. Such variations are derived from processing conditions and can be related to (i) composition, (ii) thickness, (iii) roughness, and (iv) other nontrivial issues. Examples obtained on Cu(In,Ga)Se-2-based cells are presented and discussed. Furthermore, the combination of IBA techniques such as PIXE and EBS is shown to be a competitive and alternative method to the more used and established techniques such as X-ray fluorescence for checking the average composition of the solar cell active layers or secondary ion mass spectroscopy for determination of the elemental depth profile. |
publishDate |
2021 |
dc.date.none.fl_str_mv |
2021-07-01T00:00:00Z 2021-07-01T00:00:00Z 2026-12-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10400.9/3684 |
url |
http://hdl.handle.net/10400.9/3684 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Corregidor, Victoria... [et.al.] - In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS. In: Journal of Physical Chemistry C, 2021, Vol. 125, pp.16155-16165 1932-7447 10.1021/acs.jpcc.1c02731 1932-7455 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/embargoedAccess |
eu_rights_str_mv |
embargoedAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
American Chemical Society |
publisher.none.fl_str_mv |
American Chemical Society |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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RCAAP |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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