Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects
Autor(a) principal: | |
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Data de Publicação: | 2022 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | https://hdl.handle.net/1822/86988 |
Resumo: | Comprehensive and systematic study challenging the application of Vegard's rule to germanium tin solid solutions grown on germanium buffer layers and 100 silicon substrates is presented. The binary's lattice parameters, composition and respective uncertainties are determined through x-ray diffraction via reciprocal space mapping technique employing newly developed software. The tin content is confirmed by Rutherford backscattering spectrometry and energy dispersive x-ray spectroscopy. The statistical agreement between the tin contents derived by the different structural characterization techniques suggests the binary to follow generically the Vegard's rule in the range of low Sn molar fractions (<5%). Phase separation, Sn segregation, point defects, post-growing oxygen impurities, and deteriorated surface morphology are found to be relevant within the similar to 200 nm germanium tin films. Although, complex mechanisms triggering composition/strain heterogeneities are found in the analysed Ge1-x Sn (x) compounds, the deviation from the perfect crystals is suggested to be not enough to distort the in- and out-of-plane lattice parameters away from its empirical linear combination. |
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Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defectsGeSn compoundx-ray diffractionx-ray reflectivitydefectsion channellingCiências Naturais::Ciências FísicasScience & TechnologyComprehensive and systematic study challenging the application of Vegard's rule to germanium tin solid solutions grown on germanium buffer layers and 100 silicon substrates is presented. The binary's lattice parameters, composition and respective uncertainties are determined through x-ray diffraction via reciprocal space mapping technique employing newly developed software. The tin content is confirmed by Rutherford backscattering spectrometry and energy dispersive x-ray spectroscopy. The statistical agreement between the tin contents derived by the different structural characterization techniques suggests the binary to follow generically the Vegard's rule in the range of low Sn molar fractions (<5%). Phase separation, Sn segregation, point defects, post-growing oxygen impurities, and deteriorated surface morphology are found to be relevant within the similar to 200 nm germanium tin films. Although, complex mechanisms triggering composition/strain heterogeneities are found in the analysed Ge1-x Sn (x) compounds, the deviation from the perfect crystals is suggested to be not enough to distort the in- and out-of-plane lattice parameters away from its empirical linear combination.This work was supported by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Plurianual Strategic Funding UID/FIS/50010/2019. F O acknowledges the FCT PhD Grant and thanks the Institut fur Halbleitertechnik, Universitat Stuttgart for hospitality. The authors acknowledge Professor J Schulze for providing the MBE facilities and the growing of the growing of the germanium tin films.IOP Publishing LtdUniversidade do MinhoMagalhaes, S.Dias, M.Nunes, B.Oliveira, F.Cerqueira, M. F.Alves, E.2022-07-2110000-01-01T00:00:00Z2022-07-21T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/1822/86988engMagalhães, S., Dias, M., Nunes, B., Oliveira, F., Cerqueira, M. F., & Alves, E. (2022, May 3). Confronting Vegard’s rule in Ge1−x Sn x epilayers: from fundamentals to the effect of defects. Journal of Physics D: Applied Physics. IOP Publishing. http://doi.org/10.1088/1361-6463/ac677a0022-37271361-646310.1088/1361-6463/ac677ahttps://iopscience.iop.org/article/10.1088/1361-6463/ac677ainfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-10-21T01:26:27Zoai:repositorium.sdum.uminho.pt:1822/86988Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:39:01.086104Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
title |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
spellingShingle |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects Magalhaes, S. GeSn compound x-ray diffraction x-ray reflectivity defects ion channelling Ciências Naturais::Ciências Físicas Science & Technology |
title_short |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
title_full |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
title_fullStr |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
title_full_unstemmed |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
title_sort |
Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects |
author |
Magalhaes, S. |
author_facet |
Magalhaes, S. Dias, M. Nunes, B. Oliveira, F. Cerqueira, M. F. Alves, E. |
author_role |
author |
author2 |
Dias, M. Nunes, B. Oliveira, F. Cerqueira, M. F. Alves, E. |
author2_role |
author author author author author |
dc.contributor.none.fl_str_mv |
Universidade do Minho |
dc.contributor.author.fl_str_mv |
Magalhaes, S. Dias, M. Nunes, B. Oliveira, F. Cerqueira, M. F. Alves, E. |
dc.subject.por.fl_str_mv |
GeSn compound x-ray diffraction x-ray reflectivity defects ion channelling Ciências Naturais::Ciências Físicas Science & Technology |
topic |
GeSn compound x-ray diffraction x-ray reflectivity defects ion channelling Ciências Naturais::Ciências Físicas Science & Technology |
description |
Comprehensive and systematic study challenging the application of Vegard's rule to germanium tin solid solutions grown on germanium buffer layers and 100 silicon substrates is presented. The binary's lattice parameters, composition and respective uncertainties are determined through x-ray diffraction via reciprocal space mapping technique employing newly developed software. The tin content is confirmed by Rutherford backscattering spectrometry and energy dispersive x-ray spectroscopy. The statistical agreement between the tin contents derived by the different structural characterization techniques suggests the binary to follow generically the Vegard's rule in the range of low Sn molar fractions (<5%). Phase separation, Sn segregation, point defects, post-growing oxygen impurities, and deteriorated surface morphology are found to be relevant within the similar to 200 nm germanium tin films. Although, complex mechanisms triggering composition/strain heterogeneities are found in the analysed Ge1-x Sn (x) compounds, the deviation from the perfect crystals is suggested to be not enough to distort the in- and out-of-plane lattice parameters away from its empirical linear combination. |
publishDate |
2022 |
dc.date.none.fl_str_mv |
10000-01-01T00:00:00Z 2022-07-21 2022-07-21T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://hdl.handle.net/1822/86988 |
url |
https://hdl.handle.net/1822/86988 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Magalhães, S., Dias, M., Nunes, B., Oliveira, F., Cerqueira, M. F., & Alves, E. (2022, May 3). Confronting Vegard’s rule in Ge1−x Sn x epilayers: from fundamentals to the effect of defects. Journal of Physics D: Applied Physics. IOP Publishing. http://doi.org/10.1088/1361-6463/ac677a 0022-3727 1361-6463 10.1088/1361-6463/ac677a https://iopscience.iop.org/article/10.1088/1361-6463/ac677a |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
IOP Publishing Ltd |
publisher.none.fl_str_mv |
IOP Publishing Ltd |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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