Non-resonant Permittivity Measurement Methods
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297 |
Resumo: | Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented. |
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Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
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Non-resonant Permittivity Measurement MethodsMicrowave measurementspermittivityshort-circuit transmission line methodtransmission/reflection methodAbstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo2017-03-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.16 n.1 2017reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applicationsinstname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)instacron:SBMO10.1590/2179-10742017v16i1890info:eu-repo/semantics/openAccessSevero,Sergio L. S.Salles,Álvaro A. A. deNervis,BrunoZanini,Braian K.eng2017-03-31T00:00:00Zoai:scielo:S2179-10742017000100297Revistahttp://www.jmoe.org/index.php/jmoe/indexONGhttps://old.scielo.br/oai/scielo-oai.php||editor_jmoe@sbmo.org.br2179-10742179-1074opendoar:2017-03-31T00:00Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)false |
dc.title.none.fl_str_mv |
Non-resonant Permittivity Measurement Methods |
title |
Non-resonant Permittivity Measurement Methods |
spellingShingle |
Non-resonant Permittivity Measurement Methods Severo,Sergio L. S. Microwave measurements permittivity short-circuit transmission line method transmission/reflection method |
title_short |
Non-resonant Permittivity Measurement Methods |
title_full |
Non-resonant Permittivity Measurement Methods |
title_fullStr |
Non-resonant Permittivity Measurement Methods |
title_full_unstemmed |
Non-resonant Permittivity Measurement Methods |
title_sort |
Non-resonant Permittivity Measurement Methods |
author |
Severo,Sergio L. S. |
author_facet |
Severo,Sergio L. S. Salles,Álvaro A. A. de Nervis,Bruno Zanini,Braian K. |
author_role |
author |
author2 |
Salles,Álvaro A. A. de Nervis,Bruno Zanini,Braian K. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Severo,Sergio L. S. Salles,Álvaro A. A. de Nervis,Bruno Zanini,Braian K. |
dc.subject.por.fl_str_mv |
Microwave measurements permittivity short-circuit transmission line method transmission/reflection method |
topic |
Microwave measurements permittivity short-circuit transmission line method transmission/reflection method |
description |
Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-03-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742017000100297 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/2179-10742017v16i1890 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo |
publisher.none.fl_str_mv |
Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo |
dc.source.none.fl_str_mv |
Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.16 n.1 2017 reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applications instname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) instacron:SBMO |
instname_str |
Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) |
instacron_str |
SBMO |
institution |
SBMO |
reponame_str |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
collection |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
repository.name.fl_str_mv |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) |
repository.mail.fl_str_mv |
||editor_jmoe@sbmo.org.br |
_version_ |
1752122126166392832 |