Crescimento de filmes finos de NbN por magnetron sputtering reativo

Detalhes bibliográficos
Autor(a) principal: Souza, Paloma Boeck
Data de Publicação: 2013
Tipo de documento: Dissertação
Idioma: por
Título da fonte: Manancial - Repositório Digital da UFSM
dARK ID: ark:/26339/0013000000rzc
Texto Completo: http://repositorio.ufsm.br/handle/1/9229
Resumo: In the last decades, several applications of niobium nitride thin films has been proposed or effectively implemented. In the cubic δ − NbN phase, the bulk material presents a Tc for the superconducting transition near 17 K, what is far larger than those found in other normal (BCS) superconductors and useful in, for example, Josephson tunnel junctions. More recently, other phases have been also focus of interest, like the hexagonal δ-NbN phase. The hardness and resistance to chemical corrosion make this material well fitted for mechanically improved surface. Thin film preparation or deposition of niobium nitrides by physical methods (PVD) is not a trivial task. Stoichiometry, crystal structure and morphology of the resulting films are strongly affected by the deposition conditions, and even a qualitative model for the growth mechanisms of niobioum nitride is still lacking. In this work we have studied the effect of some parameters on the structural and morphologic properties of NbN thin films. The samples have been produced by reactive magnetron sputtering for different nitrogen partial pressures, substrate temperatures, bias voltages and deposition times. The crystallographic structure, preferred orientations, grain sizes and surface roughness were stablished by XR diffraction and, for some samples, atomic force microscopy. The results have shown that without bias voltage cubic NbN thin films are obtained, with or without substrate heating, when the partial pressure of N2 in the reactive atmosphere is between 13 and 25 %. Films produced with 17 % N2 are preferentially oriented in the <200> direction and this texture is enhanced by substrate heating. The analysis of the results in two samples with different thickness clearly indicates that for cubib NbN, the growth is remarkable different in the <111> and <200> directions. A possible mechanism to explain this difference is presented. The main effect of the voltage bias was to induce a hexagonal δ - NbN structure even for voltages as low as -10 V. These films present larger densities values than those found in the films with cubic phase, being the highest density achieved with -70V bias. All samples deposited with bias present a compressive stress and small grain size. The connections between stress, grain size and density are presented and discussed. In summary, we have identified a group of key parameters that makes possible the deposition of NbN thin films by reactive magnetron sputtering, either for superconductivity or tribological applications.
id UFSM_66fdfab3d9b024528ec9a809f18ce944
oai_identifier_str oai:repositorio.ufsm.br:1/9229
network_acronym_str UFSM
network_name_str Manancial - Repositório Digital da UFSM
repository_id_str
spelling Crescimento de filmes finos de NbN por magnetron sputtering reativoGrowth of nbn thin films by reactive magnetron sputteringEstrutura cristalográficaRaios XTexturaTamanho médio de grãosNbNCristallographic structureX raysTextureAverage grain sizeNbNCNPQ::CIENCIAS EXATAS E DA TERRA::FISICAIn the last decades, several applications of niobium nitride thin films has been proposed or effectively implemented. In the cubic δ − NbN phase, the bulk material presents a Tc for the superconducting transition near 17 K, what is far larger than those found in other normal (BCS) superconductors and useful in, for example, Josephson tunnel junctions. More recently, other phases have been also focus of interest, like the hexagonal δ-NbN phase. The hardness and resistance to chemical corrosion make this material well fitted for mechanically improved surface. Thin film preparation or deposition of niobium nitrides by physical methods (PVD) is not a trivial task. Stoichiometry, crystal structure and morphology of the resulting films are strongly affected by the deposition conditions, and even a qualitative model for the growth mechanisms of niobioum nitride is still lacking. In this work we have studied the effect of some parameters on the structural and morphologic properties of NbN thin films. The samples have been produced by reactive magnetron sputtering for different nitrogen partial pressures, substrate temperatures, bias voltages and deposition times. The crystallographic structure, preferred orientations, grain sizes and surface roughness were stablished by XR diffraction and, for some samples, atomic force microscopy. The results have shown that without bias voltage cubic NbN thin films are obtained, with or without substrate heating, when the partial pressure of N2 in the reactive atmosphere is between 13 and 25 %. Films produced with 17 % N2 are preferentially oriented in the <200> direction and this texture is enhanced by substrate heating. The analysis of the results in two samples with different thickness clearly indicates that for cubib NbN, the growth is remarkable different in the <111> and <200> directions. A possible mechanism to explain this difference is presented. The main effect of the voltage bias was to induce a hexagonal δ - NbN structure even for voltages as low as -10 V. These films present larger densities values than those found in the films with cubic phase, being the highest density achieved with -70V bias. All samples deposited with bias present a compressive stress and small grain size. The connections between stress, grain size and density are presented and discussed. In summary, we have identified a group of key parameters that makes possible the deposition of NbN thin films by reactive magnetron sputtering, either for superconductivity or tribological applications.Conselho Nacional de Desenvolvimento Científico e TecnológicoNas últimas décadas, têm sido propostas e implementadas muitas aplicações para filmes finos de nitreto de nióbio. Na fase cúbica δ − NbN, o material na sua forma bulk apresenta Tc de transição supercondutora próxima a 17 K, o qual é de longe muito maior do que os valores encontrados para outros supercondutores normais (BCS). E, proveitoso, por exemplo, para junções túnel Josephson. Mais recentemente, outras fases também têm sido foco de interesse, como a hexagonal δ0 − NbN. A dureza e resistência à corrosão química fazem deste material bem equipado para melhoramento mecânico de superfícies. A preparação de filmes finos de nitretos de nióbio por PVD não é uma tarefa trivial. Estequiometria, estrutura cristalina e morfologia dos filmes resultantes são fortemente afetadas pelas condições de deposição. E, mesmo um modelo qualitativo para os mecanismos de crescimento do nitreto de nióbio ainda está faltando. Neste trabalho estudamos o efeito de alguns parâmetros sobre as propriedades estruturais e morfológicas de filmes finos de NbN. As amostras foram produzidas por magnetron sputtering reativo com diferentes pressões parciais de nitrogênio, temperaturas do substrato, voltagem bias e tempos de deposição. Os resultados mostraram que sem bias aplicado são obtidos filmes finos de NbN na fase cúbica, com ou sem aquecimento do substrato, quando a pressão parcial de N2 na atmosfera reativa está entre 13 e 25%. Filmes produzidos com 17% de N2 estão preferencialmente orientados na direção (200) e sua textura é aumentada por aquecimento do substrato. A análise dos resultados em duas amostras com diferentes espessuras indicou claramente que, para NbN cúbico, o crescimento é notavelmente diferente nas direções (111) e (200). Um possível mecanismo capaz de explicar esta diferença é proposto neste trabalho. O efeito significativo da aplicação do bias foi induzir a estrutura hexagonal δ − NbN mesmo para voltagens pequenas como -10 V. Estes filmes apresentam valores de densidade maiores do que para os filmes com fase cúbica, sendo a maior densidade alcançada para -70 V de bias. Todas amostras depositadas com aplicação de bias apresentaram estresse compressivo e tamanho de grãos pequeno. As conexões entre estresse, tamanho de grão e densidade são apresentados e discutidos. Em resumo, identificamos um grupo de parâmetros chave que tornam possível a deposição de filmes finos de NbN por magnetron sputtering reativo, seja para supercondutividade seja para aplicações tribológicas.Universidade Federal de Santa MariaBRFísicaUFSMPrograma de Pós-Graduação em FísicaSchelp, Luiz Fernandohttp://lattes.cnpq.br/8797015996750551Viegas, Alexandre da Cashttp://lattes.cnpq.br/5936503285330202Souza, Paloma Boeck2017-05-092017-05-092013-02-18info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfapplication/pdfSOUZA, Paloma Boeck. Growth of nbn thin films by reactive magnetron sputtering. 2013. 87 f. Dissertação (Mestrado em Física) - Universidade Federal de Santa Maria, Santa Maria, 2013.http://repositorio.ufsm.br/handle/1/9229ark:/26339/0013000000rzcporinfo:eu-repo/semantics/openAccessreponame:Manancial - Repositório Digital da UFSMinstname:Universidade Federal de Santa Maria (UFSM)instacron:UFSM2022-08-11T18:11:51Zoai:repositorio.ufsm.br:1/9229Biblioteca Digital de Teses e Dissertaçõeshttps://repositorio.ufsm.br/ONGhttps://repositorio.ufsm.br/oai/requestatendimento.sib@ufsm.br||tedebc@gmail.comopendoar:2022-08-11T18:11:51Manancial - Repositório Digital da UFSM - Universidade Federal de Santa Maria (UFSM)false
dc.title.none.fl_str_mv Crescimento de filmes finos de NbN por magnetron sputtering reativo
Growth of nbn thin films by reactive magnetron sputtering
title Crescimento de filmes finos de NbN por magnetron sputtering reativo
spellingShingle Crescimento de filmes finos de NbN por magnetron sputtering reativo
Souza, Paloma Boeck
Estrutura cristalográfica
Raios X
Textura
Tamanho médio de grãos
NbN
Cristallographic structure
X rays
Texture
Average grain size
NbN
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
title_short Crescimento de filmes finos de NbN por magnetron sputtering reativo
title_full Crescimento de filmes finos de NbN por magnetron sputtering reativo
title_fullStr Crescimento de filmes finos de NbN por magnetron sputtering reativo
title_full_unstemmed Crescimento de filmes finos de NbN por magnetron sputtering reativo
title_sort Crescimento de filmes finos de NbN por magnetron sputtering reativo
author Souza, Paloma Boeck
author_facet Souza, Paloma Boeck
author_role author
dc.contributor.none.fl_str_mv Schelp, Luiz Fernando
http://lattes.cnpq.br/8797015996750551
Viegas, Alexandre da Cas
http://lattes.cnpq.br/5936503285330202
dc.contributor.author.fl_str_mv Souza, Paloma Boeck
dc.subject.por.fl_str_mv Estrutura cristalográfica
Raios X
Textura
Tamanho médio de grãos
NbN
Cristallographic structure
X rays
Texture
Average grain size
NbN
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
topic Estrutura cristalográfica
Raios X
Textura
Tamanho médio de grãos
NbN
Cristallographic structure
X rays
Texture
Average grain size
NbN
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
description In the last decades, several applications of niobium nitride thin films has been proposed or effectively implemented. In the cubic δ − NbN phase, the bulk material presents a Tc for the superconducting transition near 17 K, what is far larger than those found in other normal (BCS) superconductors and useful in, for example, Josephson tunnel junctions. More recently, other phases have been also focus of interest, like the hexagonal δ-NbN phase. The hardness and resistance to chemical corrosion make this material well fitted for mechanically improved surface. Thin film preparation or deposition of niobium nitrides by physical methods (PVD) is not a trivial task. Stoichiometry, crystal structure and morphology of the resulting films are strongly affected by the deposition conditions, and even a qualitative model for the growth mechanisms of niobioum nitride is still lacking. In this work we have studied the effect of some parameters on the structural and morphologic properties of NbN thin films. The samples have been produced by reactive magnetron sputtering for different nitrogen partial pressures, substrate temperatures, bias voltages and deposition times. The crystallographic structure, preferred orientations, grain sizes and surface roughness were stablished by XR diffraction and, for some samples, atomic force microscopy. The results have shown that without bias voltage cubic NbN thin films are obtained, with or without substrate heating, when the partial pressure of N2 in the reactive atmosphere is between 13 and 25 %. Films produced with 17 % N2 are preferentially oriented in the <200> direction and this texture is enhanced by substrate heating. The analysis of the results in two samples with different thickness clearly indicates that for cubib NbN, the growth is remarkable different in the <111> and <200> directions. A possible mechanism to explain this difference is presented. The main effect of the voltage bias was to induce a hexagonal δ - NbN structure even for voltages as low as -10 V. These films present larger densities values than those found in the films with cubic phase, being the highest density achieved with -70V bias. All samples deposited with bias present a compressive stress and small grain size. The connections between stress, grain size and density are presented and discussed. In summary, we have identified a group of key parameters that makes possible the deposition of NbN thin films by reactive magnetron sputtering, either for superconductivity or tribological applications.
publishDate 2013
dc.date.none.fl_str_mv 2013-02-18
2017-05-09
2017-05-09
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/masterThesis
format masterThesis
status_str publishedVersion
dc.identifier.uri.fl_str_mv SOUZA, Paloma Boeck. Growth of nbn thin films by reactive magnetron sputtering. 2013. 87 f. Dissertação (Mestrado em Física) - Universidade Federal de Santa Maria, Santa Maria, 2013.
http://repositorio.ufsm.br/handle/1/9229
dc.identifier.dark.fl_str_mv ark:/26339/0013000000rzc
identifier_str_mv SOUZA, Paloma Boeck. Growth of nbn thin films by reactive magnetron sputtering. 2013. 87 f. Dissertação (Mestrado em Física) - Universidade Federal de Santa Maria, Santa Maria, 2013.
ark:/26339/0013000000rzc
url http://repositorio.ufsm.br/handle/1/9229
dc.language.iso.fl_str_mv por
language por
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Universidade Federal de Santa Maria
BR
Física
UFSM
Programa de Pós-Graduação em Física
publisher.none.fl_str_mv Universidade Federal de Santa Maria
BR
Física
UFSM
Programa de Pós-Graduação em Física
dc.source.none.fl_str_mv reponame:Manancial - Repositório Digital da UFSM
instname:Universidade Federal de Santa Maria (UFSM)
instacron:UFSM
instname_str Universidade Federal de Santa Maria (UFSM)
instacron_str UFSM
institution UFSM
reponame_str Manancial - Repositório Digital da UFSM
collection Manancial - Repositório Digital da UFSM
repository.name.fl_str_mv Manancial - Repositório Digital da UFSM - Universidade Federal de Santa Maria (UFSM)
repository.mail.fl_str_mv atendimento.sib@ufsm.br||tedebc@gmail.com
_version_ 1815172259593060352