Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour
Autor(a) principal: | |
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Data de Publicação: | 2007 |
Tipo de documento: | Artigo |
Título da fonte: | Repositório da Produção Científica e Intelectual da Unicamp |
Texto Completo: | https://hdl.handle.net/20.500.12733/1666437 |
Resumo: | Abstract: We measured water/air interfacial energy as functions of the finest texture radius of annealed PTFE substrates where air bubbles are anchored. The calculated line tension from measured force vs distance curves for a 7 nm PTFE substrate texture radius is (28 +/- 8) x 10(-9) N. However, the most surprising aspect is that this effect is not restricted to the triple line vicinity, previously estimated to be similar to 100 A but spreads all over the water/air bubble interface. The proposed method is an alternative to the controversial contact angle measurement for estimating the line tension contribution |
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Repositório da Produção Científica e Intelectual da Unicamp |
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Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contourMicroscopia de força atômicaNanoestruturaMedidas de YoungAtomic force microscopyNanostructuresYoung measuresArtigo originalAbstract: We measured water/air interfacial energy as functions of the finest texture radius of annealed PTFE substrates where air bubbles are anchored. The calculated line tension from measured force vs distance curves for a 7 nm PTFE substrate texture radius is (28 +/- 8) x 10(-9) N. However, the most surprising aspect is that this effect is not restricted to the triple line vicinity, previously estimated to be similar to 100 A but spreads all over the water/air bubble interface. The proposed method is an alternative to the controversial contact angle measurement for estimating the line tension contributionFUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESPCONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQFechadoUNIVERSIDADE ESTADUAL DE CAMPINASTeschke, Omar, 1944-2007info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.12733/1666437TESCHKE, Omar. Line tension at high contact angle wetting: contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour. Chemical physics letters. Amsterdam : Elsevier, 2007. Vol. 447, n. 4/6 (Oct., 2007), p. 379-383. Disponível em: https://hdl.handle.net/20.500.12733/1666437. Acesso em: 24 mai. 2023.Inglêshttps://repositorio.unicamp.br/acervo/detalhe/1219138reponame:Repositório da Produção Científica e Intelectual da Unicampinstname:Universidade Estadual de Campinas (UNICAMP)instacron:UNICAMPinfo:eu-repo/semantics/openAccess2022-08-03T13:20:15Zoai:https://www.repositorio.unicamp.br/:1219138Repositório InstitucionalPUBhttp://repositorio.unicamp.br/oai/requestreposip@unicamp.bropendoar:2022-08-03T13:20:15Repositório da Produção Científica e Intelectual da Unicamp - Universidade Estadual de Campinas (UNICAMP)false |
dc.title.none.fl_str_mv |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
title |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
spellingShingle |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour Teschke, Omar, 1944- Microscopia de força atômica Nanoestrutura Medidas de Young Atomic force microscopy Nanostructures Young measures Artigo original |
title_short |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
title_full |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
title_fullStr |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
title_full_unstemmed |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
title_sort |
Line tension at high contact angle wetting : contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour |
author |
Teschke, Omar, 1944- |
author_facet |
Teschke, Omar, 1944- |
author_role |
author |
dc.contributor.none.fl_str_mv |
UNIVERSIDADE ESTADUAL DE CAMPINAS |
dc.contributor.author.fl_str_mv |
Teschke, Omar, 1944- |
dc.subject.por.fl_str_mv |
Microscopia de força atômica Nanoestrutura Medidas de Young Atomic force microscopy Nanostructures Young measures Artigo original |
topic |
Microscopia de força atômica Nanoestrutura Medidas de Young Atomic force microscopy Nanostructures Young measures Artigo original |
description |
Abstract: We measured water/air interfacial energy as functions of the finest texture radius of annealed PTFE substrates where air bubbles are anchored. The calculated line tension from measured force vs distance curves for a 7 nm PTFE substrate texture radius is (28 +/- 8) x 10(-9) N. However, the most surprising aspect is that this effect is not restricted to the triple line vicinity, previously estimated to be similar to 100 A but spreads all over the water/air bubble interface. The proposed method is an alternative to the controversial contact angle measurement for estimating the line tension contribution |
publishDate |
2007 |
dc.date.none.fl_str_mv |
2007 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://hdl.handle.net/20.500.12733/1666437 TESCHKE, Omar. Line tension at high contact angle wetting: contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour. Chemical physics letters. Amsterdam : Elsevier, 2007. Vol. 447, n. 4/6 (Oct., 2007), p. 379-383. Disponível em: https://hdl.handle.net/20.500.12733/1666437. Acesso em: 24 mai. 2023. |
url |
https://hdl.handle.net/20.500.12733/1666437 |
identifier_str_mv |
TESCHKE, Omar. Line tension at high contact angle wetting: contribution to interfacial energy at long distances (gt; 100 angstrom) from the triple line contour. Chemical physics letters. Amsterdam : Elsevier, 2007. Vol. 447, n. 4/6 (Oct., 2007), p. 379-383. Disponível em: https://hdl.handle.net/20.500.12733/1666437. Acesso em: 24 mai. 2023. |
dc.language.iso.fl_str_mv |
Inglês |
language_invalid_str_mv |
Inglês |
dc.relation.none.fl_str_mv |
https://repositorio.unicamp.br/acervo/detalhe/1219138 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório da Produção Científica e Intelectual da Unicamp instname:Universidade Estadual de Campinas (UNICAMP) instacron:UNICAMP |
instname_str |
Universidade Estadual de Campinas (UNICAMP) |
instacron_str |
UNICAMP |
institution |
UNICAMP |
reponame_str |
Repositório da Produção Científica e Intelectual da Unicamp |
collection |
Repositório da Produção Científica e Intelectual da Unicamp |
repository.name.fl_str_mv |
Repositório da Produção Científica e Intelectual da Unicamp - Universidade Estadual de Campinas (UNICAMP) |
repository.mail.fl_str_mv |
reposip@unicamp.br |
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