Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy

Detalhes bibliográficos
Autor(a) principal: Teschke, Omar, 1944-
Data de Publicação: 2007
Tipo de documento: Artigo
Título da fonte: Repositório da Produção Científica e Intelectual da Unicamp
Texto Completo: https://hdl.handle.net/20.500.12733/1666409
Resumo: Abstract: The atomic force microscope (AFM) obtains its topographical information from the short-ranged repulsion resulting from the overlap of electronic shells between tip and hard samples. However, scanning soft samples such as surfactants or biological material within liquid media leads to a very different scenario due to the long-ranged double layer interactions and the specific tip penetration through the scanned layers. We show that AFM images and force vs. distance curves can be used to obtain relevant information on formation, characteristics and behavior of soft self-assembled nanostructures of surfactants, phospholipids and of cells under physiological conditions
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spelling Imaging and characterization of self-assembled soft nanostructures by atomic force microscopyNanoestruturaLipossomosCélulasMicroscopia de força atômicaNanostructuresLiposomesCellsAtomic force microscopySoft nanostructuresArtigo de eventoAbstract: The atomic force microscope (AFM) obtains its topographical information from the short-ranged repulsion resulting from the overlap of electronic shells between tip and hard samples. However, scanning soft samples such as surfactants or biological material within liquid media leads to a very different scenario due to the long-ranged double layer interactions and the specific tip penetration through the scanned layers. We show that AFM images and force vs. distance curves can be used to obtain relevant information on formation, characteristics and behavior of soft self-assembled nanostructures of surfactants, phospholipids and of cells under physiological conditionsFUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESPFechadoChina International Conference on Nanoscience and Technology (09 a 11 de Junho de 2005 : Beijing, China)UNIVERSIDADE ESTADUAL DE CAMPINASTeschke, Omar, 1944-2007info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.12733/1666409TESCHKE, Omar. Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy. Diffusion and defect data. Pt. B, Solid state phenomena. Baech: Scientific.Net, 2007. Vol. 121/123, pt 1/2 (Mar., 2007), p. 829-833. Disponível em: https://hdl.handle.net/20.500.12733/1666409. Acesso em: 24 mai. 2023.Inglêshttps://repositorio.unicamp.br/acervo/detalhe/1219082reponame:Repositório da Produção Científica e Intelectual da Unicampinstname:Universidade Estadual de Campinas (UNICAMP)instacron:UNICAMPinfo:eu-repo/semantics/openAccess2022-08-01T09:48:34Zoai:https://www.repositorio.unicamp.br/:1219082Repositório InstitucionalPUBhttp://repositorio.unicamp.br/oai/requestreposip@unicamp.bropendoar:2022-08-01T09:48:34Repositório da Produção Científica e Intelectual da Unicamp - Universidade Estadual de Campinas (UNICAMP)false
dc.title.none.fl_str_mv Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
title Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
spellingShingle Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
Teschke, Omar, 1944-
Nanoestrutura
Lipossomos
Células
Microscopia de força atômica
Nanostructures
Liposomes
Cells
Atomic force microscopy
Soft nanostructures
Artigo de evento
title_short Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
title_full Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
title_fullStr Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
title_full_unstemmed Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
title_sort Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
author Teschke, Omar, 1944-
author_facet Teschke, Omar, 1944-
author_role author
dc.contributor.none.fl_str_mv China International Conference on Nanoscience and Technology (09 a 11 de Junho de 2005 : Beijing, China)
UNIVERSIDADE ESTADUAL DE CAMPINAS
dc.contributor.author.fl_str_mv Teschke, Omar, 1944-
dc.subject.por.fl_str_mv Nanoestrutura
Lipossomos
Células
Microscopia de força atômica
Nanostructures
Liposomes
Cells
Atomic force microscopy
Soft nanostructures
Artigo de evento
topic Nanoestrutura
Lipossomos
Células
Microscopia de força atômica
Nanostructures
Liposomes
Cells
Atomic force microscopy
Soft nanostructures
Artigo de evento
description Abstract: The atomic force microscope (AFM) obtains its topographical information from the short-ranged repulsion resulting from the overlap of electronic shells between tip and hard samples. However, scanning soft samples such as surfactants or biological material within liquid media leads to a very different scenario due to the long-ranged double layer interactions and the specific tip penetration through the scanned layers. We show that AFM images and force vs. distance curves can be used to obtain relevant information on formation, characteristics and behavior of soft self-assembled nanostructures of surfactants, phospholipids and of cells under physiological conditions
publishDate 2007
dc.date.none.fl_str_mv 2007
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv https://hdl.handle.net/20.500.12733/1666409
TESCHKE, Omar. Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy. Diffusion and defect data. Pt. B, Solid state phenomena. Baech: Scientific.Net, 2007. Vol. 121/123, pt 1/2 (Mar., 2007), p. 829-833. Disponível em: https://hdl.handle.net/20.500.12733/1666409. Acesso em: 24 mai. 2023.
url https://hdl.handle.net/20.500.12733/1666409
identifier_str_mv TESCHKE, Omar. Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy. Diffusion and defect data. Pt. B, Solid state phenomena. Baech: Scientific.Net, 2007. Vol. 121/123, pt 1/2 (Mar., 2007), p. 829-833. Disponível em: https://hdl.handle.net/20.500.12733/1666409. Acesso em: 24 mai. 2023.
dc.language.iso.fl_str_mv Inglês
language_invalid_str_mv Inglês
dc.relation.none.fl_str_mv https://repositorio.unicamp.br/acervo/detalhe/1219082
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório da Produção Científica e Intelectual da Unicamp
instname:Universidade Estadual de Campinas (UNICAMP)
instacron:UNICAMP
instname_str Universidade Estadual de Campinas (UNICAMP)
instacron_str UNICAMP
institution UNICAMP
reponame_str Repositório da Produção Científica e Intelectual da Unicamp
collection Repositório da Produção Científica e Intelectual da Unicamp
repository.name.fl_str_mv Repositório da Produção Científica e Intelectual da Unicamp - Universidade Estadual de Campinas (UNICAMP)
repository.mail.fl_str_mv reposip@unicamp.br
_version_ 1766887312218652672

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