Influence of impurities on the surface morphology of the TlBr crystal semiconductor

Detalhes bibliográficos
Autor(a) principal: SANTOS, ROBINSON A. dos
Data de Publicação: 2014
Outros Autores: SILVA, JULIO B.R. da, MARTINS, JOAO F.T., FERRAZ, CAUE de M., COSTA, FABIO E. da, GENNARI, ROSELI F., MESQUITA, CARLOS H. de, HAMADA, MARGARIDA M., INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/17312
id IPEN_7c126aaca50c7d87d50a626fc1f4b414
oai_identifier_str oai:repositorio.ipen.br:123456789/17312
network_acronym_str IPEN
network_name_str Repositório Institucional do IPEN
repository_id_str 4510
spelling 2014-11-17T18:31:21Z2014-11-18T18:32:08Z2015-04-02T00:36:36Z2014-11-17T18:31:21Z2014-11-18T18:32:08Z2015-04-02T00:36:36ZNovember 24-29, 2013http://repositorio.ipen.br/handle/123456789/17312Made available in DSpace on 2014-11-17T18:31:21Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:32:08Z (GMT). No. of bitstreams: 1 19405.pdf: 1270314 bytes, checksum: a9cafc0bdc19c90aba626294a525ccfa (MD5)Made available in DSpace on 2015-04-02T00:36:36Z (GMT). No. of bitstreams: 1 19405.pdf: 1270314 bytes, checksum: a9cafc0bdc19c90aba626294a525ccfa (MD5)Sao Paulo: ABEN, 2013bridgman methodcrystalsgamma radiationimpuritiesmorphologypurificationscanning electron microscopysemiconductor detectorsstoichiometrysurfacesthallium bromidesx-ray diffractionInfluence of impurities on the surface morphology of the TlBr crystal semiconductorinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINAC; ENAN; ENFIR; ENINIRecife, PESANTOS, ROBINSON A. dosSILVA, JULIO B.R. daMARTINS, JOAO F.T.FERRAZ, CAUE de M.COSTA, FABIO E. daGENNARI, ROSELI F.MESQUITA, CARLOS H. deHAMADA, MARGARIDA M.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rdinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN194052013COSTA, FABIO E. daMESQUITA, CARLOS H. deHAMADA, MARGARIDA M.13-12Proceedings751510848585810792384-111491476SANTOS, ROBINSON A. DOS:7515:240:SSILVA, JULIO B.R. DA:10848:-1:NMARTINS, JOAO F.T.:5858:240:NFERRAZ, CAUE de M.:10792:220:NCOSTA, FABIO E. DA:384:240:NGENNARI, ROSELI F.:-1:-1:NMESQUITA, CARLOS H. de:1149:240:NHAMADA, MARGARIDA M.:1476:240:NORIGINAL19405.pdfapplication/pdf1270314http://repositorio.ipen.br/bitstream/123456789/17312/1/19405.pdfa9cafc0bdc19c90aba626294a525ccfaMD51123456789/173122016-06-15 18:47:38.209oai:repositorio.ipen.br:123456789/17312Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-06-15T18:47:38Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Influence of impurities on the surface morphology of the TlBr crystal semiconductor
title Influence of impurities on the surface morphology of the TlBr crystal semiconductor
spellingShingle Influence of impurities on the surface morphology of the TlBr crystal semiconductor
SANTOS, ROBINSON A. dos
bridgman method
crystals
gamma radiation
impurities
morphology
purification
scanning electron microscopy
semiconductor detectors
stoichiometry
surfaces
thallium bromides
x-ray diffraction
title_short Influence of impurities on the surface morphology of the TlBr crystal semiconductor
title_full Influence of impurities on the surface morphology of the TlBr crystal semiconductor
title_fullStr Influence of impurities on the surface morphology of the TlBr crystal semiconductor
title_full_unstemmed Influence of impurities on the surface morphology of the TlBr crystal semiconductor
title_sort Influence of impurities on the surface morphology of the TlBr crystal semiconductor
author SANTOS, ROBINSON A. dos
author_facet SANTOS, ROBINSON A. dos
SILVA, JULIO B.R. da
MARTINS, JOAO F.T.
FERRAZ, CAUE de M.
COSTA, FABIO E. da
GENNARI, ROSELI F.
MESQUITA, CARLOS H. de
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd
author_role author
author2 SILVA, JULIO B.R. da
MARTINS, JOAO F.T.
FERRAZ, CAUE de M.
COSTA, FABIO E. da
GENNARI, ROSELI F.
MESQUITA, CARLOS H. de
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd
author2_role author
author
author
author
author
author
author
author
dc.contributor.author.fl_str_mv SANTOS, ROBINSON A. dos
SILVA, JULIO B.R. da
MARTINS, JOAO F.T.
FERRAZ, CAUE de M.
COSTA, FABIO E. da
GENNARI, ROSELI F.
MESQUITA, CARLOS H. de
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd
dc.subject.por.fl_str_mv bridgman method
crystals
gamma radiation
impurities
morphology
purification
scanning electron microscopy
semiconductor detectors
stoichiometry
surfaces
thallium bromides
x-ray diffraction
topic bridgman method
crystals
gamma radiation
impurities
morphology
purification
scanning electron microscopy
semiconductor detectors
stoichiometry
surfaces
thallium bromides
x-ray diffraction
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv November 24-29, 2013
dc.date.accessioned.fl_str_mv 2014-11-17T18:31:21Z
2014-11-18T18:32:08Z
2015-04-02T00:36:36Z
dc.date.available.fl_str_mv 2014-11-17T18:31:21Z
2014-11-18T18:32:08Z
2015-04-02T00:36:36Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/17312
url http://repositorio.ipen.br/handle/123456789/17312
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Sao Paulo: ABEN, 2013
publisher.none.fl_str_mv Sao Paulo: ABEN, 2013
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron:IPEN
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN
institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
bitstream.url.fl_str_mv http://repositorio.ipen.br/bitstream/123456789/17312/1/19405.pdf
bitstream.checksum.fl_str_mv a9cafc0bdc19c90aba626294a525ccfa
bitstream.checksumAlgorithm.fl_str_mv MD5
repository.name.fl_str_mv Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)
repository.mail.fl_str_mv bibl@ipen.br
_version_ 1767254214748143616

Registros relacionados