Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method

Detalhes bibliográficos
Autor(a) principal: SANTOS, ROBINSON A. dos
Data de Publicação: 2014
Outros Autores: COSTA, FABIO E. da, MARTINS, JOAO F.T., HAMADA, MARGARIDA M., INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/16610
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spelling 2014-11-17T18:19:55Z2014-11-18T18:27:33Z2015-04-02T05:04:23Z2014-11-17T18:19:55Z2014-11-18T18:27:33Z2015-04-02T05:04:23ZSeptember 27 - October 2, 2009http://repositorio.ipen.br/handle/123456789/16610Made available in DSpace on 2014-11-17T18:19:55Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:27:33Z (GMT). No. of bitstreams: 1 15264.pdf: 749484 bytes, checksum: 9bc34bb723bcb85f87868ed9dd9471b2 (MD5)Made available in DSpace on 2015-04-02T05:04:23Z (GMT). No. of bitstreams: 1 15264.pdf: 749484 bytes, checksum: 9bc34bb723bcb85f87868ed9dd9471b2 (MD5)Sao Paulo: ABEN, 2009bridgman methodcrystal growthdefectsefficiencyelectric conductivityenergy resolutionexperimental dataimpuritiesperformancesemiconductor detectorsthallium bromidesx-ray diffractionPerformance of thallium bromide semiconductor detectors produced by repeated Bridgman methodinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINAC; ENAN; ENFIR; ENINIRio de Janeiro, RJSANTOS, ROBINSON A. dosCOSTA, FABIO E. daMARTINS, JOAO F.T.HAMADA, MARGARIDA M.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1stinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN152642009COSTA, FABIO E. daHAMADA, MARGARIDA M.09-10Proceedings751538458581476SANTOS, ROBINSON A. DOS:7515:220:SCOSTA, FABIO E. DA:384:240:NMARTINS, JOAO F.T.:5858:220:NHAMADA, MARGARIDA M.:1476:240:NORIGINAL15264.pdfapplication/pdf749484http://repositorio.ipen.br/bitstream/123456789/16610/1/15264.pdf9bc34bb723bcb85f87868ed9dd9471b2MD51123456789/166102016-05-31 22:20:36.016oai:repositorio.ipen.br:123456789/16610Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-05-31T22:20:36Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
title Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
spellingShingle Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
SANTOS, ROBINSON A. dos
bridgman method
crystal growth
defects
efficiency
electric conductivity
energy resolution
experimental data
impurities
performance
semiconductor detectors
thallium bromides
x-ray diffraction
title_short Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
title_full Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
title_fullStr Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
title_full_unstemmed Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
title_sort Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
author SANTOS, ROBINSON A. dos
author_facet SANTOS, ROBINSON A. dos
COSTA, FABIO E. da
MARTINS, JOAO F.T.
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
author_role author
author2 COSTA, FABIO E. da
MARTINS, JOAO F.T.
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
author2_role author
author
author
author
dc.contributor.author.fl_str_mv SANTOS, ROBINSON A. dos
COSTA, FABIO E. da
MARTINS, JOAO F.T.
HAMADA, MARGARIDA M.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
dc.subject.por.fl_str_mv bridgman method
crystal growth
defects
efficiency
electric conductivity
energy resolution
experimental data
impurities
performance
semiconductor detectors
thallium bromides
x-ray diffraction
topic bridgman method
crystal growth
defects
efficiency
electric conductivity
energy resolution
experimental data
impurities
performance
semiconductor detectors
thallium bromides
x-ray diffraction
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv September 27 - October 2, 2009
dc.date.accessioned.fl_str_mv 2014-11-17T18:19:55Z
2014-11-18T18:27:33Z
2015-04-02T05:04:23Z
dc.date.available.fl_str_mv 2014-11-17T18:19:55Z
2014-11-18T18:27:33Z
2015-04-02T05:04:23Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
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dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/16610
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dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Sao Paulo: ABEN, 2009
publisher.none.fl_str_mv Sao Paulo: ABEN, 2009
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
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reponame_str Repositório Institucional do IPEN
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