Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
Autor(a) principal: | |
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Data de Publicação: | 2014 |
Outros Autores: | , , , |
Tipo de documento: | Artigo de conferência |
Título da fonte: | Repositório Institucional do IPEN |
Texto Completo: | http://repositorio.ipen.br/handle/123456789/16610 |
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2014-11-17T18:19:55Z2014-11-18T18:27:33Z2015-04-02T05:04:23Z2014-11-17T18:19:55Z2014-11-18T18:27:33Z2015-04-02T05:04:23ZSeptember 27 - October 2, 2009http://repositorio.ipen.br/handle/123456789/16610Made available in DSpace on 2014-11-17T18:19:55Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:27:33Z (GMT). No. of bitstreams: 1 15264.pdf: 749484 bytes, checksum: 9bc34bb723bcb85f87868ed9dd9471b2 (MD5)Made available in DSpace on 2015-04-02T05:04:23Z (GMT). No. of bitstreams: 1 15264.pdf: 749484 bytes, checksum: 9bc34bb723bcb85f87868ed9dd9471b2 (MD5)Sao Paulo: ABEN, 2009bridgman methodcrystal growthdefectsefficiencyelectric conductivityenergy resolutionexperimental dataimpuritiesperformancesemiconductor detectorsthallium bromidesx-ray diffractionPerformance of thallium bromide semiconductor detectors produced by repeated Bridgman methodinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINAC; ENAN; ENFIR; ENINIRio de Janeiro, RJSANTOS, ROBINSON A. dosCOSTA, FABIO E. daMARTINS, JOAO F.T.HAMADA, MARGARIDA M.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1stinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN152642009COSTA, FABIO E. daHAMADA, MARGARIDA M.09-10Proceedings751538458581476SANTOS, ROBINSON A. DOS:7515:220:SCOSTA, FABIO E. DA:384:240:NMARTINS, JOAO F.T.:5858:220:NHAMADA, MARGARIDA M.:1476:240:NORIGINAL15264.pdfapplication/pdf749484http://repositorio.ipen.br/bitstream/123456789/16610/1/15264.pdf9bc34bb723bcb85f87868ed9dd9471b2MD51123456789/166102016-05-31 22:20:36.016oai:repositorio.ipen.br:123456789/16610Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-05-31T22:20:36Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false |
dc.title.pt_BR.fl_str_mv |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
title |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
spellingShingle |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method SANTOS, ROBINSON A. dos bridgman method crystal growth defects efficiency electric conductivity energy resolution experimental data impurities performance semiconductor detectors thallium bromides x-ray diffraction |
title_short |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
title_full |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
title_fullStr |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
title_full_unstemmed |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
title_sort |
Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method |
author |
SANTOS, ROBINSON A. dos |
author_facet |
SANTOS, ROBINSON A. dos COSTA, FABIO E. da MARTINS, JOAO F.T. HAMADA, MARGARIDA M. INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st |
author_role |
author |
author2 |
COSTA, FABIO E. da MARTINS, JOAO F.T. HAMADA, MARGARIDA M. INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st |
author2_role |
author author author author |
dc.contributor.author.fl_str_mv |
SANTOS, ROBINSON A. dos COSTA, FABIO E. da MARTINS, JOAO F.T. HAMADA, MARGARIDA M. INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st |
dc.subject.por.fl_str_mv |
bridgman method crystal growth defects efficiency electric conductivity energy resolution experimental data impurities performance semiconductor detectors thallium bromides x-ray diffraction |
topic |
bridgman method crystal growth defects efficiency electric conductivity energy resolution experimental data impurities performance semiconductor detectors thallium bromides x-ray diffraction |
publishDate |
2014 |
dc.date.evento.pt_BR.fl_str_mv |
September 27 - October 2, 2009 |
dc.date.accessioned.fl_str_mv |
2014-11-17T18:19:55Z 2014-11-18T18:27:33Z 2015-04-02T05:04:23Z |
dc.date.available.fl_str_mv |
2014-11-17T18:19:55Z 2014-11-18T18:27:33Z 2015-04-02T05:04:23Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://repositorio.ipen.br/handle/123456789/16610 |
url |
http://repositorio.ipen.br/handle/123456789/16610 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.coverage.pt_BR.fl_str_mv |
I |
dc.publisher.none.fl_str_mv |
Sao Paulo: ABEN, 2009 |
publisher.none.fl_str_mv |
Sao Paulo: ABEN, 2009 |
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reponame:Repositório Institucional do IPEN instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN) instacron:IPEN |
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Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
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IPEN |
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Repositório Institucional do IPEN |
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Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
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