Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples

Detalhes bibliográficos
Autor(a) principal: Ventura, P. J.
Data de Publicação: 1997
Outros Autores: Cerqueira, M. F., Carmo, M. C., Ferreira, J. A.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/14201
Resumo: Microcrystalline and Porous on Microcrystalline Silicon thin films were produced. The photoluminescence characteristics of Porous on Microcrystalline Silicon were studied and compared with those from Microcrystalline and Porous Silicon grown on Silicon wafers. Under steady state it is possible to excite these samples with visible light at room temperature. This excitation gives rise to a red photoluminescence band, which is similar to that of Porous Silicon excited under the same conditions. MicroRaman and transmission spectroscopy shows that the Porous Silicon layer was produced below the Microcrystalline Silicon thin film that acts as a shield for excitation and emission of radiation with wavelength smaller than 500 nm. Sample thickness, crystallite size and crystallinity are determined. The results are discussed in terms of the theoretical framework based in the fluctuating quantum wire model for Porous Silicon.
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spelling Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samplesPhotoluminescencePropertiesPorous siliconMicrocrystalline siliconScience & TechnologyMicrocrystalline and Porous on Microcrystalline Silicon thin films were produced. The photoluminescence characteristics of Porous on Microcrystalline Silicon were studied and compared with those from Microcrystalline and Porous Silicon grown on Silicon wafers. Under steady state it is possible to excite these samples with visible light at room temperature. This excitation gives rise to a red photoluminescence band, which is similar to that of Porous Silicon excited under the same conditions. MicroRaman and transmission spectroscopy shows that the Porous Silicon layer was produced below the Microcrystalline Silicon thin film that acts as a shield for excitation and emission of radiation with wavelength smaller than 500 nm. Sample thickness, crystallite size and crystallinity are determined. The results are discussed in terms of the theoretical framework based in the fluctuating quantum wire model for Porous Silicon.FCT-Praxis XXIElsevierUniversidade do MinhoVentura, P. J.Cerqueira, M. F.Carmo, M. C.Ferreira, J. A.19971997-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/14201eng0040-609010.1016/S0040-6090(96)09337-6http://www.sciencedirect.com/science/article/pii/S0040609096093376info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:39:54ZPortal AgregadorONG
dc.title.none.fl_str_mv Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
title Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
spellingShingle Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
Ventura, P. J.
Photoluminescence
Properties
Porous silicon
Microcrystalline silicon
Science & Technology
title_short Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
title_full Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
title_fullStr Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
title_full_unstemmed Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
title_sort Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples
author Ventura, P. J.
author_facet Ventura, P. J.
Cerqueira, M. F.
Carmo, M. C.
Ferreira, J. A.
author_role author
author2 Cerqueira, M. F.
Carmo, M. C.
Ferreira, J. A.
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Ventura, P. J.
Cerqueira, M. F.
Carmo, M. C.
Ferreira, J. A.
dc.subject.por.fl_str_mv Photoluminescence
Properties
Porous silicon
Microcrystalline silicon
Science & Technology
topic Photoluminescence
Properties
Porous silicon
Microcrystalline silicon
Science & Technology
description Microcrystalline and Porous on Microcrystalline Silicon thin films were produced. The photoluminescence characteristics of Porous on Microcrystalline Silicon were studied and compared with those from Microcrystalline and Porous Silicon grown on Silicon wafers. Under steady state it is possible to excite these samples with visible light at room temperature. This excitation gives rise to a red photoluminescence band, which is similar to that of Porous Silicon excited under the same conditions. MicroRaman and transmission spectroscopy shows that the Porous Silicon layer was produced below the Microcrystalline Silicon thin film that acts as a shield for excitation and emission of radiation with wavelength smaller than 500 nm. Sample thickness, crystallite size and crystallinity are determined. The results are discussed in terms of the theoretical framework based in the fluctuating quantum wire model for Porous Silicon.
publishDate 1997
dc.date.none.fl_str_mv 1997
1997-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/14201
url http://hdl.handle.net/1822/14201
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 0040-6090
10.1016/S0040-6090(96)09337-6
http://www.sciencedirect.com/science/article/pii/S0040609096093376
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
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