Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

Detalhes bibliográficos
Autor(a) principal: Pereira, Marcelo Barbalho
Data de Publicação: 2011
Outros Autores: Barreto, Bruno Jacques, Horowitz, Flavio
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/107245
id UFRGS-2_6d4edff799ae58e16d39f49e44e8bde0
oai_identifier_str oai:www.lume.ufrgs.br:10183/107245
network_acronym_str UFRGS-2
network_name_str Repositório Institucional da UFRGS
repository_id_str
spelling Pereira, Marcelo BarbalhoBarreto, Bruno JacquesHorowitz, FlavioOptical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)2014-11-21T02:14:59Z20111559-128Xhttp://hdl.handle.net/10183/107245000825223application/pdfengApplied optics (2004). Washington, DCFilmes finosPropriedades óticasPolarimetriaSpectral polarimetry technique as a complementary tool to ellipsometry of dielectric filmsEstrangeiroinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000825223.pdf000825223.pdfTexto completo (inglês)application/pdf277412http://www.lume.ufrgs.br/bitstream/10183/107245/1/000825223.pdf8fc0572a437ee11042e4e9faa9921860MD51TEXT000825223.pdf.txt000825223.pdf.txtExtracted Texttext/plain15316http://www.lume.ufrgs.br/bitstream/10183/107245/2/000825223.pdf.txtb1606ca9fdec89e9cba0d5498529b040MD52THUMBNAIL000825223.pdf.jpg000825223.pdf.jpgGenerated Thumbnailimage/jpeg1933http://www.lume.ufrgs.br/bitstream/10183/107245/3/000825223.pdf.jpg6bf42cebe49740b2d8c188bc17ef5c84MD5310183/1072452023-03-19 03:34:26.632216oai:www.lume.ufrgs.br:10183/107245Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-03-19T06:34:26Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
title Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
spellingShingle Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
Pereira, Marcelo Barbalho
Filmes finos
Propriedades óticas
Polarimetria
title_short Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
title_full Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
title_fullStr Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
title_full_unstemmed Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
title_sort Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films
author Pereira, Marcelo Barbalho
author_facet Pereira, Marcelo Barbalho
Barreto, Bruno Jacques
Horowitz, Flavio
author_role author
author2 Barreto, Bruno Jacques
Horowitz, Flavio
author2_role author
author
dc.contributor.event.pt_BR.fl_str_mv Optical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)
dc.contributor.author.fl_str_mv Pereira, Marcelo Barbalho
Barreto, Bruno Jacques
Horowitz, Flavio
dc.subject.por.fl_str_mv Filmes finos
Propriedades óticas
Polarimetria
topic Filmes finos
Propriedades óticas
Polarimetria
publishDate 2011
dc.date.issued.fl_str_mv 2011
dc.date.accessioned.fl_str_mv 2014-11-21T02:14:59Z
dc.type.driver.fl_str_mv Estrangeiro
info:eu-repo/semantics/conferenceObject
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/107245
dc.identifier.issn.pt_BR.fl_str_mv 1559-128X
dc.identifier.nrb.pt_BR.fl_str_mv 000825223
identifier_str_mv 1559-128X
000825223
url http://hdl.handle.net/10183/107245
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Applied optics (2004). Washington, DC
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRGS
instname:Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS
instname_str Universidade Federal do Rio Grande do Sul (UFRGS)
instacron_str UFRGS
institution UFRGS
reponame_str Repositório Institucional da UFRGS
collection Repositório Institucional da UFRGS
bitstream.url.fl_str_mv http://www.lume.ufrgs.br/bitstream/10183/107245/1/000825223.pdf
http://www.lume.ufrgs.br/bitstream/10183/107245/2/000825223.pdf.txt
http://www.lume.ufrgs.br/bitstream/10183/107245/3/000825223.pdf.jpg
bitstream.checksum.fl_str_mv 8fc0572a437ee11042e4e9faa9921860
b1606ca9fdec89e9cba0d5498529b040
6bf42cebe49740b2d8c188bc17ef5c84
bitstream.checksumAlgorithm.fl_str_mv MD5
MD5
MD5
repository.name.fl_str_mv Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)
repository.mail.fl_str_mv
_version_ 1801224857284771840

Registros relacionados