Interferometric monitoring of dip coating

Detalhes bibliográficos
Autor(a) principal: Michels, Alexandre Fassini
Data de Publicação: 2004
Outros Autores: Menegotto, Thiago, Horowitz, Flavio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/107159
Resumo: Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t 1 2, in accordance with a simple model. Comparison with measured results with an uncertainty of 0.007 m showed good agreement after the initial steps of the process had been completed.
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spelling Michels, Alexandre FassiniMenegotto, ThiagoHorowitz, Flavio2014-11-20T02:14:45Z20041559-128Xhttp://hdl.handle.net/10183/107159000400820Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t 1 2, in accordance with a simple model. Comparison with measured results with an uncertainty of 0.007 m showed good agreement after the initial steps of the process had been completed.application/pdfengApplied optics (2004). Washington, DC. Vol. 43, no. 4 (Feb. 2004), p. 820-823Interferometria luminosaFilmes oticosViscosidadePolarimetriaInterferometric monitoring of dip coatingEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000400820.pdf000400820.pdfTexto completo (inglês)application/pdf124116http://www.lume.ufrgs.br/bitstream/10183/107159/1/000400820.pdff345da9815f288a19c729ada9d5b4e8cMD51TEXT000400820.pdf.txt000400820.pdf.txtExtracted Texttext/plain12560http://www.lume.ufrgs.br/bitstream/10183/107159/2/000400820.pdf.txta67106ada8ec719ee5d947ad12bf204cMD52THUMBNAIL000400820.pdf.jpg000400820.pdf.jpgGenerated Thumbnailimage/jpeg1829http://www.lume.ufrgs.br/bitstream/10183/107159/3/000400820.pdf.jpg28c3f48f283ad228e835a8a23289b389MD5310183/1071592023-03-19 03:34:23.038474oai:www.lume.ufrgs.br:10183/107159Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-03-19T06:34:23Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Interferometric monitoring of dip coating
title Interferometric monitoring of dip coating
spellingShingle Interferometric monitoring of dip coating
Michels, Alexandre Fassini
Interferometria luminosa
Filmes oticos
Viscosidade
Polarimetria
title_short Interferometric monitoring of dip coating
title_full Interferometric monitoring of dip coating
title_fullStr Interferometric monitoring of dip coating
title_full_unstemmed Interferometric monitoring of dip coating
title_sort Interferometric monitoring of dip coating
author Michels, Alexandre Fassini
author_facet Michels, Alexandre Fassini
Menegotto, Thiago
Horowitz, Flavio
author_role author
author2 Menegotto, Thiago
Horowitz, Flavio
author2_role author
author
dc.contributor.author.fl_str_mv Michels, Alexandre Fassini
Menegotto, Thiago
Horowitz, Flavio
dc.subject.por.fl_str_mv Interferometria luminosa
Filmes oticos
Viscosidade
Polarimetria
topic Interferometria luminosa
Filmes oticos
Viscosidade
Polarimetria
description Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t 1 2, in accordance with a simple model. Comparison with measured results with an uncertainty of 0.007 m showed good agreement after the initial steps of the process had been completed.
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dc.date.issued.fl_str_mv 2004
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dc.language.iso.fl_str_mv eng
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dc.relation.ispartof.pt_BR.fl_str_mv Applied optics (2004). Washington, DC. Vol. 43, no. 4 (Feb. 2004), p. 820-823
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