Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route

Detalhes bibliográficos
Autor(a) principal: Zhao,Chengyun
Data de Publicação: 2016
Outros Autores: Huang,Wei, Liu,Xianguo, Or,Siu Wing, Cui,Caiyun
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Materials research (São Carlos. Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149
Resumo: NiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model.
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spelling Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution RouteNanosheetsFerritesTransmission electron microscopyMicrowave absorbing materialsNiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model.ABM, ABC, ABPol2016-10-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149Materials Research v.19 n.5 2016reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/1980-5373-MR-2015-0581info:eu-repo/semantics/openAccessZhao,ChengyunHuang,WeiLiu,XianguoOr,Siu WingCui,Caiyuneng2016-09-27T00:00:00Zoai:scielo:S1516-14392016000501149Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2016-09-27T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false
dc.title.none.fl_str_mv Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
title Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
spellingShingle Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
Zhao,Chengyun
Nanosheets
Ferrites
Transmission electron microscopy
Microwave absorbing materials
title_short Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
title_full Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
title_fullStr Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
title_full_unstemmed Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
title_sort Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
author Zhao,Chengyun
author_facet Zhao,Chengyun
Huang,Wei
Liu,Xianguo
Or,Siu Wing
Cui,Caiyun
author_role author
author2 Huang,Wei
Liu,Xianguo
Or,Siu Wing
Cui,Caiyun
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Zhao,Chengyun
Huang,Wei
Liu,Xianguo
Or,Siu Wing
Cui,Caiyun
dc.subject.por.fl_str_mv Nanosheets
Ferrites
Transmission electron microscopy
Microwave absorbing materials
topic Nanosheets
Ferrites
Transmission electron microscopy
Microwave absorbing materials
description NiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model.
publishDate 2016
dc.date.none.fl_str_mv 2016-10-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/1980-5373-MR-2015-0581
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv ABM, ABC, ABPol
publisher.none.fl_str_mv ABM, ABC, ABPol
dc.source.none.fl_str_mv Materials Research v.19 n.5 2016
reponame:Materials research (São Carlos. Online)
instname:Universidade Federal de São Carlos (UFSCAR)
instacron:ABM ABC ABPOL
instname_str Universidade Federal de São Carlos (UFSCAR)
instacron_str ABM ABC ABPOL
institution ABM ABC ABPOL
reponame_str Materials research (São Carlos. Online)
collection Materials research (São Carlos. Online)
repository.name.fl_str_mv Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)
repository.mail.fl_str_mv dedz@power.ufscar.br
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