Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route
Autor(a) principal: | |
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Data de Publicação: | 2016 |
Outros Autores: | , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Materials research (São Carlos. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149 |
Resumo: | NiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model. |
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Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution RouteNanosheetsFerritesTransmission electron microscopyMicrowave absorbing materialsNiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model.ABM, ABC, ABPol2016-10-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149Materials Research v.19 n.5 2016reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/1980-5373-MR-2015-0581info:eu-repo/semantics/openAccessZhao,ChengyunHuang,WeiLiu,XianguoOr,Siu WingCui,Caiyuneng2016-09-27T00:00:00Zoai:scielo:S1516-14392016000501149Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2016-09-27T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false |
dc.title.none.fl_str_mv |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
title |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
spellingShingle |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route Zhao,Chengyun Nanosheets Ferrites Transmission electron microscopy Microwave absorbing materials |
title_short |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
title_full |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
title_fullStr |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
title_full_unstemmed |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
title_sort |
Microwave Absorbing Properties of NiFe2O4 Nanosheets Synthesized Via a Simple Surfactant-Assisted Solution Route |
author |
Zhao,Chengyun |
author_facet |
Zhao,Chengyun Huang,Wei Liu,Xianguo Or,Siu Wing Cui,Caiyun |
author_role |
author |
author2 |
Huang,Wei Liu,Xianguo Or,Siu Wing Cui,Caiyun |
author2_role |
author author author author |
dc.contributor.author.fl_str_mv |
Zhao,Chengyun Huang,Wei Liu,Xianguo Or,Siu Wing Cui,Caiyun |
dc.subject.por.fl_str_mv |
Nanosheets Ferrites Transmission electron microscopy Microwave absorbing materials |
topic |
Nanosheets Ferrites Transmission electron microscopy Microwave absorbing materials |
description |
NiFe2O4 nanosheets have been synthesized via a simple surfactant-assisted solution route, which are confirmed by X-ray powder diffraction, scanning electron microscopy and transmission electron microscopy. The NiFe2O4 sample exhibits the sheet-like structure, with width varying from 200 to 800 nm and thickness ranging from 20 to 60 nm. The electromagnetic properties of NiFe2O4 nanosheets-paraffin composites have been deeply investigated. The multiple dielectric relaxation loss in NiFe2O4 nanosheets is attributed to the size distribution and morphology of the NiFe2O4 nanosheets. The magnetic loss in the present system is caused mainly by the natural resonance. An absorber with a thickness of 4.3 mm exhibits an optimal reflection loss (RL) value of -47.1 dB at 7.67 GHz. RL values exceeding -20 dB in the 2.68-17.96 GHz range are obtained by choosing an appropriate absorption-layer thickness between 1.9 and 10 mm. Not only the RL peak frequency but also the number of the peaks can be well explained by the quarter-wavelength cancellation model. |
publishDate |
2016 |
dc.date.none.fl_str_mv |
2016-10-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000501149 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/1980-5373-MR-2015-0581 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
ABM, ABC, ABPol |
publisher.none.fl_str_mv |
ABM, ABC, ABPol |
dc.source.none.fl_str_mv |
Materials Research v.19 n.5 2016 reponame:Materials research (São Carlos. Online) instname:Universidade Federal de São Carlos (UFSCAR) instacron:ABM ABC ABPOL |
instname_str |
Universidade Federal de São Carlos (UFSCAR) |
instacron_str |
ABM ABC ABPOL |
institution |
ABM ABC ABPOL |
reponame_str |
Materials research (São Carlos. Online) |
collection |
Materials research (São Carlos. Online) |
repository.name.fl_str_mv |
Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR) |
repository.mail.fl_str_mv |
dedz@power.ufscar.br |
_version_ |
1754212668401516544 |