Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor
Autor(a) principal: | |
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Data de Publicação: | 2003 |
Outros Autores: | , , , |
Tipo de documento: | Artigo |
Idioma: | spa |
Título da fonte: | Materials research (São Carlos. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392003000400015 |
Resumo: | Gas sensors based in semiconductor oxides show a change in the resistance when they are exposed to certain gaseous atmospheres. In this paper, the influence on the sensor electrical resistance with the film thickness in vacuum and air are studied. The conduction process is analyzed considering the existence of Schottky potential barriers at the grain boundaries. These barriers are affected by the intergranular gas diffusion. This process increases the barrier height and width, altering the electrical resistance. Also, the influence of the diffusion process on the stabilization time is analized. |
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Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesorSnO2conduction mechanismsairGas sensors based in semiconductor oxides show a change in the resistance when they are exposed to certain gaseous atmospheres. In this paper, the influence on the sensor electrical resistance with the film thickness in vacuum and air are studied. The conduction process is analyzed considering the existence of Schottky potential barriers at the grain boundaries. These barriers are affected by the intergranular gas diffusion. This process increases the barrier height and width, altering the electrical resistance. Also, the influence of the diffusion process on the stabilization time is analized.ABM, ABC, ABPol2003-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392003000400015Materials Research v.6 n.4 2003reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/S1516-14392003000400015info:eu-repo/semantics/openAccessPonce,Miguel AdolfoCastro,Miriam SusanaMoncada,Osvaldo JulioEcheverría,Maria DoloresAldao,Celso Manuelspa2004-01-19T00:00:00Zoai:scielo:S1516-14392003000400015Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2004-01-19T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false |
dc.title.none.fl_str_mv |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
title |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
spellingShingle |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor Ponce,Miguel Adolfo SnO2 conduction mechanisms air |
title_short |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
title_full |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
title_fullStr |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
title_full_unstemmed |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
title_sort |
Efectos de la exposición a vacío y aire de películas de SnO2 con distinto espesor |
author |
Ponce,Miguel Adolfo |
author_facet |
Ponce,Miguel Adolfo Castro,Miriam Susana Moncada,Osvaldo Julio Echeverría,Maria Dolores Aldao,Celso Manuel |
author_role |
author |
author2 |
Castro,Miriam Susana Moncada,Osvaldo Julio Echeverría,Maria Dolores Aldao,Celso Manuel |
author2_role |
author author author author |
dc.contributor.author.fl_str_mv |
Ponce,Miguel Adolfo Castro,Miriam Susana Moncada,Osvaldo Julio Echeverría,Maria Dolores Aldao,Celso Manuel |
dc.subject.por.fl_str_mv |
SnO2 conduction mechanisms air |
topic |
SnO2 conduction mechanisms air |
description |
Gas sensors based in semiconductor oxides show a change in the resistance when they are exposed to certain gaseous atmospheres. In this paper, the influence on the sensor electrical resistance with the film thickness in vacuum and air are studied. The conduction process is analyzed considering the existence of Schottky potential barriers at the grain boundaries. These barriers are affected by the intergranular gas diffusion. This process increases the barrier height and width, altering the electrical resistance. Also, the influence of the diffusion process on the stabilization time is analized. |
publishDate |
2003 |
dc.date.none.fl_str_mv |
2003-12-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392003000400015 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392003000400015 |
dc.language.iso.fl_str_mv |
spa |
language |
spa |
dc.relation.none.fl_str_mv |
10.1590/S1516-14392003000400015 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
ABM, ABC, ABPol |
publisher.none.fl_str_mv |
ABM, ABC, ABPol |
dc.source.none.fl_str_mv |
Materials Research v.6 n.4 2003 reponame:Materials research (São Carlos. Online) instname:Universidade Federal de São Carlos (UFSCAR) instacron:ABM ABC ABPOL |
instname_str |
Universidade Federal de São Carlos (UFSCAR) |
instacron_str |
ABM ABC ABPOL |
institution |
ABM ABC ABPOL |
reponame_str |
Materials research (São Carlos. Online) |
collection |
Materials research (São Carlos. Online) |
repository.name.fl_str_mv |
Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR) |
repository.mail.fl_str_mv |
dedz@power.ufscar.br |
_version_ |
1754212657387274240 |