APA Citation

SPEJO, L. B. (2020). Stress characterization of strained silicon nanostructures by Raman spectroscopy.

Chicago Style Citation

SPEJO, LUCAS BARROSO. Stress Characterization of Strained Silicon Nanostructures By Raman Spectroscopy. 2020.

MLA Citation

SPEJO, LUCAS BARROSO. Stress Characterization of Strained Silicon Nanostructures By Raman Spectroscopy. 2020.

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