Stress characterization of strained silicon nanostructures by Raman spectroscopy

Detalhes bibliográficos
Autor(a) principal: LUCAS BARROSO SPEJO
Data de Publicação: 2020
Tipo de documento: Dissertação
Título da fonte: Portal de Dados Abertos da CAPES
Texto Completo: https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9849863
id BRCRIS_b8811d091e8b1bd5773d5dda412846a1
network_acronym_str CAPES
network_name_str Portal de Dados Abertos da CAPES
dc.title.pt-BR.fl_str_mv Stress characterization of strained silicon nanostructures by Raman spectroscopy
title Stress characterization of strained silicon nanostructures by Raman spectroscopy
spellingShingle Stress characterization of strained silicon nanostructures by Raman spectroscopy
silício
silicon
LUCAS BARROSO SPEJO
title_short Stress characterization of strained silicon nanostructures by Raman spectroscopy
title_full Stress characterization of strained silicon nanostructures by Raman spectroscopy
title_fullStr Stress characterization of strained silicon nanostructures by Raman spectroscopy
Stress characterization of strained silicon nanostructures by Raman spectroscopy
title_full_unstemmed Stress characterization of strained silicon nanostructures by Raman spectroscopy
Stress characterization of strained silicon nanostructures by Raman spectroscopy
title_sort Stress characterization of strained silicon nanostructures by Raman spectroscopy
topic silício
silicon
publishDate 2020
format masterThesis
url https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9849863
author_role author
author LUCAS BARROSO SPEJO
author_facet LUCAS BARROSO SPEJO
dc.contributor.authorLattes.fl_str_mv http://lattes.cnpq.br/0260941548047846
dc.contributor.advisor1.fl_str_mv JOSE ALEXANDRE DINIZ
dc.contributor.advisor1Lattes.fl_str_mv http://lattes.cnpq.br/1237244904128562
dc.publisher.none.fl_str_mv UNIVERSIDADE ESTADUAL DE CAMPINAS
publisher.none.fl_str_mv UNIVERSIDADE ESTADUAL DE CAMPINAS
instname_str UNIVERSIDADE ESTADUAL DE CAMPINAS
dc.publisher.program.fl_str_mv ENGENHARIA ELÉTRICA
dc.description.course.none.fl_txt_mv ENGENHARIA ELÉTRICA
reponame_str Portal de Dados Abertos da CAPES
collection Portal de Dados Abertos da CAPES
spelling CAPESPortal de Dados Abertos da CAPESStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopyStress characterization of strained silicon nanostructures by Raman spectroscopysilício2020masterThesishttps://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9849863authorLUCAS BARROSO SPEJOhttp://lattes.cnpq.br/0260941548047846JOSE ALEXANDRE DINIZhttp://lattes.cnpq.br/1237244904128562UNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASENGENHARIA ELÉTRICAENGENHARIA ELÉTRICAPortal de Dados Abertos da CAPESPortal de Dados Abertos da CAPES
identifier_str_mv SPEJO, LUCAS BARROSO. Stress characterization of strained silicon nanostructures by Raman spectroscopy. 2020. Tese.
dc.identifier.citation.fl_str_mv SPEJO, LUCAS BARROSO. Stress characterization of strained silicon nanostructures by Raman spectroscopy. 2020. Tese.
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