Ionizing radiation effects in a rectifier circuit

Detalhes bibliográficos
Autor(a) principal: Boas A.C.V.
Data de Publicação: 2019
Outros Autores: Guazzelli M.A., Giacomini R.C., Medina N.H.
Título da fonte: Biblioteca Digital de Teses e Dissertações da FEI
Texto Completo: https://repositorio.fei.edu.br/handle/FEI/1263
Resumo: © Published under licence by IOP Publishing Ltd.This work aims to study the effects of ionizing radiation on a half-wave rectifier circuit. The diodes of the circuit, rectifier and Zener, were exposed to X-rays of 10 keV of effective energy. The characteristic curves of both diodes were evaluated before and after being subjected to cumulative total ionizing dose (TID) effects. The accumulation of charges in the dielectric structures of the diodes alter their individual functionalities, but the changes verified in the rectification were irrelevant. In this study, three irradiation methods were used to correlate the physical mechanisms responsible for the effects caused by radiation with variations in the electrical parameters of the devices and the efficiency of the rectifier circuit.
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spelling Boas A.C.V.Guazzelli M.A.Giacomini R.C.Medina N.H.2019-08-19T23:45:24Z2019-08-19T23:45:24Z2019BÔAS, A C V; GUAZZELLI, M A; GIACOMINI, R C; MEDINA, N H. Ionizing radiation effects in a rectifier circuit. JOURNAL OF PHYSICS. CONFERENCE SERIES (PRINT), v. 1291, p. 012019, 2019.1742-6596https://repositorio.fei.edu.br/handle/FEI/126310.1088/1742-6596/1291/1/012019© Published under licence by IOP Publishing Ltd.This work aims to study the effects of ionizing radiation on a half-wave rectifier circuit. The diodes of the circuit, rectifier and Zener, were exposed to X-rays of 10 keV of effective energy. The characteristic curves of both diodes were evaluated before and after being subjected to cumulative total ionizing dose (TID) effects. The accumulation of charges in the dielectric structures of the diodes alter their individual functionalities, but the changes verified in the rectification were irrelevant. In this study, three irradiation methods were used to correlate the physical mechanisms responsible for the effects caused by radiation with variations in the electrical parameters of the devices and the efficiency of the rectifier circuit.12911012019Journal of Physics: Conference SeriesIonizing radiation effects in a rectifier circuitinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/openAccessreponame:Biblioteca Digital de Teses e Dissertações da FEIinstname:Centro Universitário da Fundação Educacional Inaciana (FEI)instacron:FEI12-s2.0-85072104589Characteristic curveDielectric structureElectrical parameterHalf-wave rectifiersIrradiation methodsPhysical mechanismRectifier circuitTotal ionizing dose effectshttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85072104589&origin=inward2022-06-01FEI/12632022-06-01 03:06:07.71Biblioteca Digital de Teses e Dissertaçõeshttp://sofia.fei.edu.br/pergamum/biblioteca/PRI
dc.title.none.fl_str_mv Ionizing radiation effects in a rectifier circuit
title Ionizing radiation effects in a rectifier circuit
spellingShingle Ionizing radiation effects in a rectifier circuit
Boas A.C.V.
title_short Ionizing radiation effects in a rectifier circuit
title_full Ionizing radiation effects in a rectifier circuit
title_fullStr Ionizing radiation effects in a rectifier circuit
title_full_unstemmed Ionizing radiation effects in a rectifier circuit
title_sort Ionizing radiation effects in a rectifier circuit
author Boas A.C.V.
author_facet Boas A.C.V.
Guazzelli M.A.
Giacomini R.C.
Medina N.H.
author_role author
author2 Guazzelli M.A.
Giacomini R.C.
Medina N.H.
author2_role author
author
author
dc.contributor.author.fl_str_mv Boas A.C.V.
Guazzelli M.A.
Giacomini R.C.
Medina N.H.
description © Published under licence by IOP Publishing Ltd.This work aims to study the effects of ionizing radiation on a half-wave rectifier circuit. The diodes of the circuit, rectifier and Zener, were exposed to X-rays of 10 keV of effective energy. The characteristic curves of both diodes were evaluated before and after being subjected to cumulative total ionizing dose (TID) effects. The accumulation of charges in the dielectric structures of the diodes alter their individual functionalities, but the changes verified in the rectification were irrelevant. In this study, three irradiation methods were used to correlate the physical mechanisms responsible for the effects caused by radiation with variations in the electrical parameters of the devices and the efficiency of the rectifier circuit.
publishDate 2019
dc.date.accessioned.fl_str_mv 2019-08-19T23:45:24Z
dc.date.available.fl_str_mv 2019-08-19T23:45:24Z
dc.date.issued.fl_str_mv 2019
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
status_str publishedVersion
dc.identifier.citation.fl_str_mv BÔAS, A C V; GUAZZELLI, M A; GIACOMINI, R C; MEDINA, N H. Ionizing radiation effects in a rectifier circuit. JOURNAL OF PHYSICS. CONFERENCE SERIES (PRINT), v. 1291, p. 012019, 2019.
dc.identifier.uri.fl_str_mv https://repositorio.fei.edu.br/handle/FEI/1263
dc.identifier.issn.none.fl_str_mv 1742-6596
dc.identifier.doi.none.fl_str_mv 10.1088/1742-6596/1291/1/012019
identifier_str_mv BÔAS, A C V; GUAZZELLI, M A; GIACOMINI, R C; MEDINA, N H. Ionizing radiation effects in a rectifier circuit. JOURNAL OF PHYSICS. CONFERENCE SERIES (PRINT), v. 1291, p. 012019, 2019.
1742-6596
10.1088/1742-6596/1291/1/012019
url https://repositorio.fei.edu.br/handle/FEI/1263
dc.relation.ispartof.none.fl_str_mv Journal of Physics: Conference Series
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.none.fl_str_mv reponame:Biblioteca Digital de Teses e Dissertações da FEI
instname:Centro Universitário da Fundação Educacional Inaciana (FEI)
instacron:FEI
instname_str Centro Universitário da Fundação Educacional Inaciana (FEI)
instacron_str FEI
institution FEI
reponame_str Biblioteca Digital de Teses e Dissertações da FEI
collection Biblioteca Digital de Teses e Dissertações da FEI
repository.name.fl_str_mv
repository.mail.fl_str_mv
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