Radiation damage effects in standard float zone silicon diodes

Detalhes bibliográficos
Autor(a) principal: PASCOALINO, KELLY C.S.
Data de Publicação: 2014
Outros Autores: CAMARGO, FABIO, BARBOSA, RENATA F., GONCALVES, JOSEMARY A.C., TOBIAS, CARMEN C.B., INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/16506
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spelling 2014-11-17T18:18:44Z2014-11-18T18:25:53Z2015-04-02T05:56:26Z2014-11-17T18:18:44Z2014-11-18T18:25:53Z2015-04-02T05:56:26ZSeptember 27 - October 2, 2009http://repositorio.ipen.br/handle/123456789/16506Made available in DSpace on 2014-11-17T18:18:44Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:25:53Z (GMT). No. of bitstreams: 1 15090.pdf: 67350 bytes, checksum: 54745f20e3d7bc0f1aa84c6b3dcad6a0 (MD5)Made available in DSpace on 2015-04-02T05:56:26Z (GMT). No. of bitstreams: 1 15090.pdf: 67350 bytes, checksum: 54745f20e3d7bc0f1aa84c6b3dcad6a0 (MD5)Sao Paulo: ABEN, 2009capacitancecobalt 60dose limitsdose rateselectric currentselectric potentialexperimental datairradiation plantsphysical radiation effectsradiation dosessilicon diodesRadiation damage effects in standard float zone silicon diodesinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINAC; ENAN; ENFIR; ENINIRio de Janeiro, RJPASCOALINO, KELLY C.S.CAMARGO, FABIOBARBOSA, RENATA F.GONCALVES, JOSEMARY A.C.TOBIAS, CARMEN C.B.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1stinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN150902009GONCALVES, JOSEMARY A.C.TOBIAS, CARMEN C.B.09-10Proceedings6608276480029241592PASCOALINO, KELLY C.S.:6608:240:SCAMARGO, FABIO:2764:-1:NBARBOSA, RENATA F.:8002:240:NGON??ALVES, JOSEMARY A.C.:924:240:NTOBIAS, CARMEN C.B.:1592:240:NORIGINAL15090.pdfapplication/pdf67350http://repositorio.ipen.br/bitstream/123456789/16506/1/15090.pdf54745f20e3d7bc0f1aa84c6b3dcad6a0MD51123456789/165062016-06-02 22:55:35.178oai:repositorio.ipen.br:123456789/16506Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-06-02T22:55:35Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Radiation damage effects in standard float zone silicon diodes
title Radiation damage effects in standard float zone silicon diodes
spellingShingle Radiation damage effects in standard float zone silicon diodes
PASCOALINO, KELLY C.S.
capacitance
cobalt 60
dose limits
dose rates
electric currents
electric potential
experimental data
irradiation plants
physical radiation effects
radiation doses
silicon diodes
title_short Radiation damage effects in standard float zone silicon diodes
title_full Radiation damage effects in standard float zone silicon diodes
title_fullStr Radiation damage effects in standard float zone silicon diodes
title_full_unstemmed Radiation damage effects in standard float zone silicon diodes
title_sort Radiation damage effects in standard float zone silicon diodes
author PASCOALINO, KELLY C.S.
author_facet PASCOALINO, KELLY C.S.
CAMARGO, FABIO
BARBOSA, RENATA F.
GONCALVES, JOSEMARY A.C.
TOBIAS, CARMEN C.B.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
author_role author
author2 CAMARGO, FABIO
BARBOSA, RENATA F.
GONCALVES, JOSEMARY A.C.
TOBIAS, CARMEN C.B.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv PASCOALINO, KELLY C.S.
CAMARGO, FABIO
BARBOSA, RENATA F.
GONCALVES, JOSEMARY A.C.
TOBIAS, CARMEN C.B.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
dc.subject.por.fl_str_mv capacitance
cobalt 60
dose limits
dose rates
electric currents
electric potential
experimental data
irradiation plants
physical radiation effects
radiation doses
silicon diodes
topic capacitance
cobalt 60
dose limits
dose rates
electric currents
electric potential
experimental data
irradiation plants
physical radiation effects
radiation doses
silicon diodes
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv September 27 - October 2, 2009
dc.date.accessioned.fl_str_mv 2014-11-17T18:18:44Z
2014-11-18T18:25:53Z
2015-04-02T05:56:26Z
dc.date.available.fl_str_mv 2014-11-17T18:18:44Z
2014-11-18T18:25:53Z
2015-04-02T05:56:26Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
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status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/16506
url http://repositorio.ipen.br/handle/123456789/16506
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Sao Paulo: ABEN, 2009
publisher.none.fl_str_mv Sao Paulo: ABEN, 2009
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron:IPEN
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN
institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
bitstream.url.fl_str_mv http://repositorio.ipen.br/bitstream/123456789/16506/1/15090.pdf
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bitstream.checksumAlgorithm.fl_str_mv MD5
repository.name.fl_str_mv Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)
repository.mail.fl_str_mv bibl@ipen.br
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