Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor

Detalhes bibliográficos
Autor(a) principal: HAMADA, M.M.
Data de Publicação: 2014
Outros Autores: OLIVEIRA, I.B., ARMELIN, M.J., MESQUITA, C.H., SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/15378
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spelling WEHE, D.K.GRIFFIN, H.C.ROGERS, W.L.HAMADA, M.M.OLIVEIRA, I.B.ARMELIN, M.J.MESQUITA, C.H.SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th2014-11-17T17:55:06Z2014-11-18T18:53:41Z2015-04-01T23:33:42Z2014-11-17T17:55:06Z2014-11-18T18:53:41Z2015-04-01T23:33:42ZMay 21-23, 2002http://repositorio.ipen.br/handle/123456789/15378Made available in DSpace on 2014-11-17T17:55:06Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T18:53:41Z (GMT). No. of bitstreams: 0Made available in DSpace on 2015-04-01T23:33:42Z (GMT). No. of bitstreams: 0517-520Amsterdam: Elsevier, 2003Publicado em: Nuclear Instruments and Methods in Physics Research, , v. 505, n. 1/2, 2003. Section ASection A. p. 517-520reponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPENsemiconductor materialslead iodidescrystalscrystal growthbridgman methodpurificationzone refiningimpuritiestrace amountsneutron activation analysissemiconductor detectorsradiation detectorsTrace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductorinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectIAnn Arbor, MI, USAinfo:eu-repo/semantics/openAccess097912002HAMADA, M.M.ARMELIN, M.J.MESQUITA, C.H.04-08Proceedings1476250113731149HAMADA, M.M.:1476:5:SOLIVEIRA, I.B.:2501:-1:NARMELIN, M.J.:1373:7:NMESQUITA, C.H.:1149:5:NORIGINAL09791.pdf09791.pdfapplication/pdf152046http://repositorio.ipen.br/bitstream/123456789/15378/1/09791.pdf9844e3ffda5a822db1d1a9b6a976bd38MD51123456789/153782015-08-13 16:56:45.488oai:repositorio.ipen.br:123456789/15378Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102015-08-13T16:56:45Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
title Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
spellingShingle Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
HAMADA, M.M.
semiconductor materials
lead iodides
crystals
crystal growth
bridgman method
purification
zone refining
impurities
trace amounts
neutron activation analysis
semiconductor detectors
radiation detectors
title_short Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
title_full Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
title_fullStr Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
title_full_unstemmed Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
title_sort Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
author HAMADA, M.M.
author_facet HAMADA, M.M.
OLIVEIRA, I.B.
ARMELIN, M.J.
MESQUITA, C.H.
SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th
author_role author
author2 OLIVEIRA, I.B.
ARMELIN, M.J.
MESQUITA, C.H.
SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th
author2_role author
author
author
author
dc.contributor.editor.pt_BR.fl_str_mv WEHE, D.K.
GRIFFIN, H.C.
ROGERS, W.L.
dc.contributor.author.fl_str_mv HAMADA, M.M.
OLIVEIRA, I.B.
ARMELIN, M.J.
MESQUITA, C.H.
SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th
dc.subject.por.fl_str_mv semiconductor materials
lead iodides
crystals
crystal growth
bridgman method
purification
zone refining
impurities
trace amounts
neutron activation analysis
semiconductor detectors
radiation detectors
topic semiconductor materials
lead iodides
crystals
crystal growth
bridgman method
purification
zone refining
impurities
trace amounts
neutron activation analysis
semiconductor detectors
radiation detectors
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv May 21-23, 2002
dc.date.accessioned.fl_str_mv 2014-11-17T17:55:06Z
2014-11-18T18:53:41Z
2015-04-01T23:33:42Z
dc.date.available.fl_str_mv 2014-11-17T17:55:06Z
2014-11-18T18:53:41Z
2015-04-01T23:33:42Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/15378
url http://repositorio.ipen.br/handle/123456789/15378
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 517-520
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Amsterdam: Elsevier, 2003
publisher.none.fl_str_mv Amsterdam: Elsevier, 2003
dc.source.pt_BR.fl_str_mv Publicado em: Nuclear Instruments and Methods in Physics Research, , v. 505, n. 1/2, 2003. Section ASection A. p. 517-520
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron:IPEN
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN
institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
bitstream.url.fl_str_mv http://repositorio.ipen.br/bitstream/123456789/15378/1/09791.pdf
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repository.name.fl_str_mv Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)
repository.mail.fl_str_mv bibl@ipen.br
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