Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry

Detalhes bibliográficos
Autor(a) principal: PASCOALINO, K.
Data de Publicação: 2021
Outros Autores: GONCALVES, J.A.C., CAMARGO, F., BUENO, C.C., INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/32500
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spelling 2021-12-28T16:22:58Z2021-12-28T16:22:58ZNovember 29 - December 2, 2021http://repositorio.ipen.br/handle/123456789/32500Submitted by Celia Satomi Uehara (celia.u-topservice@ipen.br) on 2021-12-28T16:22:57Z No. of bitstreams: 1 28241.pdf: 790939 bytes, checksum: 10239af775100827ab81d7b59d6996db (MD5)Made available in DSpace on 2021-12-28T16:22:58Z (GMT). No. of bitstreams: 1 28241.pdf: 790939 bytes, checksum: 10239af775100827ab81d7b59d6996db (MD5)Associa????o Brasileira de Energia Nuclearalpha spectroscopydosimetryenergy losseslayersphotodiodesradiation protectionsiliconthicknessMeasurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometryinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectINACIRio de JaneiroOnline660892427641592600600600600PASCOALINO, K.GONCALVES, J.A.C.CAMARGO, F.BUENO, C.C.INTERNATIONAL NUCLEAR ATLANTIC CONFERENCEinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN282412021BUENO, C.C.CAMARGO, F.GONCALVES, J.A.C.PASCOALINO, K.21-12Proceedings159227649246608BUENO, C.C.:1592:240:NCAMARGO, F.:2764:-1:NGONCALVES, J.A.C.:924:240:NPASCOALINO, K.:6608:-1:SLICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.ipen.br/bitstream/123456789/32500/2/license.txt8a4605be74aa9ea9d79846c1fba20a33MD52ORIGINAL28241.pdf28241.pdfapplication/pdf790939http://repositorio.ipen.br/bitstream/123456789/32500/1/28241.pdf10239af775100827ab81d7b59d6996dbMD51123456789/325002022-03-08 16:37:51.487oai:repositorio.ipen.br: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Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102022-03-08T16:37:51Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
title Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
spellingShingle Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
PASCOALINO, K.
alpha spectroscopy
dosimetry
energy losses
layers
photodiodes
radiation protection
silicon
thickness
title_short Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
title_full Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
title_fullStr Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
title_full_unstemmed Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
title_sort Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
author PASCOALINO, K.
author_facet PASCOALINO, K.
GONCALVES, J.A.C.
CAMARGO, F.
BUENO, C.C.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE
author_role author
author2 GONCALVES, J.A.C.
CAMARGO, F.
BUENO, C.C.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE
author2_role author
author
author
author
dc.contributor.author.fl_str_mv PASCOALINO, K.
GONCALVES, J.A.C.
CAMARGO, F.
BUENO, C.C.
INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE
dc.subject.por.fl_str_mv alpha spectroscopy
dosimetry
energy losses
layers
photodiodes
radiation protection
silicon
thickness
topic alpha spectroscopy
dosimetry
energy losses
layers
photodiodes
radiation protection
silicon
thickness
publishDate 2021
dc.date.evento.pt_BR.fl_str_mv November 29 - December 2, 2021
dc.date.accessioned.fl_str_mv 2021-12-28T16:22:58Z
dc.date.available.fl_str_mv 2021-12-28T16:22:58Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
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status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/32500
url http://repositorio.ipen.br/handle/123456789/32500
dc.relation.authority.fl_str_mv 6608
924
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dc.relation.confidence.fl_str_mv 600
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dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.publisher.none.fl_str_mv Associa????o Brasileira de Energia Nuclear
publisher.none.fl_str_mv Associa????o Brasileira de Energia Nuclear
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
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institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
bitstream.url.fl_str_mv http://repositorio.ipen.br/bitstream/123456789/32500/2/license.txt
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