Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system
Autor(a) principal: | |
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Data de Publicação: | 2018 |
Outros Autores: | , , , , , , |
Tipo de documento: | Artigo de conferência |
Título da fonte: | Repositório Institucional do IPEN |
Texto Completo: | http://repositorio.ipen.br/handle/123456789/29155 |
Resumo: | The backscattered light originated when machining with femtosecond laser pulses can be used to accurately measure the processed surface position through an interferometer, as recently demonstrated by our group, in a setup that uses the same laser beam for ablation and inspection. The present work explores the characteristics of the laser light reflected by the target and its interaction with the resulting plasma to better understand its propagation physics and to improve the dynamic focusing system. The origin of this returning radiation was studied and has been traced, mainly, from the peripheral area of the focal spot (doughnut-like). By means of a Mach-Zehnder setup, the interferometric pattern was measured and analyzed aiming to access the influences of the plasma on the laser beam properties, and therefore on the retrieved information. Finally, the wavefront of the laser that creates and propagates through the plasma was characterized using a Shack-Hartmann sensor. |
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KAIERLE, STEFANHEINEMANN, STEFAN W.RAELE, MARCUS P.SAMAD, RICARDO E.FREITAS, ANDERSON Z.PRETTO, LUCAS deAMARAL, MARCELLO M.VIEIRA JUNIOR, NILSON D.WETTER, NIKLAUS U.HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th2018-09-17T17:13:22Z2018-09-17T17:13:22ZJanuary 27 - February 01, 2018http://repositorio.ipen.br/handle/123456789/2915510.1117/12.2285899The backscattered light originated when machining with femtosecond laser pulses can be used to accurately measure the processed surface position through an interferometer, as recently demonstrated by our group, in a setup that uses the same laser beam for ablation and inspection. The present work explores the characteristics of the laser light reflected by the target and its interaction with the resulting plasma to better understand its propagation physics and to improve the dynamic focusing system. The origin of this returning radiation was studied and has been traced, mainly, from the peripheral area of the focal spot (doughnut-like). By means of a Mach-Zehnder setup, the interferometric pattern was measured and analyzed aiming to access the influences of the plasma on the laser beam properties, and therefore on the retrieved information. Finally, the wavefront of the laser that creates and propagates through the plasma was characterized using a Shack-Hartmann sensor.Submitted by Marco Antonio Oliveira da Silva (maosilva@ipen.br) on 2018-09-17T17:13:22Z No. of bitstreams: 1 24968.pdf: 975139 bytes, checksum: a1259d048815034c28efb44da51b1f20 (MD5)Made available in DSpace on 2018-09-17T17:13:22Z (GMT). No. of bitstreams: 1 24968.pdf: 975139 bytes, checksum: a1259d048815034c28efb44da51b1f20 (MD5)Funda????o de Amparo ?? Pesquisa do Estado de S??o Paulo (FAPESP)Conselho Nacional de Desenvolvimento Cient??fico e Tecnol??gico (CNPq)FAPESP: 15/24878-0; 13/26113-6CNPq: 573916/2008-0; 465763/2014-6105250H-1 - 105250H-9Society of Photo-optical Instrumentation EngineersSPIE Proceedings Series, 10525interferometrylasersablationplasmabackscatteringsensorsmeasuring instrumentslaser beam machiningwavelengthsBackscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing systeminfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectSPIEIBellingham, WA, USASan Francisco, California, USAinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN249682018RAELE, MARCUS P.SAMAD, RICARDO E.FREITAS, ANDERSON Z.PRETTO, LUCAS deVIEIRA JUNIOR, NILSON D.WETTER, NIKLAUS U.18-09Proceedings3272909880112681582919RAELE, MARCUS P.:3272:910:SSAMAD, RICARDO E.:909:930:NFREITAS, ANDERSON Z.:880:920:NPRETTO, LUCAS DE:11268:920:NVIEIRA JUNIOR, NILSON D.:1582:930:NWETTER, NIKLAUS U.:919:910:NORIGINAL24968.pdf24968.pdfapplication/pdf975139http://repositorio.ipen.br/bitstream/123456789/29155/1/24968.pdfa1259d048815034c28efb44da51b1f20MD51LICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.ipen.br/bitstream/123456789/29155/2/license.txt8a4605be74aa9ea9d79846c1fba20a33MD52123456789/291552020-01-23 11:38:05.129oai:repositorio.ipen.br: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Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102020-01-23T11:38:05Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false |
dc.title.pt_BR.fl_str_mv |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
title |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
spellingShingle |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system RAELE, MARCUS P. interferometry lasers ablation plasma backscattering sensors measuring instruments laser beam machining wavelengths |
title_short |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
title_full |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
title_fullStr |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
title_full_unstemmed |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
title_sort |
Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system |
author |
RAELE, MARCUS P. |
author_facet |
RAELE, MARCUS P. SAMAD, RICARDO E. FREITAS, ANDERSON Z. PRETTO, LUCAS de AMARAL, MARCELLO M. VIEIRA JUNIOR, NILSON D. WETTER, NIKLAUS U. HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th |
author_role |
author |
author2 |
SAMAD, RICARDO E. FREITAS, ANDERSON Z. PRETTO, LUCAS de AMARAL, MARCELLO M. VIEIRA JUNIOR, NILSON D. WETTER, NIKLAUS U. HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th |
author2_role |
author author author author author author author |
dc.contributor.editor.none.fl_str_mv |
KAIERLE, STEFAN HEINEMANN, STEFAN W. |
dc.contributor.author.fl_str_mv |
RAELE, MARCUS P. SAMAD, RICARDO E. FREITAS, ANDERSON Z. PRETTO, LUCAS de AMARAL, MARCELLO M. VIEIRA JUNIOR, NILSON D. WETTER, NIKLAUS U. HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th |
dc.subject.por.fl_str_mv |
interferometry lasers ablation plasma backscattering sensors measuring instruments laser beam machining wavelengths |
topic |
interferometry lasers ablation plasma backscattering sensors measuring instruments laser beam machining wavelengths |
description |
The backscattered light originated when machining with femtosecond laser pulses can be used to accurately measure the processed surface position through an interferometer, as recently demonstrated by our group, in a setup that uses the same laser beam for ablation and inspection. The present work explores the characteristics of the laser light reflected by the target and its interaction with the resulting plasma to better understand its propagation physics and to improve the dynamic focusing system. The origin of this returning radiation was studied and has been traced, mainly, from the peripheral area of the focal spot (doughnut-like). By means of a Mach-Zehnder setup, the interferometric pattern was measured and analyzed aiming to access the influences of the plasma on the laser beam properties, and therefore on the retrieved information. Finally, the wavefront of the laser that creates and propagates through the plasma was characterized using a Shack-Hartmann sensor. |
publishDate |
2018 |
dc.date.evento.pt_BR.fl_str_mv |
January 27 - February 01, 2018 |
dc.date.accessioned.fl_str_mv |
2018-09-17T17:13:22Z |
dc.date.available.fl_str_mv |
2018-09-17T17:13:22Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://repositorio.ipen.br/handle/123456789/29155 |
dc.identifier.doi.pt_BR.fl_str_mv |
10.1117/12.2285899 |
url |
http://repositorio.ipen.br/handle/123456789/29155 |
identifier_str_mv |
10.1117/12.2285899 |
dc.relation.ispartofseries.pt_BR.fl_str_mv |
SPIE Proceedings Series, 10525 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
105250H-1 - 105250H-9 |
dc.coverage.pt_BR.fl_str_mv |
I |
dc.publisher.none.fl_str_mv |
Society of Photo-optical Instrumentation Engineers |
publisher.none.fl_str_mv |
Society of Photo-optical Instrumentation Engineers |
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reponame:Repositório Institucional do IPEN instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN) instacron:IPEN |
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IPEN |
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Repositório Institucional do IPEN |
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Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
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bibl@ipen.br |
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1767254245981028352 |