Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference
Autor(a) principal: | |
---|---|
Data de Publicação: | 2014 |
Outros Autores: | , , , , , , , , , , , |
Tipo de documento: | Artigo de conferência |
Título da fonte: | Repositório Institucional do IPEN |
Texto Completo: | http://repositorio.ipen.br/handle/123456789/18063 |
id |
IPEN_bd0e7f841fcefcb6ceef912cb08c9824 |
---|---|
oai_identifier_str |
oai:repositorio.ipen.br:123456789/18063 |
network_acronym_str |
IPEN |
network_name_str |
Repositório Institucional do IPEN |
repository_id_str |
4510 |
spelling |
LEHMANN, PETER H.OSTEN, WOLFGANGGASTINGER, KAYCOUCEIRO, IAKYRA B.SILVA, THIAGO F. daTARELHO, LUIZ V.G.AZEREDO, CARLOS L.S.MALINOVSKI, IGORGRIENEISEN, HANS P.H.BARROS, WELLINGTON S.FARIA, GIANCARLO V.WEID, JEAN P. VON DERAMARAL, MARCELLO M.RAELE, MARCUS P.FREITAS, ANDERSON Z. deOPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION, VII2014-11-17T18:41:13Z2014-11-18T17:25:15Z2015-04-01T22:26:13Z2014-11-17T18:41:13Z2014-11-18T17:25:15Z2015-04-01T22:26:13ZMay 23-26http://repositorio.ipen.br/handle/123456789/18063Made available in DSpace on 2014-11-17T18:41:13Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T17:25:15Z (GMT). No. of bitstreams: 1 18937.pdf: 329831 bytes, checksum: eb2905fb02dca726a619e470d0df62ce (MD5)Made available in DSpace on 2015-04-01T22:26:13Z (GMT). No. of bitstreams: 1 18937.pdf: 329831 bytes, checksum: eb2905fb02dca726a619e470d0df62ce (MD5)80822P-1 - 80822P-10Society of Photho-optical Instrumentation Engineerscoherent radiationinterferometrycalibration standardstomographyoptical modelsDevelopment of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration referenceinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectIBellingham, WashingtonMunich, Germanyinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN189372011TARELHO, LUIZ V.G.RAELE, MARCUS P.FREITAS, ANDERSON Z. de12-04Proceedings-1-1932-1-1-1-1-1-166863272880COUCEIRO, IAKYRA B.:-1:-1:SSILVA, THIAGO F. DA:-1:-1:NTARELHO, LUIZ V.G.:932:-1:NAZEREDO, CARLOS L.S.:-1:-1:NMALINOVSKI, IGOR:-1:-1:NGRIENEISEN, HANS P.H.:-1:-1:NBARROS, WELLINGTON S.:-1:-1:NFARIA, GIANCARLO V.:-1:-1:NWEID, JEAN P. VON DER:-1:-1:NAMARAL, MARCELLO M.:6686:-1:NRAELE, MARCUS P.:3272:910:NFREITAS, ANDERSON Z. de:880:920:NORIGINAL18937.pdfapplication/pdf329831http://repositorio.ipen.br/bitstream/123456789/18063/1/18937.pdfeb2905fb02dca726a619e470d0df62ceMD51123456789/180632020-08-17 23:10:16.412oai:repositorio.ipen.br:123456789/18063Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102020-08-17T23:10:16Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false |
dc.title.pt_BR.fl_str_mv |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
title |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
spellingShingle |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference COUCEIRO, IAKYRA B. coherent radiation interferometry calibration standards tomography optical models |
title_short |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
title_full |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
title_fullStr |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
title_full_unstemmed |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
title_sort |
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference |
author |
COUCEIRO, IAKYRA B. |
author_facet |
COUCEIRO, IAKYRA B. SILVA, THIAGO F. da TARELHO, LUIZ V.G. AZEREDO, CARLOS L.S. MALINOVSKI, IGOR GRIENEISEN, HANS P.H. BARROS, WELLINGTON S. FARIA, GIANCARLO V. WEID, JEAN P. VON DER AMARAL, MARCELLO M. RAELE, MARCUS P. FREITAS, ANDERSON Z. de OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION, VII |
author_role |
author |
author2 |
SILVA, THIAGO F. da TARELHO, LUIZ V.G. AZEREDO, CARLOS L.S. MALINOVSKI, IGOR GRIENEISEN, HANS P.H. BARROS, WELLINGTON S. FARIA, GIANCARLO V. WEID, JEAN P. VON DER AMARAL, MARCELLO M. RAELE, MARCUS P. FREITAS, ANDERSON Z. de OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION, VII |
author2_role |
author author author author author author author author author author author author |
dc.contributor.editor.pt_BR.fl_str_mv |
LEHMANN, PETER H. OSTEN, WOLFGANG GASTINGER, KAY |
dc.contributor.author.fl_str_mv |
COUCEIRO, IAKYRA B. SILVA, THIAGO F. da TARELHO, LUIZ V.G. AZEREDO, CARLOS L.S. MALINOVSKI, IGOR GRIENEISEN, HANS P.H. BARROS, WELLINGTON S. FARIA, GIANCARLO V. WEID, JEAN P. VON DER AMARAL, MARCELLO M. RAELE, MARCUS P. FREITAS, ANDERSON Z. de OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION, VII |
dc.subject.por.fl_str_mv |
coherent radiation interferometry calibration standards tomography optical models |
topic |
coherent radiation interferometry calibration standards tomography optical models |
publishDate |
2014 |
dc.date.evento.pt_BR.fl_str_mv |
May 23-26 |
dc.date.accessioned.fl_str_mv |
2014-11-17T18:41:13Z 2014-11-18T17:25:15Z 2015-04-01T22:26:13Z |
dc.date.available.fl_str_mv |
2014-11-17T18:41:13Z 2014-11-18T17:25:15Z 2015-04-01T22:26:13Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://repositorio.ipen.br/handle/123456789/18063 |
url |
http://repositorio.ipen.br/handle/123456789/18063 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
80822P-1 - 80822P-10 |
dc.coverage.pt_BR.fl_str_mv |
I |
dc.publisher.none.fl_str_mv |
Society of Photho-optical Instrumentation Engineers |
publisher.none.fl_str_mv |
Society of Photho-optical Instrumentation Engineers |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional do IPEN instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN) instacron:IPEN |
instname_str |
Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
instacron_str |
IPEN |
institution |
IPEN |
reponame_str |
Repositório Institucional do IPEN |
collection |
Repositório Institucional do IPEN |
bitstream.url.fl_str_mv |
http://repositorio.ipen.br/bitstream/123456789/18063/1/18937.pdf |
bitstream.checksum.fl_str_mv |
eb2905fb02dca726a619e470d0df62ce |
bitstream.checksumAlgorithm.fl_str_mv |
MD5 |
repository.name.fl_str_mv |
Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN) |
repository.mail.fl_str_mv |
bibl@ipen.br |
_version_ |
1767254208313032704 |