On the high-temperature degradation mechanism of ZnO-based thermoelectrics
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10773/31715 |
Resumo: | The stability and reproducibility of the electric properties in n-type doped ZnO represent known bottlenecks towards potential thermoelectric applications. The degradation is promoted by the vanishing of the electronic defects on oxidation and irreversible exsolution of the phase impurities. This work proposes a microstructural mechanism showing that these processes take place mainly in the pores and highlighting the necessity for high densification of ZnO-based thermoelectrics to ensure more stable operation. The electrical performance was monitored at various temperatures, followed by a detailed microstructural analysis. The evolution of the electrical conductivity and Seebeck coefficient confirm that the degradation is related to a gradual decrease in the charge carrier concentration rather than to the effects suppressing their mobility. The results suggest that the donor exsolution may promote an increase or decrease of the power factor, guided by the self-optimization of the charge carrier concentration. |
id |
RCAP_27f4c75148f54840c78cf897819c91ce |
---|---|
oai_identifier_str |
oai:ria.ua.pt:10773/31715 |
network_acronym_str |
RCAP |
network_name_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository_id_str |
7160 |
spelling |
On the high-temperature degradation mechanism of ZnO-based thermoelectricsZinc oxideThermoelectricsDegradation mechanismMicrostructural evolutionElectrical propertiesThe stability and reproducibility of the electric properties in n-type doped ZnO represent known bottlenecks towards potential thermoelectric applications. The degradation is promoted by the vanishing of the electronic defects on oxidation and irreversible exsolution of the phase impurities. This work proposes a microstructural mechanism showing that these processes take place mainly in the pores and highlighting the necessity for high densification of ZnO-based thermoelectrics to ensure more stable operation. The electrical performance was monitored at various temperatures, followed by a detailed microstructural analysis. The evolution of the electrical conductivity and Seebeck coefficient confirm that the degradation is related to a gradual decrease in the charge carrier concentration rather than to the effects suppressing their mobility. The results suggest that the donor exsolution may promote an increase or decrease of the power factor, guided by the self-optimization of the charge carrier concentration.Elsevier2021-022021-02-01T00:00:00Z2023-03-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10773/31715eng0955-221910.1016/j.jeurceramsoc.2020.09.035Arias-Serrano, Blanca I.Mikhalev, Sergey M.Ferro, Marta C.Tobaldi, David M.Frade, Jorge R.Kovalevsky, Andrei V.info:eu-repo/semantics/embargoedAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2024-02-22T12:01:04Zoai:ria.ua.pt:10773/31715Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T03:03:28.312516Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
title |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
spellingShingle |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics Arias-Serrano, Blanca I. Zinc oxide Thermoelectrics Degradation mechanism Microstructural evolution Electrical properties |
title_short |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
title_full |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
title_fullStr |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
title_full_unstemmed |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
title_sort |
On the high-temperature degradation mechanism of ZnO-based thermoelectrics |
author |
Arias-Serrano, Blanca I. |
author_facet |
Arias-Serrano, Blanca I. Mikhalev, Sergey M. Ferro, Marta C. Tobaldi, David M. Frade, Jorge R. Kovalevsky, Andrei V. |
author_role |
author |
author2 |
Mikhalev, Sergey M. Ferro, Marta C. Tobaldi, David M. Frade, Jorge R. Kovalevsky, Andrei V. |
author2_role |
author author author author author |
dc.contributor.author.fl_str_mv |
Arias-Serrano, Blanca I. Mikhalev, Sergey M. Ferro, Marta C. Tobaldi, David M. Frade, Jorge R. Kovalevsky, Andrei V. |
dc.subject.por.fl_str_mv |
Zinc oxide Thermoelectrics Degradation mechanism Microstructural evolution Electrical properties |
topic |
Zinc oxide Thermoelectrics Degradation mechanism Microstructural evolution Electrical properties |
description |
The stability and reproducibility of the electric properties in n-type doped ZnO represent known bottlenecks towards potential thermoelectric applications. The degradation is promoted by the vanishing of the electronic defects on oxidation and irreversible exsolution of the phase impurities. This work proposes a microstructural mechanism showing that these processes take place mainly in the pores and highlighting the necessity for high densification of ZnO-based thermoelectrics to ensure more stable operation. The electrical performance was monitored at various temperatures, followed by a detailed microstructural analysis. The evolution of the electrical conductivity and Seebeck coefficient confirm that the degradation is related to a gradual decrease in the charge carrier concentration rather than to the effects suppressing their mobility. The results suggest that the donor exsolution may promote an increase or decrease of the power factor, guided by the self-optimization of the charge carrier concentration. |
publishDate |
2021 |
dc.date.none.fl_str_mv |
2021-02 2021-02-01T00:00:00Z 2023-03-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10773/31715 |
url |
http://hdl.handle.net/10773/31715 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0955-2219 10.1016/j.jeurceramsoc.2020.09.035 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/embargoedAccess |
eu_rights_str_mv |
embargoedAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier |
publisher.none.fl_str_mv |
Elsevier |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
|
_version_ |
1799137690099122176 |