Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration

Detalhes bibliográficos
Autor(a) principal: Wang Li-Wei
Data de Publicação: 2009
Outros Autores: Xu Zheng, Meng Lijian, Teixeira, Vasco M. P., Song Shigeng, Xu Xu-Rong
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/13622
Resumo: ZnO films doped with different vanadium concentrations are deposited onto glass substrates by dc reactive magnetron sputtering using a zinc target doped with vanadium. The vanadium concentrations are examined by energy dispersive spectroscopy (EDS) and the charge state of vanadium in ZnO thin films is characterized by x-ray photoelectron spectroscopy. The results of x-ray diffraction (XRD) show that all the films have a wurtzite structure and grow mainly in the c-axis orientation. The grain size and residual stress in the deposited films are estimated by fitting the XRD results. The optical properties of the films are studied by measuring the transmittance. The optical constants (refractive index and extinction coefficient) and the film thickness are obtained by fitting the transmittance. All the results are discussed in relation with the doping of the vanadium.
id RCAP_43a955d9ef22a70bbef5eb81dc7da2fa
oai_identifier_str oai:repositorium.sdum.uminho.pt:1822/13622
network_acronym_str RCAP
network_name_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository_id_str 7160
spelling Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentrationScience & TechnologyZnO films doped with different vanadium concentrations are deposited onto glass substrates by dc reactive magnetron sputtering using a zinc target doped with vanadium. The vanadium concentrations are examined by energy dispersive spectroscopy (EDS) and the charge state of vanadium in ZnO thin films is characterized by x-ray photoelectron spectroscopy. The results of x-ray diffraction (XRD) show that all the films have a wurtzite structure and grow mainly in the c-axis orientation. The grain size and residual stress in the deposited films are estimated by fitting the XRD results. The optical properties of the films are studied by measuring the transmittance. The optical constants (refractive index and extinction coefficient) and the film thickness are obtained by fitting the transmittance. All the results are discussed in relation with the doping of the vanadium.Supported by the National Natural Science Foundation of China under Grant Nos 60576016, 10774013, 10804006 and 10434030 (key project), the National High-Tech Research and Development Program of China under Grant No 2006AA03Z0412, the Natural Science Foundation of Beijing under Grant No 2073030, the National Basic Research Program of China under Grant No 2003CB314707, and Beijing Jiao Tong University under Grants Nos 2005SM057, 2006XM043 and 141028522.Chinese Physical SocietyUniversidade do MinhoWang Li-WeiXu ZhengMeng LijianTeixeira, Vasco M. P.Song ShigengXu Xu-Rong2009-07-022009-07-02T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/13622eng0256-307X10.1088/0256-307X/26/7/077801http://cpl.iphy.ac.cn/qikan/epaper/zhaiyao.asp?bsid=10582info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:05:24Zoai:repositorium.sdum.uminho.pt:1822/13622Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T18:55:49.302555Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
title Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
spellingShingle Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
Wang Li-Wei
Science & Technology
title_short Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
title_full Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
title_fullStr Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
title_full_unstemmed Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
title_sort Influence of concentration of vanadium in zinc oxide on structural and optical properties with lower concentration
author Wang Li-Wei
author_facet Wang Li-Wei
Xu Zheng
Meng Lijian
Teixeira, Vasco M. P.
Song Shigeng
Xu Xu-Rong
author_role author
author2 Xu Zheng
Meng Lijian
Teixeira, Vasco M. P.
Song Shigeng
Xu Xu-Rong
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Wang Li-Wei
Xu Zheng
Meng Lijian
Teixeira, Vasco M. P.
Song Shigeng
Xu Xu-Rong
dc.subject.por.fl_str_mv Science & Technology
topic Science & Technology
description ZnO films doped with different vanadium concentrations are deposited onto glass substrates by dc reactive magnetron sputtering using a zinc target doped with vanadium. The vanadium concentrations are examined by energy dispersive spectroscopy (EDS) and the charge state of vanadium in ZnO thin films is characterized by x-ray photoelectron spectroscopy. The results of x-ray diffraction (XRD) show that all the films have a wurtzite structure and grow mainly in the c-axis orientation. The grain size and residual stress in the deposited films are estimated by fitting the XRD results. The optical properties of the films are studied by measuring the transmittance. The optical constants (refractive index and extinction coefficient) and the film thickness are obtained by fitting the transmittance. All the results are discussed in relation with the doping of the vanadium.
publishDate 2009
dc.date.none.fl_str_mv 2009-07-02
2009-07-02T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/13622
url http://hdl.handle.net/1822/13622
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 0256-307X
10.1088/0256-307X/26/7/077801
http://cpl.iphy.ac.cn/qikan/epaper/zhaiyao.asp?bsid=10582
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Chinese Physical Society
publisher.none.fl_str_mv Chinese Physical Society
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
_version_ 1799132344555143168

Registros relacionados