X-ray photoelectron spectroscopy: a surface characterization technique

• Autor(a) principal: Hortigüela Gallo, María J.
• Data de Publicação: 2019
• Outros Autores: Otero Irurueta, Gonzalo
• Tipo de documento: Livro
• Idioma: eng
• Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
• Texto Completo: http://hdl.handle.net/10773/26343
• topic: Espectroscopia fotoeletrónica de raios X; Química de superfícies; Análise espectral

During the last years, an increasing number of students have visited the XPS laboratory for characterizing their samples with this experimental technique. Their background span over a wide range of fields such as physics, material science, chemistry and biology, among others. For most of them, both XPS and ultra-high vacuum technology were something new and they needed help to deal with the data of their samples. This book tries to concentrate the key information that a young researcher needs for a first approach to XPS. We hope the students will understand its working principle and will obtain the basic tools for analysing their data.