All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis
Autor(a) principal: | |
---|---|
Data de Publicação: | 2016 |
Outros Autores: | , , , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10400.1/9289 |
Resumo: | We report on the detailed electrical investigation of all-inkjet-printed thin-film transistor (TFT) arrays focusing on TFT failures and their origins. The TFT arrays were manufactured on flexible polymer substrates in ambient condition without the need for cleanroom environment or inert atmosphere and at a maximum temperature of 150 degrees C. Alternative manufacturing processes for electronic devices such as inkjet printing suffer from lower accuracy compared to traditional microelectronic manufacturing methods. Furthermore, usually printing methods do not allow the manufacturing of electronic devices with high yield (high number of functional devices). In general, the manufacturing yield is much lower compared to the established conventional manufacturing methods based on lithography. Thus, the focus of this contribution is set on a comprehensive analysis of defective TFTs printed by inkjet technology. Based on root cause analysis, we present the defects by developing failure categories and discuss the reasons for the defects. This procedure identifies failure origins and allows the optimization of the manufacturing resulting finally to a yield improvement. |
id |
RCAP_4f2da076bac2590a09bb94cdaa244fe2 |
---|---|
oai_identifier_str |
oai:sapientia.ualg.pt:10400.1/9289 |
network_acronym_str |
RCAP |
network_name_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository_id_str |
7160 |
spelling |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysisWe report on the detailed electrical investigation of all-inkjet-printed thin-film transistor (TFT) arrays focusing on TFT failures and their origins. The TFT arrays were manufactured on flexible polymer substrates in ambient condition without the need for cleanroom environment or inert atmosphere and at a maximum temperature of 150 degrees C. Alternative manufacturing processes for electronic devices such as inkjet printing suffer from lower accuracy compared to traditional microelectronic manufacturing methods. Furthermore, usually printing methods do not allow the manufacturing of electronic devices with high yield (high number of functional devices). In general, the manufacturing yield is much lower compared to the established conventional manufacturing methods based on lithography. Thus, the focus of this contribution is set on a comprehensive analysis of defective TFTs printed by inkjet technology. Based on root cause analysis, we present the defects by developing failure categories and discuss the reasons for the defects. This procedure identifies failure origins and allows the optimization of the manufacturing resulting finally to a yield improvement.SapientiaSowade, EnricoRamon, EloiMitra, Kalyan YotiMartinez-Domingo, CarmePedro, MartaPallares, JofreLoffredo, FaustaVillani, FulviaGomes, Henrique L.Teres, LluisBaumann, Reinhard R.2017-04-07T15:56:01Z2016-092016-09-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.1/9289eng2045-2322AUT: HGO00803;10.1038/srep33490info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-24T10:20:43Zoai:sapientia.ualg.pt:10400.1/9289Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:01:16.717734Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
title |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
spellingShingle |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis Sowade, Enrico |
title_short |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
title_full |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
title_fullStr |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
title_full_unstemmed |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
title_sort |
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis |
author |
Sowade, Enrico |
author_facet |
Sowade, Enrico Ramon, Eloi Mitra, Kalyan Yoti Martinez-Domingo, Carme Pedro, Marta Pallares, Jofre Loffredo, Fausta Villani, Fulvia Gomes, Henrique L. Teres, Lluis Baumann, Reinhard R. |
author_role |
author |
author2 |
Ramon, Eloi Mitra, Kalyan Yoti Martinez-Domingo, Carme Pedro, Marta Pallares, Jofre Loffredo, Fausta Villani, Fulvia Gomes, Henrique L. Teres, Lluis Baumann, Reinhard R. |
author2_role |
author author author author author author author author author author |
dc.contributor.none.fl_str_mv |
Sapientia |
dc.contributor.author.fl_str_mv |
Sowade, Enrico Ramon, Eloi Mitra, Kalyan Yoti Martinez-Domingo, Carme Pedro, Marta Pallares, Jofre Loffredo, Fausta Villani, Fulvia Gomes, Henrique L. Teres, Lluis Baumann, Reinhard R. |
description |
We report on the detailed electrical investigation of all-inkjet-printed thin-film transistor (TFT) arrays focusing on TFT failures and their origins. The TFT arrays were manufactured on flexible polymer substrates in ambient condition without the need for cleanroom environment or inert atmosphere and at a maximum temperature of 150 degrees C. Alternative manufacturing processes for electronic devices such as inkjet printing suffer from lower accuracy compared to traditional microelectronic manufacturing methods. Furthermore, usually printing methods do not allow the manufacturing of electronic devices with high yield (high number of functional devices). In general, the manufacturing yield is much lower compared to the established conventional manufacturing methods based on lithography. Thus, the focus of this contribution is set on a comprehensive analysis of defective TFTs printed by inkjet technology. Based on root cause analysis, we present the defects by developing failure categories and discuss the reasons for the defects. This procedure identifies failure origins and allows the optimization of the manufacturing resulting finally to a yield improvement. |
publishDate |
2016 |
dc.date.none.fl_str_mv |
2016-09 2016-09-01T00:00:00Z 2017-04-07T15:56:01Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10400.1/9289 |
url |
http://hdl.handle.net/10400.1/9289 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2045-2322 AUT: HGO00803; 10.1038/srep33490 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
|
_version_ |
1799133241499713536 |