Electrical characterization of semiconducting polymers

Detalhes bibliográficos
Autor(a) principal: Stallinga, Peter
Data de Publicação: 1998
Outros Autores: Gomes, Henrique L., Jones, G. W., Taylor, D. M.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10400.1/6638
Resumo: Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.
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spelling Electrical characterization of semiconducting polymersSchottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.Polish Academy of Sciences Institut of PhysicsSapientiaStallinga, PeterGomes, Henrique L.Jones, G. W.Taylor, D. M.2015-06-26T14:18:47Z19981998-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.1/6638eng0587-4246AUT: PJO01566; HGO00803;info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-24T10:17:48Zoai:sapientia.ualg.pt:10400.1/6638Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:59:16.595068Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Electrical characterization of semiconducting polymers
title Electrical characterization of semiconducting polymers
spellingShingle Electrical characterization of semiconducting polymers
Stallinga, Peter
title_short Electrical characterization of semiconducting polymers
title_full Electrical characterization of semiconducting polymers
title_fullStr Electrical characterization of semiconducting polymers
title_full_unstemmed Electrical characterization of semiconducting polymers
title_sort Electrical characterization of semiconducting polymers
author Stallinga, Peter
author_facet Stallinga, Peter
Gomes, Henrique L.
Jones, G. W.
Taylor, D. M.
author_role author
author2 Gomes, Henrique L.
Jones, G. W.
Taylor, D. M.
author2_role author
author
author
dc.contributor.none.fl_str_mv Sapientia
dc.contributor.author.fl_str_mv Stallinga, Peter
Gomes, Henrique L.
Jones, G. W.
Taylor, D. M.
description Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.
publishDate 1998
dc.date.none.fl_str_mv 1998
1998-01-01T00:00:00Z
2015-06-26T14:18:47Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10400.1/6638
url http://hdl.handle.net/10400.1/6638
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 0587-4246
AUT: PJO01566; HGO00803;
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Polish Academy of Sciences Institut of Physics
publisher.none.fl_str_mv Polish Academy of Sciences Institut of Physics
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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