Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation

Detalhes bibliográficos
Autor(a) principal: Santos, Rúben F.
Data de Publicação: 2021
Outros Autores: Oliveira, Bruno M. C., Chícharo, Alexandre, Alpuim, P., Ferreira, Paulo J., Simões, Sónia, Viana, Filomena, Vieira, Manuel F.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: https://hdl.handle.net/1822/81244
Resumo: The use of Ta/TaN barrier bilayer systems in electronic applications has been ubiquitous over the last decade. Alternative materials such as Co-W or Ru-W alloys have gathered interest as possible replacements due to their conjugation of favourable electrical properties and barrier layer efficiency at reduced thicknesses while enabling seedless Cu electroplating. The microstructure, morphology, and electrical properties of Cu films directly electrodeposited onto Co-W or Ru-W are important to assess, concomitant with their ability to withstand the electroplating baths/conditions. This work investigates the effects of the current application method and pH value of the electroplating solution on the electrocrystallisation behaviour of Cu deposited onto a Co-W barrier layer. The film structure, morphology, and chemical composition were studied by X-ray diffraction, scanning electron microscopy and atomic force microscopy, as well as photoelectron spectroscopy. The results show that the electrolyte solution at pH 1.8 is incapable of creating a compact Cu film over the Co-W layer in either pulsed or direct-current modes. At higher pH, a continuous film is formed. A mechanism is proposed for the nucleation and growth of Cu on Co-W, where a balance between Cu nucleation, growth, and preferential Co dissolution dictates the substrate area coverage and compactness of the electrodeposited films.
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spelling Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formationseedless electroplatingCuCo-WCo-WInterconnectacidicEngenharia e Tecnologia::Engenharia dos MateriaisScience & TechnologyThe use of Ta/TaN barrier bilayer systems in electronic applications has been ubiquitous over the last decade. Alternative materials such as Co-W or Ru-W alloys have gathered interest as possible replacements due to their conjugation of favourable electrical properties and barrier layer efficiency at reduced thicknesses while enabling seedless Cu electroplating. The microstructure, morphology, and electrical properties of Cu films directly electrodeposited onto Co-W or Ru-W are important to assess, concomitant with their ability to withstand the electroplating baths/conditions. This work investigates the effects of the current application method and pH value of the electroplating solution on the electrocrystallisation behaviour of Cu deposited onto a Co-W barrier layer. The film structure, morphology, and chemical composition were studied by X-ray diffraction, scanning electron microscopy and atomic force microscopy, as well as photoelectron spectroscopy. The results show that the electrolyte solution at pH 1.8 is incapable of creating a compact Cu film over the Co-W layer in either pulsed or direct-current modes. At higher pH, a continuous film is formed. A mechanism is proposed for the nucleation and growth of Cu on Co-W, where a balance between Cu nucleation, growth, and preferential Co dissolution dictates the substrate area coverage and compactness of the electrodeposited films.Portugal 2020 through European Regional Development Fund (FEDER) in the frame of Operational Competitiveness and Internationalisation Programme (POCI) and in the scope of the project USECoIN with grant number PTDC/CTM-CTM/31953/2017. This work was also supported by FCT, through IDMEC, under LAETA project UIDB/50022/2020MDPIUniversidade do MinhoSantos, Rúben F.Oliveira, Bruno M. C.Chícharo, AlexandreAlpuim, P.Ferreira, Paulo J.Simões, SóniaViana, FilomenaVieira, Manuel F.2021-07-082021-07-08T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/1822/81244engSantos, R. F., Oliveira, B. M., Chícharo, A., Alpuim, P., et. al (2021). Seedless Cu Electroplating on Co-W Thin Films in Low pH Electrolyte: Early Stages of Formation. Nanomaterials, 11(8), 19142079-499110.3390/nano11081914https://www.mdpi.com/2079-4991/11/8/1914info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:17:56Zoai:repositorium.sdum.uminho.pt:1822/81244Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:10:38.986993Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
title Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
spellingShingle Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
Santos, Rúben F.
seedless electroplating
Cu
Co-W
Co-W
Interconnect
acidic
Engenharia e Tecnologia::Engenharia dos Materiais
Science & Technology
title_short Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
title_full Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
title_fullStr Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
title_full_unstemmed Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
title_sort Seedless Cu electroplating on Co-W thin films in low pH electrolyte: early stages of formation
author Santos, Rúben F.
author_facet Santos, Rúben F.
Oliveira, Bruno M. C.
Chícharo, Alexandre
Alpuim, P.
Ferreira, Paulo J.
Simões, Sónia
Viana, Filomena
Vieira, Manuel F.
author_role author
author2 Oliveira, Bruno M. C.
Chícharo, Alexandre
Alpuim, P.
Ferreira, Paulo J.
Simões, Sónia
Viana, Filomena
Vieira, Manuel F.
author2_role author
author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Santos, Rúben F.
Oliveira, Bruno M. C.
Chícharo, Alexandre
Alpuim, P.
Ferreira, Paulo J.
Simões, Sónia
Viana, Filomena
Vieira, Manuel F.
dc.subject.por.fl_str_mv seedless electroplating
Cu
Co-W
Co-W
Interconnect
acidic
Engenharia e Tecnologia::Engenharia dos Materiais
Science & Technology
topic seedless electroplating
Cu
Co-W
Co-W
Interconnect
acidic
Engenharia e Tecnologia::Engenharia dos Materiais
Science & Technology
description The use of Ta/TaN barrier bilayer systems in electronic applications has been ubiquitous over the last decade. Alternative materials such as Co-W or Ru-W alloys have gathered interest as possible replacements due to their conjugation of favourable electrical properties and barrier layer efficiency at reduced thicknesses while enabling seedless Cu electroplating. The microstructure, morphology, and electrical properties of Cu films directly electrodeposited onto Co-W or Ru-W are important to assess, concomitant with their ability to withstand the electroplating baths/conditions. This work investigates the effects of the current application method and pH value of the electroplating solution on the electrocrystallisation behaviour of Cu deposited onto a Co-W barrier layer. The film structure, morphology, and chemical composition were studied by X-ray diffraction, scanning electron microscopy and atomic force microscopy, as well as photoelectron spectroscopy. The results show that the electrolyte solution at pH 1.8 is incapable of creating a compact Cu film over the Co-W layer in either pulsed or direct-current modes. At higher pH, a continuous film is formed. A mechanism is proposed for the nucleation and growth of Cu on Co-W, where a balance between Cu nucleation, growth, and preferential Co dissolution dictates the substrate area coverage and compactness of the electrodeposited films.
publishDate 2021
dc.date.none.fl_str_mv 2021-07-08
2021-07-08T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv https://hdl.handle.net/1822/81244
url https://hdl.handle.net/1822/81244
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Santos, R. F., Oliveira, B. M., Chícharo, A., Alpuim, P., et. al (2021). Seedless Cu Electroplating on Co-W Thin Films in Low pH Electrolyte: Early Stages of Formation. Nanomaterials, 11(8), 1914
2079-4991
10.3390/nano11081914
https://www.mdpi.com/2079-4991/11/8/1914
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv MDPI
publisher.none.fl_str_mv MDPI
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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