Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates

Detalhes bibliográficos
Autor(a) principal: Alpuim, P.
Data de Publicação: 2016
Outros Autores: Cerqueira, M. F., Iglesias, V., Junior, George Luiz Machado, Borme, J.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/43627
Resumo: The possibility of direct writing thin semiconductive channels and structures on insulating substrates in a clean room-free process is attractive for its simplicity, cost effectiveness, and possibility of a wide choice of substrates. A broad range of applications, such as large-area electronic devices (touch screens, flexible displays), sensors, or optical wave guides could benefit from such a process. In this work, we directly write on doped hydrogenated amorphous silicon (a-Si:H), with thickness in the range 10 nm–1 μm, using a Nd-YAG laser operating at 532 nm that is part of a Witec Raman confocal system. The contrast in conductivity between the exposed and unexposed areas is so high that the a-Si:H matrix needs not to be removed after exposure. B- and P-doped films were deposited on plastic, glass, and oxidized silicon wafers. The laser power threshold for crystallization was studied. The highest conductivity (886 Ω−1 cm−1) was obtained on wafer. On hard substrates, it is possible to tune the mesoscopic electrical conductivity in a very broad range of values (∼10−4–103) by design of the pattern to be transferred. Patterned films are piezoresistive with gauge factors as high as +18 and −29 for p- and n-type patterns, respectively. SEM image of laser written lines on a 10 nm thick a-Si:H film deposited on a Si/SiO2 substrate. Four regions are clearly distinguishable: the metal contact on the top area; the laser eroded area (lines); the crystallized areas adjacent to lines; the amorphous region at the bottom right.
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spelling Laser patterning of amorphous silicon thin films deposited on flexible and rigid substratesAmorphous siliconCrystallizationDopant activation,Laser scribingPiezoresistanceCiências Naturais::Ciências FísicasScience & TechnologyThe possibility of direct writing thin semiconductive channels and structures on insulating substrates in a clean room-free process is attractive for its simplicity, cost effectiveness, and possibility of a wide choice of substrates. A broad range of applications, such as large-area electronic devices (touch screens, flexible displays), sensors, or optical wave guides could benefit from such a process. In this work, we directly write on doped hydrogenated amorphous silicon (a-Si:H), with thickness in the range 10 nm–1 μm, using a Nd-YAG laser operating at 532 nm that is part of a Witec Raman confocal system. The contrast in conductivity between the exposed and unexposed areas is so high that the a-Si:H matrix needs not to be removed after exposure. B- and P-doped films were deposited on plastic, glass, and oxidized silicon wafers. The laser power threshold for crystallization was studied. The highest conductivity (886 Ω−1 cm−1) was obtained on wafer. On hard substrates, it is possible to tune the mesoscopic electrical conductivity in a very broad range of values (∼10−4–103) by design of the pattern to be transferred. Patterned films are piezoresistive with gauge factors as high as +18 and −29 for p- and n-type patterns, respectively. SEM image of laser written lines on a 10 nm thick a-Si:H film deposited on a Si/SiO2 substrate. Four regions are clearly distinguishable: the metal contact on the top area; the laser eroded area (lines); the crystallized areas adjacent to lines; the amorphous region at the bottom right.CNPqThe authors acknowledge Witec GmbH for collaboration in disclosing the set of instructions needed to communicate with Witec Four software.WileyUniversidade do MinhoAlpuim, P.Cerqueira, M. F.Iglesias, V.Junior, George Luiz MachadoBorme, J.2016-02-012016-02-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/43627engAlpuim, P., Cerqueira, M. F., Iglesias, V., Machado, G., & Borme, J. (2016). Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates. Physica Status Solidi a-Applications and Materials Science, 213(7), 1717-1727. doi: 10.1002/pssa.2015329801862-631910.1002/pssa.201532980http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532980/abstractinfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T11:55:34Zoai:repositorium.sdum.uminho.pt:1822/43627Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T18:45:06.421777Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
title Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
spellingShingle Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
Alpuim, P.
Amorphous silicon
Crystallization
Dopant activation,
Laser scribing
Piezoresistance
Ciências Naturais::Ciências Físicas
Science & Technology
title_short Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
title_full Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
title_fullStr Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
title_full_unstemmed Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
title_sort Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates
author Alpuim, P.
author_facet Alpuim, P.
Cerqueira, M. F.
Iglesias, V.
Junior, George Luiz Machado
Borme, J.
author_role author
author2 Cerqueira, M. F.
Iglesias, V.
Junior, George Luiz Machado
Borme, J.
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Alpuim, P.
Cerqueira, M. F.
Iglesias, V.
Junior, George Luiz Machado
Borme, J.
dc.subject.por.fl_str_mv Amorphous silicon
Crystallization
Dopant activation,
Laser scribing
Piezoresistance
Ciências Naturais::Ciências Físicas
Science & Technology
topic Amorphous silicon
Crystallization
Dopant activation,
Laser scribing
Piezoresistance
Ciências Naturais::Ciências Físicas
Science & Technology
description The possibility of direct writing thin semiconductive channels and structures on insulating substrates in a clean room-free process is attractive for its simplicity, cost effectiveness, and possibility of a wide choice of substrates. A broad range of applications, such as large-area electronic devices (touch screens, flexible displays), sensors, or optical wave guides could benefit from such a process. In this work, we directly write on doped hydrogenated amorphous silicon (a-Si:H), with thickness in the range 10 nm–1 μm, using a Nd-YAG laser operating at 532 nm that is part of a Witec Raman confocal system. The contrast in conductivity between the exposed and unexposed areas is so high that the a-Si:H matrix needs not to be removed after exposure. B- and P-doped films were deposited on plastic, glass, and oxidized silicon wafers. The laser power threshold for crystallization was studied. The highest conductivity (886 Ω−1 cm−1) was obtained on wafer. On hard substrates, it is possible to tune the mesoscopic electrical conductivity in a very broad range of values (∼10−4–103) by design of the pattern to be transferred. Patterned films are piezoresistive with gauge factors as high as +18 and −29 for p- and n-type patterns, respectively. SEM image of laser written lines on a 10 nm thick a-Si:H film deposited on a Si/SiO2 substrate. Four regions are clearly distinguishable: the metal contact on the top area; the laser eroded area (lines); the crystallized areas adjacent to lines; the amorphous region at the bottom right.
publishDate 2016
dc.date.none.fl_str_mv 2016-02-01
2016-02-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/43627
url http://hdl.handle.net/1822/43627
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Alpuim, P., Cerqueira, M. F., Iglesias, V., Machado, G., & Borme, J. (2016). Laser patterning of amorphous silicon thin films deposited on flexible and rigid substrates. Physica Status Solidi a-Applications and Materials Science, 213(7), 1717-1727. doi: 10.1002/pssa.201532980
1862-6319
10.1002/pssa.201532980
http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532980/abstract
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Wiley
publisher.none.fl_str_mv Wiley
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
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reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
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