Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide
Autor(a) principal: | |
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Data de Publicação: | 2014 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10400.1/6632 |
Resumo: | Electroforming of indium-tin-oxide/alkali halide/poly(spirofluorene)/Ba/Al diodes has been investigated by bias dependent reflectivity measurements. The threshold voltages for electrocoloration and electroforming are independent of layer thickness and correlate with the bandgap of the alkali halide. We argue that the origin is voltage induced defect formation. Frenkel defect pairs are formed by electron-hole recombination in the alkali halide. This self-accelerating process mitigates injection barriers. The dynamic junction formation is compared to that of a light emitting electrochemical cell. A critical defect density for electroforming is 10(25)/m(3). The electroformed alkali halide layer can be considered as a highly doped semiconductor with metallic transport characteristics. (C) 2014 Author(s). |
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Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halideElectroforming of indium-tin-oxide/alkali halide/poly(spirofluorene)/Ba/Al diodes has been investigated by bias dependent reflectivity measurements. The threshold voltages for electrocoloration and electroforming are independent of layer thickness and correlate with the bandgap of the alkali halide. We argue that the origin is voltage induced defect formation. Frenkel defect pairs are formed by electron-hole recombination in the alkali halide. This self-accelerating process mitigates injection barriers. The dynamic junction formation is compared to that of a light emitting electrochemical cell. A critical defect density for electroforming is 10(25)/m(3). The electroformed alkali halide layer can be considered as a highly doped semiconductor with metallic transport characteristics. (C) 2014 Author(s).American Institute of PhysicsSapientiaBory, B. F.Wang, J. X.Gomes, Henrique L.Janssen, R. A. J.de Leeuw, D. M.Meskers, S. C. J.2015-06-26T14:18:46Z20142014-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.1/6632eng0003-6951AUT: HGO00803;https://dx.doi.org/10.1063/1.4903831info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-24T10:17:48Zoai:sapientia.ualg.pt:10400.1/6632Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:59:16.309856Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
title |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
spellingShingle |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide Bory, B. F. |
title_short |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
title_full |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
title_fullStr |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
title_full_unstemmed |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
title_sort |
Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide |
author |
Bory, B. F. |
author_facet |
Bory, B. F. Wang, J. X. Gomes, Henrique L. Janssen, R. A. J. de Leeuw, D. M. Meskers, S. C. J. |
author_role |
author |
author2 |
Wang, J. X. Gomes, Henrique L. Janssen, R. A. J. de Leeuw, D. M. Meskers, S. C. J. |
author2_role |
author author author author author |
dc.contributor.none.fl_str_mv |
Sapientia |
dc.contributor.author.fl_str_mv |
Bory, B. F. Wang, J. X. Gomes, Henrique L. Janssen, R. A. J. de Leeuw, D. M. Meskers, S. C. J. |
description |
Electroforming of indium-tin-oxide/alkali halide/poly(spirofluorene)/Ba/Al diodes has been investigated by bias dependent reflectivity measurements. The threshold voltages for electrocoloration and electroforming are independent of layer thickness and correlate with the bandgap of the alkali halide. We argue that the origin is voltage induced defect formation. Frenkel defect pairs are formed by electron-hole recombination in the alkali halide. This self-accelerating process mitigates injection barriers. The dynamic junction formation is compared to that of a light emitting electrochemical cell. A critical defect density for electroforming is 10(25)/m(3). The electroformed alkali halide layer can be considered as a highly doped semiconductor with metallic transport characteristics. (C) 2014 Author(s). |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014 2014-01-01T00:00:00Z 2015-06-26T14:18:46Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10400.1/6632 |
url |
http://hdl.handle.net/10400.1/6632 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0003-6951 AUT: HGO00803; https://dx.doi.org/10.1063/1.4903831 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
American Institute of Physics |
publisher.none.fl_str_mv |
American Institute of Physics |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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1799133214631002112 |