Infrared characterization of strontium titanate thin films

Detalhes bibliográficos
Autor(a) principal: Almeida, B. G.
Data de Publicação: 2004
Outros Autores: Pietka, A., Mendes, J.A.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: https://hdl.handle.net/1822/85655
Resumo: Strontium titanate thin films have been prepared at different oxygen pressures with various post deposition annealing treatments. The films were deposited by pulsed laser ablation at room temperature on Si (001) substrates with a silica buffer layer. Infrared reflectance measurements were performed in order to determine relevant film parameters such as layer thicknesses and chemical composition. The infrared reflectance spectra were fitted by using adequate dielectric function forms for each layer. The fitting procedure provided the extraction of the dielectric functions of the strontium titanate film, the silica layer and the substrate. The as-deposited films are found to be amorphous, and their infrared spectra present peaks corresponding to modes with high damping constants. As the annealing time and temperature increases the strontium titanate layer becomes more ordered so that it can be described by its SrTiO3 bulk mode parameters. Also, the silica layer grows along with the ordering of the strontium titanate film, due to oxidation during annealing.
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spelling Infrared characterization of strontium titanate thin filmsStrontium TitanateInfrared SpectroscopyModelingCiências Naturais::Ciências FísicasScience & TechnologyStrontium titanate thin films have been prepared at different oxygen pressures with various post deposition annealing treatments. The films were deposited by pulsed laser ablation at room temperature on Si (001) substrates with a silica buffer layer. Infrared reflectance measurements were performed in order to determine relevant film parameters such as layer thicknesses and chemical composition. The infrared reflectance spectra were fitted by using adequate dielectric function forms for each layer. The fitting procedure provided the extraction of the dielectric functions of the strontium titanate film, the silica layer and the substrate. The as-deposited films are found to be amorphous, and their infrared spectra present peaks corresponding to modes with high damping constants. As the annealing time and temperature increases the strontium titanate layer becomes more ordered so that it can be described by its SrTiO3 bulk mode parameters. Also, the silica layer grows along with the ordering of the strontium titanate film, due to oxidation during annealing.Elsevier Science BVUniversidade do MinhoAlmeida, B. G.Pietka, A.Mendes, J.A.20042004-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/1822/85655engAlmeida, B. G., Pietka, A., & Mendes, J. A. (2004, November). Infrared characterization of strontium titanate thin films. Applied Surface Science. Elsevier BV. http://doi.org/10.1016/j.apsusc.2004.05.2600169-433210.1016/j.apsusc.2004.05.260https://doi.org/10.1016/j.apsusc.2004.05.260info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-29T01:20:53Zoai:repositorium.sdum.uminho.pt:1822/85655Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:10:07.544786Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Infrared characterization of strontium titanate thin films
title Infrared characterization of strontium titanate thin films
spellingShingle Infrared characterization of strontium titanate thin films
Almeida, B. G.
Strontium Titanate
Infrared Spectroscopy
Modeling
Ciências Naturais::Ciências Físicas
Science & Technology
title_short Infrared characterization of strontium titanate thin films
title_full Infrared characterization of strontium titanate thin films
title_fullStr Infrared characterization of strontium titanate thin films
title_full_unstemmed Infrared characterization of strontium titanate thin films
title_sort Infrared characterization of strontium titanate thin films
author Almeida, B. G.
author_facet Almeida, B. G.
Pietka, A.
Mendes, J.A.
author_role author
author2 Pietka, A.
Mendes, J.A.
author2_role author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Almeida, B. G.
Pietka, A.
Mendes, J.A.
dc.subject.por.fl_str_mv Strontium Titanate
Infrared Spectroscopy
Modeling
Ciências Naturais::Ciências Físicas
Science & Technology
topic Strontium Titanate
Infrared Spectroscopy
Modeling
Ciências Naturais::Ciências Físicas
Science & Technology
description Strontium titanate thin films have been prepared at different oxygen pressures with various post deposition annealing treatments. The films were deposited by pulsed laser ablation at room temperature on Si (001) substrates with a silica buffer layer. Infrared reflectance measurements were performed in order to determine relevant film parameters such as layer thicknesses and chemical composition. The infrared reflectance spectra were fitted by using adequate dielectric function forms for each layer. The fitting procedure provided the extraction of the dielectric functions of the strontium titanate film, the silica layer and the substrate. The as-deposited films are found to be amorphous, and their infrared spectra present peaks corresponding to modes with high damping constants. As the annealing time and temperature increases the strontium titanate layer becomes more ordered so that it can be described by its SrTiO3 bulk mode parameters. Also, the silica layer grows along with the ordering of the strontium titanate film, due to oxidation during annealing.
publishDate 2004
dc.date.none.fl_str_mv 2004
2004-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv https://hdl.handle.net/1822/85655
url https://hdl.handle.net/1822/85655
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Almeida, B. G., Pietka, A., & Mendes, J. A. (2004, November). Infrared characterization of strontium titanate thin films. Applied Surface Science. Elsevier BV. http://doi.org/10.1016/j.apsusc.2004.05.260
0169-4332
10.1016/j.apsusc.2004.05.260
https://doi.org/10.1016/j.apsusc.2004.05.260
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Elsevier Science BV
publisher.none.fl_str_mv Elsevier Science BV
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
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