A differential mechanical profilometer for thickness measurement

Detalhes bibliográficos
Autor(a) principal: Alves, J. Maia
Data de Publicação: 2004
Outros Autores: Brito, M. C., Serra, J. M., Vallêra, A. M.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10451/1172
Resumo: A low cost differential profilometer based on standard commercial displacement transducers is fully described. Unlike most common profilometers this device can be used to measure the thickness profile of samples having both surfaces irregular. A sensitivity of about 0.2 mm, independent of the sample thickness is achieved.
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spelling A differential mechanical profilometer for thickness measurementDifferential profilometerThickness measurementA low cost differential profilometer based on standard commercial displacement transducers is fully described. Unlike most common profilometers this device can be used to measure the thickness profile of samples having both surfaces irregular. A sensitivity of about 0.2 mm, independent of the sample thickness is achieved.American Institute of PhysicsRepositório da Universidade de LisboaAlves, J. MaiaBrito, M. C.Serra, J. M.Vallêra, A. M.2010-07-27T08:55:11Z20042004-01-212004-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfapplication/pdftext/xmlhttp://hdl.handle.net/10451/1172Rev. Sci. Instrum. 75, 12 (2004), 5362-5363reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAPenginfo:eu-repo/semantics/openAccess2023-11-08T15:40:29Zoai:repositorio.ul.pt:10451/1172Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T21:27:50.720871Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv A differential mechanical profilometer for thickness measurement
title A differential mechanical profilometer for thickness measurement
spellingShingle A differential mechanical profilometer for thickness measurement
Alves, J. Maia
Differential profilometer
Thickness measurement
title_short A differential mechanical profilometer for thickness measurement
title_full A differential mechanical profilometer for thickness measurement
title_fullStr A differential mechanical profilometer for thickness measurement
title_full_unstemmed A differential mechanical profilometer for thickness measurement
title_sort A differential mechanical profilometer for thickness measurement
author Alves, J. Maia
author_facet Alves, J. Maia
Brito, M. C.
Serra, J. M.
Vallêra, A. M.
author_role author
author2 Brito, M. C.
Serra, J. M.
Vallêra, A. M.
author2_role author
author
author
dc.contributor.none.fl_str_mv Repositório da Universidade de Lisboa
dc.contributor.author.fl_str_mv Alves, J. Maia
Brito, M. C.
Serra, J. M.
Vallêra, A. M.
dc.subject.por.fl_str_mv Differential profilometer
Thickness measurement
topic Differential profilometer
Thickness measurement
description A low cost differential profilometer based on standard commercial displacement transducers is fully described. Unlike most common profilometers this device can be used to measure the thickness profile of samples having both surfaces irregular. A sensitivity of about 0.2 mm, independent of the sample thickness is achieved.
publishDate 2004
dc.date.none.fl_str_mv 2004
2004-01-21
2004-01-01T00:00:00Z
2010-07-27T08:55:11Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
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status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10451/1172
url http://hdl.handle.net/10451/1172
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
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dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv Rev. Sci. Instrum. 75, 12 (2004), 5362-5363
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
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