Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films

Detalhes bibliográficos
Autor(a) principal: Tasneem, Muhassinah
Data de Publicação: 2023
Outros Autores: Monteiro, Carlos R.P., Kumar, N. S.Kiran, Silva, José Pedro Basto, Sekhar, K. C., Kamakshi, K., Pereira, Mário
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: https://hdl.handle.net/1822/87428
Resumo: In this work, we have studied the effect of thickness on structural, morphological, resistive switching (RS), ferroelectric, and energy storage properties of 0.85[0.6Ba (Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 (BZCT-STO) thin films deposited by the pulsed laser deposition technique. X-ray diffraction (XRD) analysis suggests that BZCT-STO thin films exhibit a polycrystalline tetragonal structure. The lattice parameters and tetragonality ratio approaching to bulk value with an increase of thickness, confirm strain relaxation in thicker films. SEM analysis reveals a dense columnar structure with a different grain size that varies from 3 nm to 60 nm as thickness increased from 160 to 360 nm. The P-E loops suggest that the relaxor behaviour increases with a decrease of thickness due to interface low dielectric layer, substrate clamping effect, small grain size, and high back switching ratio. The RS effect observed in Pt/BZCT-STO/Au capacitors is attributed to polarization modulation of the Schottky barrier and is found to be significant at low thickness. The effect of electric field and frequency on energy storage properties of BZCT-STO films is also investigated. The Pt/BZCT-STO/Au capacitor with a thickness of 160 nm exhibited 6.0 J/cm3 with an efficiency of 72% at a field of 800 kV/cm. It also exhibited a robust energy storage performance in the frequency range of 50–2000 Hz and also up to 108 cycles passing through the capacitor.
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spelling Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin filmsBZCT-STO thin FilmsEnergy storage performanceFerroelectricInterface layerResistive switchingSize effectCiências Naturais::Ciências FísicasIn this work, we have studied the effect of thickness on structural, morphological, resistive switching (RS), ferroelectric, and energy storage properties of 0.85[0.6Ba (Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 (BZCT-STO) thin films deposited by the pulsed laser deposition technique. X-ray diffraction (XRD) analysis suggests that BZCT-STO thin films exhibit a polycrystalline tetragonal structure. The lattice parameters and tetragonality ratio approaching to bulk value with an increase of thickness, confirm strain relaxation in thicker films. SEM analysis reveals a dense columnar structure with a different grain size that varies from 3 nm to 60 nm as thickness increased from 160 to 360 nm. The P-E loops suggest that the relaxor behaviour increases with a decrease of thickness due to interface low dielectric layer, substrate clamping effect, small grain size, and high back switching ratio. The RS effect observed in Pt/BZCT-STO/Au capacitors is attributed to polarization modulation of the Schottky barrier and is found to be significant at low thickness. The effect of electric field and frequency on energy storage properties of BZCT-STO films is also investigated. The Pt/BZCT-STO/Au capacitor with a thickness of 160 nm exhibited 6.0 J/cm3 with an efficiency of 72% at a field of 800 kV/cm. It also exhibited a robust energy storage performance in the frequency range of 50–2000 Hz and also up to 108 cycles passing through the capacitor.This work was supported by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Strategic Funding Contract UIDB/04650/2020. This work has received funding from the Eu ropean Union’s Horizon 2020 research and innovation program under grant agreement No 958174 (M-ERA-NET3/0003/ 2021—NanOx4EStor). The author KK acknowledges DST –SERB for the financial support through grant no: SPG/2021/003797. The authors would also like to thank Jos´e Santos for technical support in the Thin Film Laboratory at CF-UM-UP.ElsevierUniversidade do MinhoTasneem, MuhassinahMonteiro, Carlos R.P.Kumar, N. S.KiranSilva, José Pedro BastoSekhar, K. C.Kamakshi, K.Pereira, Mário2023-06-152023-06-15T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/1822/87428engTasneem, M., Monteiro, C. R. P., Kumar, N. S. K., Silva, J. P. B., Sekhar, K. C., Kamakshi, K., & Pereira, M. (2023, June). Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films. Ceramics International. Elsevier BV. http://doi.org/10.1016/j.ceramint.2023.03.2070272-88421873-395610.1016/j.ceramint.2023.03.207https://www.sciencedirect.com/science/article/pii/S0272884223008076info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-12-09T01:21:43Zoai:repositorium.sdum.uminho.pt:1822/87428Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T00:41:37.969068Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
title Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
spellingShingle Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
Tasneem, Muhassinah
BZCT-STO thin Films
Energy storage performance
Ferroelectric
Interface layer
Resistive switching
Size effect
Ciências Naturais::Ciências Físicas
title_short Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
title_full Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
title_fullStr Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
title_full_unstemmed Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
title_sort Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films
author Tasneem, Muhassinah
author_facet Tasneem, Muhassinah
Monteiro, Carlos R.P.
Kumar, N. S.Kiran
Silva, José Pedro Basto
Sekhar, K. C.
Kamakshi, K.
Pereira, Mário
author_role author
author2 Monteiro, Carlos R.P.
Kumar, N. S.Kiran
Silva, José Pedro Basto
Sekhar, K. C.
Kamakshi, K.
Pereira, Mário
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Tasneem, Muhassinah
Monteiro, Carlos R.P.
Kumar, N. S.Kiran
Silva, José Pedro Basto
Sekhar, K. C.
Kamakshi, K.
Pereira, Mário
dc.subject.por.fl_str_mv BZCT-STO thin Films
Energy storage performance
Ferroelectric
Interface layer
Resistive switching
Size effect
Ciências Naturais::Ciências Físicas
topic BZCT-STO thin Films
Energy storage performance
Ferroelectric
Interface layer
Resistive switching
Size effect
Ciências Naturais::Ciências Físicas
description In this work, we have studied the effect of thickness on structural, morphological, resistive switching (RS), ferroelectric, and energy storage properties of 0.85[0.6Ba (Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 (BZCT-STO) thin films deposited by the pulsed laser deposition technique. X-ray diffraction (XRD) analysis suggests that BZCT-STO thin films exhibit a polycrystalline tetragonal structure. The lattice parameters and tetragonality ratio approaching to bulk value with an increase of thickness, confirm strain relaxation in thicker films. SEM analysis reveals a dense columnar structure with a different grain size that varies from 3 nm to 60 nm as thickness increased from 160 to 360 nm. The P-E loops suggest that the relaxor behaviour increases with a decrease of thickness due to interface low dielectric layer, substrate clamping effect, small grain size, and high back switching ratio. The RS effect observed in Pt/BZCT-STO/Au capacitors is attributed to polarization modulation of the Schottky barrier and is found to be significant at low thickness. The effect of electric field and frequency on energy storage properties of BZCT-STO films is also investigated. The Pt/BZCT-STO/Au capacitor with a thickness of 160 nm exhibited 6.0 J/cm3 with an efficiency of 72% at a field of 800 kV/cm. It also exhibited a robust energy storage performance in the frequency range of 50–2000 Hz and also up to 108 cycles passing through the capacitor.
publishDate 2023
dc.date.none.fl_str_mv 2023-06-15
2023-06-15T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv https://hdl.handle.net/1822/87428
url https://hdl.handle.net/1822/87428
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Tasneem, M., Monteiro, C. R. P., Kumar, N. S. K., Silva, J. P. B., Sekhar, K. C., Kamakshi, K., & Pereira, M. (2023, June). Thickness-dependent microstructure, resistive switching, ferroelectric, and energy storage properties of pulsed laser deposited 0.85[0.6Ba(Zr0.2Ti0.8)O3-0.4(Ba0.7Ca0.3)TiO3]-0.15SrTiO3 thin films. Ceramics International. Elsevier BV. http://doi.org/10.1016/j.ceramint.2023.03.207
0272-8842
1873-3956
10.1016/j.ceramint.2023.03.207
https://www.sciencedirect.com/science/article/pii/S0272884223008076
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
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