A Double Crystal Spectrometer for High Precision X-Ray Spectroscopy of Fundamental Physics and Applications

• Autor(a) principal: Pinheiro, Daniel Silva
• Data de Publicação: 2020
• Tipo de documento: Dissertação
• Idioma: eng
• Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
• Texto Completo: http://hdl.handle.net/10362/118279
• topic: Double Crystal Spectrometer; X-Ray Fluorescence Spectroscopy; Fundamental Physics; High Precision; Geant4; Synthetic Spectra; Domínio/Área Científica::Engenharia e Tecnologia::Outras Engenharias e Tecnologias

The European X-ray Spectrometry Association established in 2008 the Fundamental Pa rameter initiative with the aim of improving the measurements of fundamental X-ray parameters. In detail, the goal of this initiative is to improve the reliability and precision of atomic parameters related with the interaction of X-Ray radiation with matter. Aligned with this initiative, a double crystal spectrometer (DCS) is being built at the LIBPhys-UNL group, which will be able to measure fundamental parameters with competitive precision and reliability. In preparation for this high-precise data, this thesis is dedicated to the complete simulation of the spectrometer system. With such a complex system and the need to obtain the most precise and reliable results, a simulation with different layers of physics is demanded. These layers would be for example, the physical processes of X-ray interaction, or the geometry of the DCS. To address this task, several simulations were built or modified not only from general particle tracking simulators, like Geant4 (with ROOT) but also more simple home-made simulations (done in FORTRAN). The simulations were tested for the physical processes used, guaranteeing that these simulations are ready to be configured for the final experimental setup. Further investigation on quantum processes that could be observed in experimental spectra was also performed, namely quantum interference and angular distribution, with the aim of further improving the precision of future measurements.