Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality
Autor(a) principal: | |
---|---|
Data de Publicação: | 2020 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10400.21/12032 |
Resumo: | Este trabalho foi financiado pelo Concurso Anual para Projetos de Investigação, Desenvolvimento, Inovação e Criação Artística (IDI&CA) 2016 do Instituto Politécnico de Lisboa. Código de referência IPL/2018/aSiPhoto_ISEL |
id |
RCAP_cd6bcee9e52d421aa102c4721c1d247a |
---|---|
oai_identifier_str |
oai:repositorio.ipl.pt:10400.21/12032 |
network_acronym_str |
RCAP |
network_name_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository_id_str |
7160 |
spelling |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material qualityAmorphous siliconSimulation analysisLithography imperfectionsDeposition processEste trabalho foi financiado pelo Concurso Anual para Projetos de Investigação, Desenvolvimento, Inovação e Criação Artística (IDI&CA) 2016 do Instituto Politécnico de Lisboa. Código de referência IPL/2018/aSiPhoto_ISELAmorphous silicon PECVD photonic integrated devices are promising candidates for low cost sensing applications. This manuscript reports a simulation analysis about the impact on the overall efficiency caused by the lithography imperfections in the deposition process. The tolerance to the fabrication defects of a photonic sensor based on surface plasmonic resonance is analysed. The simulations are performed with FDTD and BPM algorithms. The device is a plasmonic interferometer composed by an a-Si:H waveguide covered by a thin gold layer. The sensing analysis is performed by equally splitting the input light into two arms, allowing the sensor to be calibrated by its reference arm. Two different 1 × 2 power splitter configurations are presented: a directional coupler and a multimode interference splitter. The waveguide sidewall roughness is considered as the major negative effect caused by deposition imperfections. The simulation results show that plasmonic effects can be excited in the interferometric waveguide structure, allowing a sensing device with enough sensitivity to support the functioning of a bio sensor for high throughput screening. In addition, the good tolerance to the waveguide wall roughness, points out the PECVD deposition technique as reliable method for the overall sensor system to be produced in a low-cost system. The large area deposition of photonics structures, allowed by the PECVD method, can be explored to design a multiplexed system for analysis of multiple biomarkers to further increase the tolerance to fabrication defects.EDP SciencesRCIPLFantoni, AlessandroCosta, JoãoLourenço, PauloVieira, Manuela2020-07-10T14:32:48Z2020-07-072020-07-07T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.21/12032engFANTONI, Alessandro; [et al] – Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality. European Physical Journal Applied Physics. ISSN 1286-0042. Vol. 90, N.º 3 (2020), pp. 30502-p1-30502-p101286-004210.1051/epjap/2020190250metadata only accessinfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-08-03T10:04:11Zoai:repositorio.ipl.pt:10400.21/12032Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:20:12.086208Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
title |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
spellingShingle |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality Fantoni, Alessandro Amorphous silicon Simulation analysis Lithography imperfections Deposition process |
title_short |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
title_full |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
title_fullStr |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
title_full_unstemmed |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
title_sort |
Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality |
author |
Fantoni, Alessandro |
author_facet |
Fantoni, Alessandro Costa, João Lourenço, Paulo Vieira, Manuela |
author_role |
author |
author2 |
Costa, João Lourenço, Paulo Vieira, Manuela |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
RCIPL |
dc.contributor.author.fl_str_mv |
Fantoni, Alessandro Costa, João Lourenço, Paulo Vieira, Manuela |
dc.subject.por.fl_str_mv |
Amorphous silicon Simulation analysis Lithography imperfections Deposition process |
topic |
Amorphous silicon Simulation analysis Lithography imperfections Deposition process |
description |
Este trabalho foi financiado pelo Concurso Anual para Projetos de Investigação, Desenvolvimento, Inovação e Criação Artística (IDI&CA) 2016 do Instituto Politécnico de Lisboa. Código de referência IPL/2018/aSiPhoto_ISEL |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020-07-10T14:32:48Z 2020-07-07 2020-07-07T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10400.21/12032 |
url |
http://hdl.handle.net/10400.21/12032 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
FANTONI, Alessandro; [et al] – Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality. European Physical Journal Applied Physics. ISSN 1286-0042. Vol. 90, N.º 3 (2020), pp. 30502-p1-30502-p10 1286-0042 10.1051/epjap/2020190250 |
dc.rights.driver.fl_str_mv |
metadata only access info:eu-repo/semantics/openAccess |
rights_invalid_str_mv |
metadata only access |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
EDP Sciences |
publisher.none.fl_str_mv |
EDP Sciences |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
|
_version_ |
1799133470190993408 |