Review on X-ray detectors based on scintillators and CMOS technology

Detalhes bibliográficos
Autor(a) principal: Rocha, J. G.
Data de Publicação: 2011
Outros Autores: Lanceros-Méndez, S.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/16396
Resumo: This article describes the theoretical basis, design and implementation of X-ray microdetectors based on scintillating materials and CMOS technology. The working principle of such microdetectors consists in the absorption of X-rays by scintillators, which produce visible light. The visible light is then detected and converted into electric signals by means of photodetectors. In order to understand such detectors, several issues related to its implementation are presented in this article, namely: Production of X-rays and interaction between them and matter - the first step necessary to the detection of X-rays is that they must be absorbed by some material, in this case by a scintillator; Radiation detectors - there are several types of detectors, namely: pn junctions, photoconductors, based on thermal effects and scintillators; Fabrication of scintillator arrays - after the X-ray radiation is absorbed by a scintillator, this material emits visible light whose intensity is proportional to the total energy of the absorbed X-rays; Optical interfaces between scintillators and photodetectors - the visible light generated by scintillators must arrive to the photodetectors, so, it is necessary to have an interface between the scintillators and the photodetectors that ideally does not introduce losses; Photodetectors and interface electronics - the visible light is absorbed by the photodetectors and converted into electrical signals, which are finally converted into digital images by means of interface electronics. The article presents some promising patents on X-ray detectors based on scintillators and CMOS technology.
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spelling Review on X-ray detectors based on scintillators and CMOS technologyX-raysScintillatorsDigital radiographyCMOS imagingThis article describes the theoretical basis, design and implementation of X-ray microdetectors based on scintillating materials and CMOS technology. The working principle of such microdetectors consists in the absorption of X-rays by scintillators, which produce visible light. The visible light is then detected and converted into electric signals by means of photodetectors. In order to understand such detectors, several issues related to its implementation are presented in this article, namely: Production of X-rays and interaction between them and matter - the first step necessary to the detection of X-rays is that they must be absorbed by some material, in this case by a scintillator; Radiation detectors - there are several types of detectors, namely: pn junctions, photoconductors, based on thermal effects and scintillators; Fabrication of scintillator arrays - after the X-ray radiation is absorbed by a scintillator, this material emits visible light whose intensity is proportional to the total energy of the absorbed X-rays; Optical interfaces between scintillators and photodetectors - the visible light generated by scintillators must arrive to the photodetectors, so, it is necessary to have an interface between the scintillators and the photodetectors that ideally does not introduce losses; Photodetectors and interface electronics - the visible light is absorbed by the photodetectors and converted into electrical signals, which are finally converted into digital images by means of interface electronics. The article presents some promising patents on X-ray detectors based on scintillators and CMOS technology.Fundação para a Ciência e a Tecnologia (FCT) - Bolsa SFRH/BSAB/1014/2010Bentham Science PublishersUniversidade do MinhoRocha, J. G.Lanceros-Méndez, S.20112011-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/16396eng2212-7992http://www.benthamscience.com/info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:52:30Zoai:repositorium.sdum.uminho.pt:1822/16396Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:51:39.617075Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Review on X-ray detectors based on scintillators and CMOS technology
title Review on X-ray detectors based on scintillators and CMOS technology
spellingShingle Review on X-ray detectors based on scintillators and CMOS technology
Rocha, J. G.
X-rays
Scintillators
Digital radiography
CMOS imaging
title_short Review on X-ray detectors based on scintillators and CMOS technology
title_full Review on X-ray detectors based on scintillators and CMOS technology
title_fullStr Review on X-ray detectors based on scintillators and CMOS technology
title_full_unstemmed Review on X-ray detectors based on scintillators and CMOS technology
title_sort Review on X-ray detectors based on scintillators and CMOS technology
author Rocha, J. G.
author_facet Rocha, J. G.
Lanceros-Méndez, S.
author_role author
author2 Lanceros-Méndez, S.
author2_role author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Rocha, J. G.
Lanceros-Méndez, S.
dc.subject.por.fl_str_mv X-rays
Scintillators
Digital radiography
CMOS imaging
topic X-rays
Scintillators
Digital radiography
CMOS imaging
description This article describes the theoretical basis, design and implementation of X-ray microdetectors based on scintillating materials and CMOS technology. The working principle of such microdetectors consists in the absorption of X-rays by scintillators, which produce visible light. The visible light is then detected and converted into electric signals by means of photodetectors. In order to understand such detectors, several issues related to its implementation are presented in this article, namely: Production of X-rays and interaction between them and matter - the first step necessary to the detection of X-rays is that they must be absorbed by some material, in this case by a scintillator; Radiation detectors - there are several types of detectors, namely: pn junctions, photoconductors, based on thermal effects and scintillators; Fabrication of scintillator arrays - after the X-ray radiation is absorbed by a scintillator, this material emits visible light whose intensity is proportional to the total energy of the absorbed X-rays; Optical interfaces between scintillators and photodetectors - the visible light generated by scintillators must arrive to the photodetectors, so, it is necessary to have an interface between the scintillators and the photodetectors that ideally does not introduce losses; Photodetectors and interface electronics - the visible light is absorbed by the photodetectors and converted into electrical signals, which are finally converted into digital images by means of interface electronics. The article presents some promising patents on X-ray detectors based on scintillators and CMOS technology.
publishDate 2011
dc.date.none.fl_str_mv 2011
2011-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/16396
url http://hdl.handle.net/1822/16396
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language eng
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http://www.benthamscience.com/
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dc.publisher.none.fl_str_mv Bentham Science Publishers
publisher.none.fl_str_mv Bentham Science Publishers
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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