Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature
Autor(a) principal: | |
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Data de Publicação: | 2011 |
Outros Autores: | , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10773/6623 |
Resumo: | In this work erbium ions were implanted into AlN films grown on sapphire with fluence range: (0.5-2) × 1015 at/cm-2, ion energy range: 150-350 keV and tilt angle: 0°, 10°, 20°, 30°. The optical and structural properties of the films are studied by means of photoluminescence and Raman spectroscopy in combination with Rutherford backscattering/channeling (RBS/C) measurements. The photoluminescence spectra of the Er3+ were recorded in the visible and infrared region between 9 and 300 K after thermal annealing treatments of the samples. The emission spectrum of the AlN:Er films consists of two series of green lines centered at 538 and 558 nm with typical Er3+ emission in the infrared at 1.54 μm. The green lines have been identified as Er3+ transitions from the 2H11/2 and 4S3/2 levels to the 4I15/2 ground state. Different erbium centers in the matrix are suggested by the change of infrared photoluminescence relative intensity of some of the emission lines when different excitation wavelengths are used. The relative abundances of these centers can be varied by using different implantation parameters. The Raman and RBS/C measurements show good crystalline quality for all the studied films. |
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Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperatureAlNEr3+ photoluminescenceRamanRBSIn this work erbium ions were implanted into AlN films grown on sapphire with fluence range: (0.5-2) × 1015 at/cm-2, ion energy range: 150-350 keV and tilt angle: 0°, 10°, 20°, 30°. The optical and structural properties of the films are studied by means of photoluminescence and Raman spectroscopy in combination with Rutherford backscattering/channeling (RBS/C) measurements. The photoluminescence spectra of the Er3+ were recorded in the visible and infrared region between 9 and 300 K after thermal annealing treatments of the samples. The emission spectrum of the AlN:Er films consists of two series of green lines centered at 538 and 558 nm with typical Er3+ emission in the infrared at 1.54 μm. The green lines have been identified as Er3+ transitions from the 2H11/2 and 4S3/2 levels to the 4I15/2 ground state. Different erbium centers in the matrix are suggested by the change of infrared photoluminescence relative intensity of some of the emission lines when different excitation wavelengths are used. The relative abundances of these centers can be varied by using different implantation parameters. The Raman and RBS/C measurements show good crystalline quality for all the studied films.Elsevier20112011-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10773/6623eng0925-346710.1016/j.optmat.2010.09.005Soares, M.J.Leitão, J.P.Silva, M.I.N. daGonzález, J.C.Matinaga, F.M.Lorenz, K.Alves, E.Peres, M.Monteiro, T.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2024-02-22T11:08:10Zoai:ria.ua.pt:10773/6623Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T02:43:28.011990Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
title |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
spellingShingle |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature Soares, M.J. AlN Er3+ photoluminescence Raman RBS |
title_short |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
title_full |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
title_fullStr |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
title_full_unstemmed |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
title_sort |
Structural and optical properties of Er implanted AlN thin films: green and infrared photoluminescence at room temperature |
author |
Soares, M.J. |
author_facet |
Soares, M.J. Leitão, J.P. Silva, M.I.N. da González, J.C. Matinaga, F.M. Lorenz, K. Alves, E. Peres, M. Monteiro, T. |
author_role |
author |
author2 |
Leitão, J.P. Silva, M.I.N. da González, J.C. Matinaga, F.M. Lorenz, K. Alves, E. Peres, M. Monteiro, T. |
author2_role |
author author author author author author author author |
dc.contributor.author.fl_str_mv |
Soares, M.J. Leitão, J.P. Silva, M.I.N. da González, J.C. Matinaga, F.M. Lorenz, K. Alves, E. Peres, M. Monteiro, T. |
dc.subject.por.fl_str_mv |
AlN Er3+ photoluminescence Raman RBS |
topic |
AlN Er3+ photoluminescence Raman RBS |
description |
In this work erbium ions were implanted into AlN films grown on sapphire with fluence range: (0.5-2) × 1015 at/cm-2, ion energy range: 150-350 keV and tilt angle: 0°, 10°, 20°, 30°. The optical and structural properties of the films are studied by means of photoluminescence and Raman spectroscopy in combination with Rutherford backscattering/channeling (RBS/C) measurements. The photoluminescence spectra of the Er3+ were recorded in the visible and infrared region between 9 and 300 K after thermal annealing treatments of the samples. The emission spectrum of the AlN:Er films consists of two series of green lines centered at 538 and 558 nm with typical Er3+ emission in the infrared at 1.54 μm. The green lines have been identified as Er3+ transitions from the 2H11/2 and 4S3/2 levels to the 4I15/2 ground state. Different erbium centers in the matrix are suggested by the change of infrared photoluminescence relative intensity of some of the emission lines when different excitation wavelengths are used. The relative abundances of these centers can be varied by using different implantation parameters. The Raman and RBS/C measurements show good crystalline quality for all the studied films. |
publishDate |
2011 |
dc.date.none.fl_str_mv |
2011 2011-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10773/6623 |
url |
http://hdl.handle.net/10773/6623 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0925-3467 10.1016/j.optmat.2010.09.005 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier |
publisher.none.fl_str_mv |
Elsevier |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
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1799137484230098944 |