The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films

Detalhes bibliográficos
Autor(a) principal: Stepikhova, M.
Data de Publicação: 2004
Outros Autores: Cerqueira, M. F., Losurdo, M., Giangregorio, M. M., Alves, E., Monteiro, T., Soares, Manuel Jorge
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/13985
Resumo: In this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of Si nanocrystals. A strong increase, by about two orders of magnitude, of Er-related PL intensity in these samples with lowering of the Si nanocrystal sizes from 7.9 to about 1.5 nm is observed. The results are discussed in terms of the sensitization effect of Si nanocrystals on Er ions
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spelling The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin filmsPhotoluminescenceErbiumNanocrystalline siliconEllipsometryScience & TechnologyIn this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of Si nanocrystals. A strong increase, by about two orders of magnitude, of Er-related PL intensity in these samples with lowering of the Si nanocrystal sizes from 7.9 to about 1.5 nm is observed. The results are discussed in terms of the sensitization effect of Si nanocrystals on Er ionsFCT Project POCTI/CTM/39395/2001Russian Foundation for Basic Research (project no. 01-02-16439)SpringerUniversidade do MinhoStepikhova, M.Cerqueira, M. F.Losurdo, M.Giangregorio, M. M.Alves, E.Monteiro, T.Soares, Manuel Jorge20042004-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/13985eng1063-783410.1134/1.1641935http://journals.ioffe.ru/ftt/2004/01/p114-118.pdfinfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:01:15Zoai:repositorium.sdum.uminho.pt:1822/13985Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T18:51:10.165231Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
title The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
spellingShingle The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
Stepikhova, M.
Photoluminescence
Erbium
Nanocrystalline silicon
Ellipsometry
Science & Technology
title_short The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
title_full The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
title_fullStr The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
title_full_unstemmed The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
title_sort The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films
author Stepikhova, M.
author_facet Stepikhova, M.
Cerqueira, M. F.
Losurdo, M.
Giangregorio, M. M.
Alves, E.
Monteiro, T.
Soares, Manuel Jorge
author_role author
author2 Cerqueira, M. F.
Losurdo, M.
Giangregorio, M. M.
Alves, E.
Monteiro, T.
Soares, Manuel Jorge
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Stepikhova, M.
Cerqueira, M. F.
Losurdo, M.
Giangregorio, M. M.
Alves, E.
Monteiro, T.
Soares, Manuel Jorge
dc.subject.por.fl_str_mv Photoluminescence
Erbium
Nanocrystalline silicon
Ellipsometry
Science & Technology
topic Photoluminescence
Erbium
Nanocrystalline silicon
Ellipsometry
Science & Technology
description In this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of Si nanocrystals. A strong increase, by about two orders of magnitude, of Er-related PL intensity in these samples with lowering of the Si nanocrystal sizes from 7.9 to about 1.5 nm is observed. The results are discussed in terms of the sensitization effect of Si nanocrystals on Er ions
publishDate 2004
dc.date.none.fl_str_mv 2004
2004-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/13985
url http://hdl.handle.net/1822/13985
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 1063-7834
10.1134/1.1641935
http://journals.ioffe.ru/ftt/2004/01/p114-118.pdf
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Springer
publisher.none.fl_str_mv Springer
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
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reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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